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Database: 365,228(8 Aug 2026)

Ban Shiyi

Ban Shiyi, Total:21 items.

The international standard classification for "Ban Shiyi" includes: Ophthalmic equipment , Laboratory medicine , Therapy equipment , Chemical laboratories. Laboratory equipment , Semiconductor devices in general .

The Chinese standard classification for "Ban Shiyi" includes: Medical ultrasound, laser, high-frequency instrument and equipment , Medical laboratory equipment , Electrochemical, thermochemistry and optical profile type analyzer , Technical management .


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Professional Standard - Medicine

国家药监局

  • YY/T 1751-2020 Therapeutic laser equipment—Laser diode irradiation therapeutic equipment for nasal cavity

Group Standards of the People's Republic of China

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1894-2021 Calibration Specification for Calibrators of Semiconductor Curve Tracers

Professional Standard - Electron

  • SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810

Military Standard of the People's Republic of China-General Armament Department

  • GJB 9887-2020 General specifications for hemispheric resonant gyroscopes

PL-PKN

HU-MSZT

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes

GSO

  • GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
  • GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

SCC

  • 12/30256751 DC BS EN 62047-20. Semiconductor devices. Micro-electromechanical devices. Gyroscopes

Institute of Electrical and Electronics Engineers (IEEE)

  • IEEE Std 1687-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
  • IEEE P1687/D1.71, March 2014 IEEE Approved Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
  • IEEE 1687-2014 Access and Control of Instrumentation Embedded within a Semiconductor Device (IEEE Computer Society)
  • IEEE P1687/D1.62, September 2013 IEEE Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

Ban Shiyi