particle analysis
particle analysis, Total:13 items.
The international standard classification for "particle analysis" includes: Aircraft and space vehicles in general .
The Chinese standard classification for "particle analysis" includes: Electronic components .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41270.7-2022 Process management for avionics—Atmospheric radiation effects—Part 7： Management of single event effects (SEE) analysis process in avionics design
American Water Works Association (AWWA)
- AWWA WQTC60753 Dynamic Particle Analysis: A New Technology for Optimizing Particle Removal In a Water Treatment Plant
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 19430:2017 Particle size analysis -- Particle tracking analysis (PTA) method
GCC Standardization Organization
- GSO ISO 19430:2017 Particle size analysis -- Particle tracking analysis (PTA) method
International Organization for Standardization (ISO)
- ISO 19430:2016 Particle size analysis - Particle tracking analysis (PTA) method
British Standards Institution (BSI)
- BS ISO 19430:2016 Particle size analysis. Particle tracking analysis (PTA) method
Danish Standards Foundation
- DANSK DS/ISO 19430:2016 Particle size analysis – Particle tracking analysis (PTA) method
Korean Agency for Technology and Standards (KATS)
- KS F 2341-1982 Standard method for wet preparation of soil samples for particle size analysis and determination of soil constants
- KS F 2341-2007 Standard method for wet preparation of soil samples for particle size analysis and determination of soil constants
- KS M 0035-2008 General rules for ion chromatographic analysis
German Institute for Standardization
- DIN 50452-2:2009 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
- DIN 50452-1:1995 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
- DIN 50452-3:1995-10 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
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