mos tester

mos tester, Total:33 items.

The international standard classification for "mos tester" includes: .

The Chinese standard classification for "mos tester" includes: Technical management .

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National Metrological Verification Regulations of the People's Republic of China

• JJG(电子) 04021-1989 Specification for verification of BJ3110 model MOS integrated circuit testers

Professional Standard - Aerospace

• QJ/Z 33-1977 Field effect digital integration (P-MOS) circuit test method

Professional Standard - Electron

• SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
• SJ 20852-2002 The test speech database for speech quality assessment of the military communication systems with the MOS method

Korean Agency for Technology and Standards (KATS)

• KS C 5113-1983 MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
• KS C 5113-1983(1998) MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
• KS C 5113-2002 MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
• KS C 1306-1980 Circuit testers
• KS C 1306-2013(2018) Circuit testers
• KS C 1310-2019 Earth testers
• KS P 4406-2010 Visual acuity testing equipments
• KS C 1306-2023 Circuit testers

SCC

• 08/30177349 DC BS EN 62416. Hot carrier test on MOS transistors
• 07/30163748 DC BS EN 62416. Hot carrier test on MOS transistors
• CEI EN 62416:2011 Semiconductor devices - Hot carrier test on MOS transistors
• DANSK DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• DIN IEC 62416 E:2007 Draft Document - Hot Carrier Test on MOS Transistors (IEC 47/1902/CD:2007)
• DIN 55654:2015 Scratch test using a linear abrasion tester (crockmeter)
• DIN 55654 E:2015 Draft Document - Scratch test using a linear abrasion tester (crockmeter)

Danish Standards Foundation

• DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

Spanish Association for Standardization (UNE)

• UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)

International Electrotechnical Commission (IEC)

• IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

German Institute for Standardization

• DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010

Association Francaise de Normalisation

• NF EN 62416:2010 Semiconductor Devices – Hot Carrier Testing on MOS Transistors
• NF C80-202*NF EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

Japanese Industrial Standards Committee (JISC)

• JIS C 7042:1982 Measuring methods for MOS digital integrated circuits
• JIS C 1202:1986 Circuit testers
• JIS C 1202:2000 Circuit testers

Lithuanian Standards Office

• LST EN 62416-2010 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)

European Committee for Electrotechnical Standardization（CENELEC）

• EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

SE-SIS

• SIS SS 64 12 22-1984 Surveying instruments - Theodolites - Testing - A ccuracy of angular measurement

Indonesia Standards

• SNI 05-2962-1992 Sound level meter

KR-KS

• KS C 1306-2013(2023) Circuit testers

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