Mass spectrometer peak time

Mass spectrometer peak time, Total:33 items.

The international standard classification for "Mass spectrometer peak time" includes: Laboratory medicine , Chemical reagents , Chemical analysis .

The Chinese standard classification for "Mass spectrometer peak time" includes: Medical laboratory equipment , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Technical management , Time and Frequency Measurement .

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National Metrological Technical Specifications of the People's Republic of China

• JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers

国家药监局

• YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 37849-2019 Method of performance testing for liquid chromatography tandem time of flight mass spectrometry
• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Group Standards of the People's Republic of China

• T/QGCML 3220-2024 Remote time-resolved Raman spectrometer

Professional Standard - Geology

• DZ/T 0101.1-1994 Manufacture time quata for geological instrument meter - truning machine
• DZ/T 0101.13-1994 Manufacture time quata for geological instrument meter - assembly
• DZ/T 0101.3-1994 Manufacture time quata for geological instrument meter - planing machine
• DZ/T 0101.7-1994 Manufacture time quata for geological instrument meter - metal plate
• DZ 57.4-1987 Time quota grinding machine for geological instrumentation industry
• DZ 57.12-1987 Time quota printed board for geological instrumentation industry
• DZ/T 0101.8-1994 Manufacture time quata for geological instrument meter - ramming
• DZ/T 0101.10-1994 Manufacture time quata for geological instrument meter - electrodeposition
• DZ/T 0101.11-1994 Manufacture time quata for geological instrument meter - painting
• DZ 57.1-1987 Time quota lathe for geological instrumentation industry
• DZ/T 0101.5-1994 Manufacture time quata for geological instrument meter - bench worker
• DZ/T 0101.6-1994 Manufacture time quata for geological instrument meter - drilling machine
• DZ/T 0101.4-1994 Manufacture time quata for geological instrument meter - grinding machine
• DZ/T 0101.2-1994 Manufacture time quata for geological instrument meter - milling machine
• DZ/T 0101.12-1994 Manufacture time quata for geological instrument meter - printed plate

National Metrological Verification Regulations of the People's Republic of China

• JJG 601-2022 Time Calibrators
• JJG 601-2003 Verification Regulation of Time Interval Generator
• JJG 238-2018 Time Interval Meters

International Organization for Standardization (ISO)

• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

GSO

• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Japanese Industrial Standards Committee (JISC)

• JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

British Standards Institution (BSI)

• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

SCC

• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer

International Telecommunication Union (ITU)

• ITU-R QUESTION 2397-2001 Instrumentation time codes

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

• QUESTION 239/7-2001 Instrumentation time codes

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