hexagonal lattice

hexagonal lattice, Total:115 items.

The international standard classification for "hexagonal lattice" includes: Non-destructive testing of metals , Semiconducting materials , Pressure vessels, gas cylinders .

The Chinese standard classification for "hexagonal lattice" includes: Rare light metals and their alloys , Metal physical property test method , Semimetal and semiconductor material in general , Pressure vessel .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16595-2019 Specification for a universal wafer grid
GB/T 16595-1996 Specification for a universal wafer grid
GB/T 6611-2008 Terminology and metallographs for titanium and titanium alloys
GB/T 30654-2014 Test method for lattice constant of Ⅲ-nitride epitaxial layers
GB/T 6611-1986 Terminology for titanium and titanium alloy

Professional Standard - Energy

NB/T 47011-2010 Zirconium pressure vessels

Group Standards of the People's Republic of China

T/CSTM 00071-2019 Chemical reagent — Aluminum chloride hexahydrate

Taiwan Provincial Standard of the People's Republic of China

CNS 8128-1981 Method for measurement of lattice spacing of neuclear graphite

International Organization for Standardization (ISO)

PRF IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
ISO/IWA 43:2023 Glass types - Crystal glass, crystal and lead crystal - Specifications and test methods
ISO 17258:2015 Statistical methods - Six Sigma - Basic criteria underlying benchmarking for Six Sigma in organisations
ISO/TR 22914:2020 Statistical methods for implementation of Six Sigma — Selected illustration of analysis of variance
ISO 13053-1:2011 Quantitative methods in process improvement - Six Sigma - Part 1: DMAIC methodology
ISO 3262-5:2023 Extenders — Specifications and methods of test — Part 5: Natural crystalline calcium carbonate
ISO/TR 16705:2016 Statistical methods for implementation of Six Sigma - Selected illustrations of contingency table analysis

Association Francaise de Normalisation

NF ISO 17258:2015 Statistical Methods - Six Sigma - Fundamental Criteria for a Six Sigma Benchmarking for Organizations
NF X06-038*NF ISO 17258:2015 Statistical methods - Six Sigma - Basic criteria underlying benchmarking for Six Sigma in organisations
NF X06-092-1*NF ISO 13053-1:2011 Quantitative methods in process improvement - Six Sigma - Part 1 : DMAIC methodology
NF C93-616*NF EN 62276:2018 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF C93-616*NF EN IEC 62276:2025 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF X06-091:2011 Lean, Six Sigma, Lean Six Sigma approaches - Skill requirements for improvement project managers and workshop facilitators
NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks

Malaysia Standards

MS 1433-1998 Specification for wafers

Danish Standards Foundation

DANSK DS/ISO 17258:2015 Statistical methods - Six Sigma - Basic criteria underlying benchmarking for Six Sigma in organisations
DANSK DS/EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
DS/ISO/TR 22914:2020 Statistical methods for implementation of Six Sigma – Selected illustration of analysis of variance
DANSK DS/ISO 18404:2015 Quantitative methods in process improvement - Six Sigma - Competencies for key personnel and their organizations in relation to Six Sigma and Lean implementation
DANSK DS/ISO/TR 22914:2020 Statistical methods for implementation of Six Sigma – Selected illustration of analysis of variance
DANSK DS/ISO 13053-1:2011 Quantitative methods in process improvement - Six Sigma - Part 1: DMAIC methodology
DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
DS/ISO 13053-1:2011 Quantitative methods in process improvement - Six Sigma - Part 1: DMAIC methodology
DANSK DS/ISO 3262-5:2023 Extenders – Specifications and methods of test – Part 5: Natural crystalline calcium carbonate

American Society for Testing and Materials (ASTM)

ASTM F848-83(1988) Standard test method for determining the lattice constant of single-crystal gadolinium gallium garnet (GGG)
ASTM D3942-03(2008) Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM D3942-97 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM D3942-03 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM D3942-03(2013) Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM F47-94 Crystalline Silicon Crystal Defect Detection Method
ASTM D2472-00(2014) Standard Specification for Sulfur Hexafluoride

Ente Nazionale Italiano di Unificazione

UNI ISO 17258:2019 Statistical methods -- Six Sigma -- Basic criteria underlying benchmarking for Six Sigma in organisations
UNI ISO 13053-1:2014 Quantitative methods in process improvement - Six Sigma - Part 1: DMAIC methodology
UNI ISO 18404:2019 Quantitative methods in process improvement -- Six Sigma -- Competencies for key personnel and their organizations in relation to Six Sigma and Lean implementation

Spanish Association for Standardization (UNE)

UNE-ISO 17258:2017 Statistical methods -- Six Sigma -- Basic criteria underlying benchmarking for Six Sigma in organizations
AENOR UNE-ISO 17258:2017 Métodos estadísticos. Seis Sigma. Criterios básicos del benchmarking para Seis Sigma en las organizaciones.
UNE-EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
AENOR UNE-ISO 18404:2017 Quantitative methods for process improvement. Six Sigma. Competencies of key personnel and their organizations in relation to the implementation of Lean and Six Sigma.
UNE-ISO 18404:2017 Quantitative methods in process improvement -- Six Sigma -- Competencies for key personnel and their organizations in relation to Six Sigma and Lean implementation
UNE-EN 168201:1992 BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in November of 1997.)
UNE-ISO 13053-1:2012 Quantitative methods in process improvement -- Six Sigma -- Part 1: DMAIC methodology
UNE-EN 168200/A1:1993 SS: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in September of 1996.)

