T/CSPSTC 25-2019 in English

VALID

Test method for thin-film amorphous silicon based photovoltaic (PV) modules Light Induced Degration (LID)

Issued on:2019-08-28
Implemented on:2019-11-15
File Format:PDF
Delivery:Via email within 1~3 business days

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Standard No:	T/CSPSTC 25-2019
Document status:	VALID
Title in English:	Test method for thin-film amorphous silicon based photovoltaic (PV) modules Light Induced Degration (LID)
Title in Chinese:	硅基薄膜光伏组件光致衰减测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2019-08-28
Implemented on:	2019-11-15
ICS Classification:	27.160-Solar energy engineering
Professional Classification:	T/-Social Organization Standard
Related Keywords:	modules light induced degration test method silicon-based thin film photovoltaic modules thin-film amorphous silicon test reports
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Scope

The main contents include scope, terms and definitions, equipment, sampling, procedures, calculations, and test reports. During the power stabilization process of silicon-based thin film photovoltaic modules under the influence of light, the maximum power value is tested before and after each roughly equal irradiation cycle. The minimum irradiation cycle is 43kwh/m2, and the module reaches the standard in accordance with IEC 61215-2 MQT 19 After stabilization (IEC 61215-1-3: 2016 stipulates (PMAX-PMIN)/PAVE≤2%), the power still shows a continuous downward trend under continuous illumination. This standard gives the following equation as a criterion for determining whether the component's light-induced attenuation has reached final stability: Here, Pmax, Pmin, and Paverage are the maximum, minimum, and average values of the maximum power under three STCs measured in two consecutive cycles. value.

More samples: QC/T 942-2021 DL/T 368-2010 GB 50021-2001(2009)

Sample only — not a preview of T/CSPSTC 25-2019