mass spectrometer electronics

mass spectrometer electronics, Total:57 items.

The international standard classification for "mass spectrometer electronics" includes: Electronic components in general .

The Chinese standard classification for "mass spectrometer electronics" includes: .

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 05004-1987 Trial Verification Regulations for LCD-1 Large Inductance Measuring Instrument
JJG(电子) 05013-1988 AV2551 type potentiometer dynamic contact resistance change measuring instrument trial verification regulations
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG(电子) 04003-1987 BJ2952A (JS-3A) Transistor Reverse Breakdown Voltage Tester Trial Verification Regulations
JJG(电子) 12030-1989 Verification Regulations for VS22 TV Nonlinear Distortion Tester
JJG(电子) 04026-1989 BJ2985 type crystal triode maintenance voltage tester verification regulations
JJG(电子) 306003-2006 Specification for verification of leakage current testers
JJG(电子) 07008-1991 Verification Regulations for SWOF Video Swept Spectrum Analyzer
JJG(电子) 05010-1988 RT150/RT160 Relay Test Instrument Trial Verification Regulations
JJG(电子) 02009-1995 Verification Regulations for Analog Electronic Voltmeter
JJG(电子) 04033-1989 BJ3123 type bipolar logic integrated circuit tester verification regulations
JJG(电子) 07010-1991 Specification for verification of YH4032 model panoramic spectrum analyzers
JJG(电子) 18005-1991 Verification Regulations for DA-1 Electrical Safety Parameter Tester
JJG(电子) 04032-1989 BJ3122 (QL11) logic integrated circuit tester verification regulations
JJG(电子) 310006-2006 Specification for verification of noise detectors for particle collision of devices
JJG(电子) 05001-1987 RCJ-3 Insulation Resistance Tester Trial Verification Regulations
JJG(电子) 04018-1988 BJ2901 Bipolar Transistor Reverse Breakdown Voltage Standard Instrument Trial Verification Regulations
JJG(电子) 04039-1991 GH3112 Integrated Circuit Dynamic Logic Function Detector Verification Regulations
JJG(电子) 05018-1988 Trial Verification Regulations for HM2672 Insulation Resistance Measuring Instrument
JJG(电子) 04010-1987 BJ2961 Transistor Integrated Circuit Dynamic Parameter Tester Trial Verification Regulations
JJG(电子) 04021-1989 Specification for verification of BJ3110 model MOS integrated circuit testers
JJG(电子) 04042-1991 Verification regulations for GH3111/3111G integrated circuit tester
JJG(电子) 05011-1988 Trial Verification Regulations for WZC-1A Potentiometer Comprehensive Tester
JJG(电子) 11005-1988 18.6MHz and above frequency band electronic oscillator trial verification regulations
JJG(电子) 05009-1988 TS-109 Type Electrolytic Capacitor Semi-automatic Sorting Apparatus Trial Verification Regulations
JJG(电子) 12022-1989 VS13 type black and white TV electronic test card generator verification regulations
JJG(电子) 18002-1987 2307 Type Level Recorder Trial Verification Regulations
JJG(电子) 05002-1987 GY2610 Leakage Current Tester Trial Verification Regulations
JJG(电子) 306002-2006 Specification for verification of standard samples of radio frequency electric medium
JJG(电子) 07007-1989 141T/8554B/8552B Spectrum Analyzer Verification Regulations
JJG(电子) 07005-1988 QF4021 High Frequency Spectrum Analyzer Trial Verification Regulations
JJG(电子) 30902-2006 Specification for verification of absolute spectral response rate of photodetectors
JJG(电子) 04007-1987 BJ2950A (JS-4A) Transistor Working Voltage Tester Trial Verification Regulations
JJG(电子) 310003-2006 Specification for verification of capacitor parameter testers for semiconductor discrete devices
JJG(电子) 04001-1987 Trial specification for verification of JS-2C model transistor reverse cut-off current testers
JJG(电子) 05005-1987 B-102 Tantalum Electrolytic Capacitor Leakage Current Tester Trial Verification Regulations

National Metrological Technical Specifications of the People's Republic of China

JJF(电子) 38-1982 Calibration method of BP-24, BP-25, BP-30 microwave spectrum analyzer
JJF(电子) 13-1982 Calibration Method of CC-6 Small Capacitance Measuring Instrument
JJF(电子) 01-1982 Verification method of general electronic counter
JJF(电子) 37-1982 Calibration Method of BP-9 Broadband Microwave Spectrum Analyzer
JJF(电子) 14-1982 Verification method of CJS-2, 3, 4 type capacitor dielectric operating consumption measuring instrument
JJF(电子) 17-1982 Calibration method of LCD-1 large inductance measuring instrument
JJF(电子) 19-1982 Verification method of GS-5A electronic tube tester
JJF(电子) 15-1982 Verification method of TF-704B and C type high frequency dielectric loss measuring instrument
JJF(电子) 12-1982 Calibration method of CCJ-1A, B, C precision capacitance measuring instrument

未注明发布机构

ASTM RR-F01-1013 1996 F1593-Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer

Professional Standard - Medicine

YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 33345-2016 Determination of short chain chlorinated paraffins in electrical and electronic products-Gas chromatography-mass spectrometry

Group Standards of the People's Republic of China

T/CIMA 0019-2019 Proton transfer reaction mass spectrometers

Professional Standard - Commodity Inspection

SN/T 3695.2-2014 Determination of mirex in electrical and electronic products - Part 2: Gas chromatography-mass spectrometry

American Society for Testing and Materials (ASTM)

ASTM F1710-97(2002) Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F1710-97 Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F1593-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
ASTM F1710-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F1845-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F1845-97 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
ASTM F1845-97(2002) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer

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