Ion Hydrazine Mass Analyzer

Ion Hydrazine Mass Analyzer, Total:129 items.

The international standard classification for "Ion Hydrazine Mass Analyzer" includes: Testing of metals in general , Nickel, chromium and their alloys , Other non-ferrous metals and their alloys , Titanium and titanium alloys , Chemical analysis , Aluminium and aluminium alloys , Ferrous metals , Laboratory medicine .

The Chinese standard classification for "Ion Hydrazine Mass Analyzer" includes: Light metals and their alloys analysis method , Heavy metals and their alloys analysis method , Rare refractory metals and their compounds , Rare light metals and their alloys , Basic standards and general methods , Pesticide , Heavy metals and their alloys , Steel and iron alloy analysis method , Medical laboratory equipment .

Professional Standard - Non-ferrous Metal

YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry
YS/T 892-2024 Method for chemical analysis of high purity titanium一Determination of trace impurity elements content一Inductively coupled plasma mass spectrometry
YS/T 1593.4-2023 Methods for chemical analysis of crude lithium carbonate— Part 4：Determination of anion contents— Ion chromatography
YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
YS/T 900-2024 Methods for chemical analysis of high purity tungsten一Determination of trace impurity element content一Inductively coupled plasma mass spectrometry
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
YS/T 898-2024 Method for chemical analysis of high purity tantalum一Determination of trace impurity elements content一Inductively coupled plasma mass spectrometry
YS/T 1380-2020 Method for chemical analysis of rhodium compounds. Determination of the chloride ion and nitrate ion contents. Ion chromatography method
YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
YS/T 896-2024 Methods for chemical analysis of high purity niobium一Determination of trace impurity elements content一Inductively coupled plasma mass spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB 223.38-1985 Methods for chemical analysis of iron,steel and alloy; The anion-exchange separation-gravimetric method for the determination of niobium content
GB/T 223.12-1991 Methods for chemical analysis of iron,steel and alloy--The sodium carbonate separation-diphenyl carbazide photometric method for the determination of chromium content
GB/T 13747.4-2020 Methods for chemical analysis of zirconium and zirconium alloys－Part 4：Determination of chromium content—Diphenylcarbazide spectrophotometry and inductively coupled plasma atomic emission spectrometry
GB 8203-1987 Analytical method of content for phenyl maleic hydrazide
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 223.38-1985 Methods for chemical analysis of iron,steel and alloy--The anion-exchange separation-gravimetric method for the determination of niobium content
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 6987.30-2001 Aluminium and aluminum alloys method after extraction - diphenyl-carbon diethylol hydrazine spectrophotometric method for the determination of chromium content
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry

Professional Standard - Chemical Industry

HG/T 2983-1987 Analytical Method of Content for Phenyl Maleic Hydrazide (Former GB 8203-87)
HG/T 2983-1987(1997) Analytical method of content for phenyl maleic hydrazide

Professional Standard - Medicine

YY/T 1795-2021 Sperm quality analyzer

Professional Standard - Education

JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry

Professional Standard - Rare Earth

XB/T 619-2015 Chemical analysis methods of ion type rare earth ore. Determination of total rare earth ion phase

Professional Standard - Geology

DZ/T 0064.28-2021 Methods for analysis of groundwater quality- Part28: Determination of potassium, sodium lithium and ammonium contents- Ion chromatography

British Standards Institution (BSI)

BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
BS EN ISO 2871-1:1994 High molecular mass cationic-active matter
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS 3762-3-3.26:1989 Analysis of formulated detergents-Quantitative test methods-Method for determination of high molecular mass cationic-active matter content
BS 3762-3-3.4:1991 Analysis of formulated detergents-Quantitative test methods.-Method for determination of lower molecular mass cationic-active matter content
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS 3762-3.7:1986 Analysis of formulated detergents - Quantitative test methods - Method for determination of total non-ionic matter content
BS EN ISO 2871-2:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Cationic-active matter of low molecular mass (between 200 and 500)
BS EN ISO 2871-2:1994 Surface active agents. Detergents. Determination of cationic-active matter content-Cationic-active matter of low molecular mass (between 200 and 500)
BS 3762-3.1:1990 Analysis of formulated detergents. Quantitative test methods. Method for determination of anionic-active matter content
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS 3762-3-3.1:1983 Analysis of formulated detergents. Quantitative test methods-Method for determination of anionic-active matter content
BS ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)

International Organization for Standardization (ISO)

ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
OS GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter

GCC Standardization Organization

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

Korean Agency for Technology and Standards (KATS)

KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
KS C IEC 61988-2-3-2007(2017) Plasma display panels－Part 2－3：Measuring methods－Quality
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS M ISO 2871-2022 Surface active agents－Detergents－Determination of cationic-active matter content－High-molecular-mass cationic-active matter
KS M ISO 2871-2007(2017) Surface active agents－Detergents－Determination of cationic-active matter content－High-molecular-mass cationic-active matter
KS M ISO 2871-2007(2022) Surface active agents－Detergents－Determination of cationic-active matter content－High-molecular-mass cationic-active matter
KS D ISO 17560-2025 Surface chemical analysis — Secondary ion mass spectrometry — Method for depth profiling of boron in silicon
KS D 1702-2020 Platium－Determination of trace-element content by inductively coupled plasma spectrometric analysis－Matrix matching method
KS M 0035-1993 General rules for ion chromatographic analysis
KS M ISO 2871-2-2022 Surface active agents－Detergents－Determination of cationic-active matter content－Cationic-active matter of low molecular mass(between 200 and 500)
KS I ISO 17294-2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
KS M ISO 2871-2-2007(2017) Surface active agents－Detergents－Determination of cationic-active matter content－Cationic-active matter of low molecular mass(between 200 and 500)
KS M 0035-2008(2023) General rules for ion chromatographic analysis
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon

Japanese Industrial Standards Committee (JISC)

JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Association Francaise de Normalisation

NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF T73-320:1994 Surface active agents. Detergents. Determination of cationic-active matter content. Part 1 : high-molecular-mass cationic-active matter.
NF T73-320-1*NF EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1 : high-molecular-mass cationic-active matter.
NF EN 1784:2003 Produits alimentaires - Détection d'aliments ionisés contenant des lipides - Analyse par chromatographie en phase gazeuse des hydrocarbures

Association of German Mechanical Engineers

VDI 3676-2020 Inertial separators
VDI 3676-1998 Massenkraftabscheider
VDI 3676-1980 Massenkraftabscheider
VDI 3676-2005 , Inertial Separators Inertial Separators
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
VDI 3869 Blatt 3-2008 Measurement of ammonia in ambient air - Sampling with diffusion separators (denuders) - Photometric or ion chromatographic analysis

Standard Association of Australia （SAA）

AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

German Institute for Standardization

DIN EN ISO 2871-1:1994-12 Determination of cationic-active matter content of detergents - High-molecular mass cationic-active matter (ISO 2871-1:1988)
DIN 6801-1:2019-09 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
DIN 6801-1 E:2016-06 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
DIN 6801-1:2019 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
DIN EN ISO 2871-1:1994 Determination of cationic-active matter content of detergents - High-molecular mass cationic-active matter (ISO 2871-1:1988)
DIN EN ISO 2871-1:2010-06 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter (ISO 2871-1:2010); German version EN ISO 2871-1:2010

IPC - Association Connecting Electronics Industries

IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method

US-ACEI

IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method

Gosstandart of Russia

GOST R 54352-2011 Food common salt. Determination of a mass fraction of magnesium-ion and calcium-ion by complexonometric method
GOST 10671.0-1974 Reagents. General requirements for methods of analysis of anions impurities
GOST 10671.0-2016 Reagents. General requirements for methods of analysis of anions impurities

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 802.15.4-2020/Cor 1-2022 (Corrigendum to IEEE Std 802.15.4-2020 as amended by IEEE Std 802. IEEE Standard for Low-Rate Wireless Networks Corrigendum 1: Correction of Errors Preventing Backward Compatibility

Danish Standards Foundation

DANSK DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter
DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter

SE-SIS

SIS SS IEC 528:1984 Electronic measuring equipment - Expression ofperformance of air quality infra-red analyzers

American Society for Testing and Materials (ASTM)

ASTM D5542-04(2009) Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography

Ente Nazionale Italiano di Unificazione

UNI EN ISO 2871-1:1996 Surface active agents. Detergents - Determination of cationic-active matter content. High-molecular-mass cationic- active matter.

Spanish Association for Standardization (UNE)

UNE-EN ISO 2871-1:1995 SURFACE ACTIVE AGENTS. DETERGENTS. DETERMINATION OF CATIONIC-ACTIVE MATTER CONTENT. PART 1: HIGH-MOLECULAR-MASS CATIONIC-ACTIVE MATTER. (ISO 2871-1:1988)

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A

European Committee for Standardization (CEN)

EN ISO 14911:1999 Water Quality - Determination of Dissolved Li+, Na+, NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ Using Ion Chromatography - Method for Water and Waste Water ISO 14911:1998

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