high frequency icp emission spectrometer

high frequency icp emission spectrometer, Total:29 items.

The international standard classification for "high frequency icp emission spectrometer" includes: .

The Chinese standard classification for "high frequency icp emission spectrometer" includes: Optical Measurement .

National Metrological Verification Regulations of the People's Republic of China

JJG 768-1994 Verification Regulation of Emission Spectrometer
JJG 768-2005 Verification Regulation of Emission Spectrometer
JJG(航天) 26-1987 Verification Regulations for Radio Frequency Spectrum Analyzer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 41945-2022 Rubber, raw, vulcanised—Determination of metal content by ICP-OES

Association Francaise de Normalisation

NF EN 15111:2007 Food products - Determination of trace elements - Determination of iodine by emission spectrometry with high frequency induced plasma and mass spectrometer (ICP-MS)
NF EN ISO 22036:2024 Matrices solides environnementales - Dosage d'éléments par spectroscopie d'émission optique avec plasma induit par haute fréquence (ICP-OES)
NF EN ISO 11885:2009 Water quality - Determination of selected elements by high frequency induced plasma optical emission spectroscopy (ICP-OES)
NF EN 14107:2003 Products derived from fatty substances - Methyl esters of fatty acids (FAME) - Determination of the phosphorus content by high frequency induced plasma emission spectrometry (ICP method)
NF ISO 21033:2016 Corps gras d'origines animale et végétale - Détermination des éléments traces dans les corps gras par spectrométrie d'émission optique à plasma induit par haute fréquence (ICP-OES)
NF ISO 22036:2009 Soil quality - Determination of trace elements in soil extracts by high frequency induced plasma atomic emission spectrometry (ICP-AES)
NF ISO 23166:2019 Nickel alloys - Determination of tantalum - Optical emission spectrometry method with high frequency induced plasma source
NF EN 16317/IN1:2017 Basic mineral fertilizers and amendments - Determination of arsenic by high frequency induced plasma atomic emission spectrometry (ICP-AES) after digestion with aqua regia
NF EN 16317+A1:2017 Basic mineral fertilizers and amendments - Determination of arsenic by high frequency induced plasma atomic emission spectrometry (ICP-AES) after digestion with aqua regia
NF EN 16170:2016 Boues, bio-déchets traités et sols - Détermination des éléments en traces par spectrométrie d'émission optique avec plasma induit par haute fréquence (ICP-OES)
NF EN 15605:2010 Copper and copper alloys - Analysis by optical emission spectrometry with high frequency induced plasma source

Japanese Industrial Standards Committee (JISC)

JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron
JIS H 1632-1:2014 Titanium.ICP atomic emission spectrometry.Part 1: General requirements and sample decomposition
JIS H 1699:1999 Methods for ICP emission spectrometric analysis of tantalum
JIS H 1289:2015 Nickel and nickel alloys -- ICP atomic emission spectrometric method -- Determination of niobium, tantalum and zirconium
JIS H 1699:2006 Methods for ICP emission spectrometric analysis of tantalum

Korean Agency for Technology and Standards (KATS)

KS D 2569-2021 Methods for ICP emission spectrometric analysis of tantalum
KS D 2569-2016(2021) Methods for ICP emission spectrometric analysis of tantalum
KS D 2569-2016 Methods for ICP emission spectrometric analysis of tantalum
KS D 2569-2005 Methods for ICP emission spectrometric analysis of tantalum
KS M 0032-2009(2019) General rules for ICP emission spectrochemical analysis
KS M 0032-2019 General rules for ICP emission spectrochemical analysis

KR-KS

KS D 1673-1-2023 Iron and steel — ICP atomic emission spectrometric method — Part 1: General rules

RO-ASRO

STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry

American Society for Testing and Materials (ASTM)

ASTM E1507-98 Standard Guide for Describing and Specifying the Spectrometer of an Optical Emission Direct-Reading Instrument