fluorescent surface
fluorescent surface, Total:26 items.
The international standard classification for "fluorescent surface" includes: Chemical analysis , Semiconducting materials , Testing of metals .
The Chinese standard classification for "fluorescent surface" includes: Basic standards and general methods , Semimetal and semiconductor material in general , Semimetal and semiconductor material analysis method .
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 3422-2018 Specifications for ATP bioluminescent detection of surface cleanliness in medical institutions
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
- GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
Group Standards of the People's Republic of China
- T/GDCKCJH 094-2024 Internal surface testing - UV ultraviolet fluorescence endoscope method
US-FCR
- FCR FED H-08-4 VOL 4-E-F-19-1988 SURFACE MOUNTED FLUORESCENT FIXTURE
- FCR FED H-08-4 VOL 4-E-F-9-1988 SINGLE-LAMP SURFACE MOUNTING FLUORESCENT FIXTURE
- FCR FED H-08-4 VOL 4-E-F-22-1988 SURFACE MOUNTED 2'X4' FLUORESCENT
- FCR FED H-08-4 VOL 4-E-F-23-1988 SURFACE MOUNTED 4'X4' FLUORESCENT
- FCR FED H-08-4 VOL 4-E-F-20-1988 SURFACE MOUNTED 1'X4' FLUORESCENT FIXTURE
- FCR FED H-08-4 VOL 4-E-F-21-1988 2 X 2 SURFACE FLUORESCENT, APPROXIMATELY 4" DEEP
- FCR FED H-08-4 VOL 4-E-O-13-1988 SURFACE MOUNTED ENCLOSED AND GASKETED FLUORESCENT FIXTURE
SCC
- AWWA WQTC52933 Fluorescence Characterization of NOM
Korean Agency for Technology and Standards (KATS)
- KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
- KS C 8103-2007(2017) Table study lamps for fluorescent lamps
- KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
International Organization for Standardization (ISO)
- ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
British Standards Institution (BSI)
- BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Japanese Industrial Standards Committee (JISC)
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
KR-KS
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
surface energy,surface fluorescence,epifluorescence spectroscopy,surface surface ball,epifluorescence spectroscopy,solid surface energy,surface tension surface,surface energy surface polarity,surface tension,surface area,epifluorescence spectroscopy,surface metal surface reflection,fluorescent surface,Surface Instrumentation Surface Analysis,fluorescent surface,surface tension surface interface,Fluorescence Surface Spectroscopy,fiber optic surface,membrane surface method,Surface Analysis Fluorescence Spectroscopy
