x-fluorescent test method
x-fluorescent test method, Total:4 items.
The international standard classification for "x-fluorescent test method" includes: Semiconducting materials , Testing of metals .
The Chinese standard classification for "x-fluorescent test method" includes: Semimetal and semiconductor material in general , Semimetal and semiconductor material analysis method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
SAE - SAE International
- SAE AS6171/3-2016 Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Test Methods
Society of Automotive Engineers (SAE)
- SAE AS6171/3-2022 Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Fluorescence Test Methods
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