Gosstandart of Russia

GOST R 56775-2015 Microcalcite. for construction materials. Specifications
GOST R 55799-2013 Grain distillates. Specification
GOST R 70295-2022 Gristalline dextrose. Specifications
GOST 5420-1974 Cryptocrystalline graphite. Specifications
GOST R 56708-2015 Polymer hexagonal geogrid. Specifications
GOST R 57981-2017 Hexagon socket screw keys. Specifications
GOST R 50123-1992 Hexagon socket screw keys. Specifications
GOST R 50779.100-2017 Statistical methods. "Six Sigma" methodology. General criteria of benchmarking in organization
GOST 9991-1974 Technical hexachlorethane. Specifications
GOST R IEC 61747-2-2017 Liquid crystal display devices. Part 2. Liquid crystal display modules. Sectional specification

Magyar Szabványügyi Testület

MSZ 8533-1961 Hexagonal crystals of industrial explosives

Comitato Elettrotecnico Italiano

CEI EN IEC 62276:2025 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
CEI EN 62276:2017 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC 62276:2014 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
OS GSO ISO 13053-1:2015 Quantitative methods in process improvement -- Six Sigma -- Part 1: DMAIC methodology

GCC Standardization Organization

GSO IEC 62276:2014 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

European Committee for Electrotechnical Standardization（CENELEC）

EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
EN IEC 62276:2025 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

German Institute for Standardization

DIN EN IEC 62276:2023-05 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English / Note: Date of issue 2023-04-28*Intended as replacement for DIN EN 62276 (2017-08).
DIN EN 62276:2017-08 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016 / Note: DIN EN 62276 (2013-08) remains valid alongside this standard until 2019-11-28.
DIN EN 62276:2017 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
DIN 4000-19:1988-12 Tabular layouts of article characteristics for transistors and thyristors
DIN EN IEC 62276 E:2023-05 Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English
DIN EN IEC 62276 E:2023 Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English
DIN IEC 62276 E:2009 Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/879/CD:2009)
DIN EN 62276 E:2015 Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1116/CD:2014)

Bureau of Indian Standards

IS 9441-1979 Sextant specifications
IS 12324-1988 Hexagon nut specifications
IS 7618-1974 Hexachloroethane specifications
IS 7795-1975 Hexagonal nut specifications with ring
IS 16123-1-2013 Quantitative Methods in Process Improvement —— Six Sigma Part 1 the Dmaic Methodology

Society of Automotive Engineers (SAE)

SAE AS9362A-2001 NUT@ PLAIN@ HEXAGON@ CHECK - UNS S66286@ 130 KSI MIN@ SILVER PLATED
SAE AS9362A-2012 NUT, PLAIN, HEXAGON, CHECK - UNS S66286, 130 KSI MIN, SILVER PLATED
SAE AS9362B-2019 NUT, PLAIN, HEXAGON, CHECK - UNS S66286, 130 KSI MIN, SILVER PLATED

British Standards Institution (BSI)

23/30468947 DC BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
BS EN ISO 3262-5:2023 Extenders. Specifications and methods of test. Natural crystalline calcium carbonate
BS ISO 18404:2015 Quantitative methods in process improvement. Six Sigma. Competencies for key personnel and their organizations in relation to Six Sigma and Lean implementation
BS PD ISO/TR 22914:2020 Statistical methods for implementation of Six Sigma. Selected illustration of analysis of variance
BS EN IEC 62276:2025 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN ISO 3262-2:2023 Extenders. Specifications and methods of test. Baryte (natural barium sulfate)
PD ISO/TR 22914:2020 Statistical methods for implementation of Six Sigma. Selected illustration of analysis of variance
BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN 62276:2006 Single crystal wafers applied for surface acoustic wave (SAW) device applications - Specification and measuring methods
BS EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN 61747-2:1999 Liquid crystal and solid-state display devices. Liquid crystal display modules. Sectional specification
BS EN 292-2:1991(1999) Six Sigma Process Improvement

Lithuanian Standards Office

LST EN 62276-2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012)
LST EN 62276-2006 Single crystal wafers for surface acoustic wave (SAW) device appplications. Specifications and measuring methods (IEC 62276:2005)

Japanese Industrial Standards Committee (JISC)

JIS R 7651:2024 Measurement of lattice parameters and crystallite sizes of carbon materials
JIS R 7651:2007 Measurement of lattice parameters and crystallite sizes of carbon materials

European Committee for Standardization (CEN)

EN 13383-1:2013 Armourstone - Part 1: Specification

Swedish Institute for Standards

SS-EN 62276:2006 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

American Petroleum Institute (API)

API STD 594 CHINESE-2004 Check Valves: Flanged@ Lug@ Wafer and Butt-welding (Sixth Edition)
API STD 594-2004 Check Valves: Flanged@ Lug@ Wafer and Butt-welding (Sixth Edition)
API STD 594 RUSSIAN-2004 Check Valves: Flanged@ Lug@ Wafer and Butt-welding (Sixth Edition)

International Electrotechnical Commission (IEC)

IEC 62276:2012 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Defense Logistics Agency

DLA QPL-3098-91-2006 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR

U.S. Military Regulations and Norms

ARMY QPL-55310-69-2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310 E-2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310 E SUPP 1-2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 13053-1:2017 Quantitative methods in process improvement -- Six Sigma -- Part 1: DMAIC methodology