double frequency peak

double frequency peak, Total:41 items.

The international standard classification for "double frequency peak" includes: Chemical analysis .

The Chinese standard classification for "double frequency peak" includes: Technical Management , Basic standards and general methods .

Professional Standard - Electron

SJ/Z 731-1973 Preferred series and types photomultiplier tubes
SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

SN/T 4504-2016 Determination of clobetasol ,beclomethasone and clobetasol propionate in cosmetics-HPLC-MS/MS method

GJB 759-1989 Potassium titanium phosphate (KTP) crystal for laser frequency doubler
GJB 1677-1993 Specification for frequency doubling antireflection coating of potassium titanyl phosphate (KTP) for nonlinear optical crystals

GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

IS 6964-1973 Specification for octave, half-octave and third-octave band filters for sound and vibration analysis

GOST 11612.17-1981 Phetomultiplirs. Methods of measuring spectral anode sensitivity
GOST 11612.7-1983 Photomultipliers. Measuring methods of light and spectral equivalent of anode current noise produced by luminous flux

AS Z41:1969 Octave, half octave and one-third octave band pass filters intended for the analysis of sound and vibrations

BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
23/30475865 DC BS ISO 13473-4. Characterization of pavement texture by use of surface profiles. Part 4. One third octave band spectral analysis of surface profiles
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

JIS C 1513:2002 Octave-band and third-octave-band analyzers for sounds and vibrations

ANSI S1.11-2004 Octave-Band and Fractional Octave-Band Analog and Digital Filters, Specifications for

UNE 21328-4:1975 OCTAVE HALF OCTAVE AND A THIRD OCTAVE BAND FILTERS USED IN NOISES AND VIBRATIONS ANALYSIS.

DANSK DS/ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles – Part 4: One third octave band spectral analysis of surface profiles

ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

ASTM E520-08(2023) Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
ASTM E520-08(2023)e1 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E520-08(2015)e1 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
ASTM E520-98 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
ASTM E520-98(2003) Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
ASTM E827-95 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E827-02 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy

BS 2475:1954 The performance of octave band-pass filters
DIN 45672-3 E:2023 Draft Document - Vibration measurement on railway traffic systems - Part 3: Prediction method based on third-octave spectra

BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

NASA-CR-2760-1977 Atmospheric absorption of high frequency noise and application to fractional-octave bands

KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS C 7007-1971 TYPE DESIGNATION SYSTEM FOR PHOTO-TUBES AND PHOTO-MULTIPLIERS
KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS C 7007-1971(2000) TYPE DESIGNATION SYSTEM FOR PHOTO-TUBES AND PHOTO-MULTIPLIERS

DIN 45672-3:2023-02 Vibration measurement on railway traffic systems - Part 3: Prediction method based on third-octave spectra / Note: Date of issue 2023-01-06
DIN EN 61260-2 E:2014-10 Electroacoustics – Band filters for octaves and fractions of octaves – Part 2: Type examination