time-of-flight quadrupole ion trap
time-of-flight quadrupole ion trap, Total:33 items.
The international standard classification for "time-of-flight quadrupole ion trap" includes: Chemical analysis .
The Chinese standard classification for "time-of-flight quadrupole ion trap" includes: Basic standards and general methods .
Professional Standard - Commodity Inspection
- SN/T 5493-2023 Determination of 29 fentanyl analogs in solid and liquid samplesLiquid chromatography-quadrupole time of flight mass spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Anhui Provincial Standard of the People's Republic of China
- DB34/T 2820-2017 Determination of 330 pesticide residues in Chinese herbal medicines by liquid chromatography quadrupole time-of-flight tandem mass spectrometry
Group Standards of the People's Republic of China
- T/GAIA 008-2021 Determination of Short Chain Chlorinated Paraffins in Plastic, Rubber Products and Chlorinated Paraffins Raw Material — HPLC-Q-TOF/MS Method
- T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry
British Standards Institution (BSI)
- BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
- 25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS EN 15617:2009 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
- BS ISO 17546:2016 Space systems. Lithium ion battery for space vehicles. Design and verification requirements
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GCC Standardization Organization
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
International Organization for Standardization (ISO)
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17546:2016 Space systems - Lithium ion battery for space vehicles - Design and verification requirements
American Society for Testing and Materials (ASTM)
- ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
Japanese Industrial Standards Committee (JISC)
- JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
IX-IX-ISO
- ISO 13084:2025 Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 15626:2013 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
- UNI EN 15617:2009 Non-destructive testing of welds - Time- of-flight diffraction technique (TOFD) - Acceptance levels
- UNI EN ISO 15626:2018 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
Gosstandart of Russia
- GOST R 57024-2016 Fish. Method for determination of the residual content of derivatives benzoylureas using ultra highly liquid chromatography-quadrupole-time-of-flight mass spectrometry
German Institute for Standardization
- DIN EN 15617 E:2007-01 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
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