Efficient TEM
Efficient TEM, Total:51 items.
The international standard classification for "Efficient TEM" includes: Other standards related to analytical chemistry , Optics and optical measurements in general , Optical equipment , Physicochemical methods of analysis , Laboratory medicine , Valves , Chemical analysis .
The Chinese standard classification for "Efficient TEM" includes: Medical optical instrument and endoscope , Optical instrument in general , Magnifier and microscope , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Valve .
Professional Standard - Non-ferrous Metal
- YS/T 1623-2023 Inspection of ageing precipitates for aluminium alloys ——Transmission electron microscopy method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/Z 21738-2008 Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope(TEM)
- GB/T 28044-2011(英文版) General guide of detection method for nanomaterial biological effect by transmission electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Professional Standard - Machinery
- JB/T 2776-2010 Components of valves-High pressure lens gaskets
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5383-1991 Specification for Transmission Electron Microscope
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
- T/CNTAC 21-2018 Test method for identification of graphene materials in fibres– Transmission electron microscope (TEM) method
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon-based nanomaterials involving biological effect
- GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
Military Standard of the People's Republic of China-General Armament Department
- GJB 5094-2004 General specifications for Luneberg lens reflectors
工业和信息化部
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 Blatt 3-2011 X-ray optical systems - Capillary X-ray lenses
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
- VDI/VDE 5575 BLATT 3-2019 Roentgenoptische Systeme - Roentgenkapillaren
SCC
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
Japanese Industrial Standards Committee (JISC)
- JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
- JIS E 3303:1977 Lenses, filters, reflectors and semi-sealed units for railway signals
- JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
Association Francaise de Normalisation
- NF S77-113:1994 Specification for welding filters with switchable luminous transmittance and welding filters with dual luminous transmittance.
- NF S12-131:1999 Ophthalmic instruments. Refractor heads.
Korean Agency for Technology and Standards (KATS)
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 8544-2016 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KR-KS
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
RU-GOST R
- GOST R ISO 10341-2013 Ophthalmic instruments. Refractor heads
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