Dispersion Analysis

Dispersion Analysis, Total:63 items.

The international standard classification for "Dispersion Analysis" includes: Particle size analysis. sieving .

The Chinese standard classification for "Dispersion Analysis" includes: Sieving, Sieve Plate and Sieve Screen .

Group Standards of the People's Republic of China

T/CECPA 006-2022 Evaluation Method of Discrete Ordinate Shielding Analysis Software
T/ZFB 0071-2024 Liquid disperse dyes — Particle size analysis — Dynamic light scattering(DLS)

VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
VDI 3869 BLATT 4-2012 Measuring ammonia in outdoor air — Sampling with passive samplers — Photometric or ion chromatographic analysis
BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
06/30143121 DC ISO 22412. Particle size analysis. Dynamic light scattering (DLS)
DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
VDI 3870 BLATT 11-1996 Measuring rain constituents — Determination of free acidity
DIN ISO 22412 E:2018 Draft Document - Particle size analysis - Dynamic light scattering (DLS) (ISO 22412:2017); Text in German and English

DIN 53804-2:1985 Stastistical interpretation of data; countable (discrete) characteristics
DIN 66142-2:1981 Representing and characterizing the separation of disperse materials; Application to analytical separation processes
DIN ISO 22412:2018-09 Particle size analysis - Dynamic light scattering (DLS) (ISO 22412:2017)
DIN 10756:2021 Analysis of honey - Determination of free acidity
DIN 10756:2009 Analysis of honey - Determination of free acidity
DIN 10756:2021-03 Analysis of honey - Determination of free acidity
DIN 66120:1983 Particle size analysis; size analysis by air classification with centrifugal counterflow classifier
DIN 66120:2016 Particle size analysis - Size analysis by air classification with centrifugal counterflow classifier
DIN 66120 E:2015-11 Particle size analysis - Size analysis by air classification with centrifugal counterflow classifier
DIN 66120:2016-10 Particle size analysis - Size analysis by air classification with centrifugal counterflow classifier

JIS Z 8828:2019 Particle size analysis -- Dynamic light scattering (DLS)
JIS Z 8828:2013 Particle size analysis.Dynamic light scattering (DLS)
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

ISO 22412:2008 Particle size analysis - Dynamic light scattering (DLS)
ISO/CD 22412:2023 Particle size analysis — Dynamic light scattering (DLS)
ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO/TS 15923-2:2017 Water quality - Determination of selected parameters by discrete analysis systems - Part 2: Chromium(VI), fluoride, total alkalinity, total hardness, calcium, magnesium, iron, iron(II), manganese and aluminium with photometric detection
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers

BH GSO ISO 22412:2016 Particle size analysis -- Dynamic light scattering (DLS)
OS GSO ISO 22412:2013 Particle size analysis -- Dynamic light scattering (DLS)
GSO ISO 22412:2013 Particle size analysis -- Dynamic light scattering (DLS)
OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
GSO IEC 60747-11:2014 Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

BS ISO 22412:2017 Particle size analysis. Dynamic light scattering (DLS)
24/30461403 DC BS ISO 22412 Particle size analysis - Dynamic light scattering (DLS)
BS ISO 22412:2008 Particle size analysis - Dynamic light scattering (DLS)
BS ISO 23170:2022 Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
21/30423416 DC BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

VDI 3869 Blatt 3-2008 Measurement of ammonia in ambient air - Sampling with diffusion separators (denuders) - Photometric or ion chromatographic analysis
VDI 3870 Blatt 11-1994 Messen von Regeninhaltsstoffen - Bestimmung der freien Aciditaet

NF E04-007:2022 Spécification géométrique des produits (GPS) - Décomposition modale discrète - Méthode d'analyse
XP E04-007:2015 Geometrical product specifications (GPS) - Discreet modal decomposition - Analysis method

NBN T 63-123-1980 Surface active agents - Analysis of soaps - Determination of low contents of free glycerol - Spectrophotometric method