Spectral analysis instrument formerly
Spectral analysis instrument formerly, Total:169 items.
The international standard classification for "Spectral analysis instrument formerly" includes: Optics and optical measurements , Measurement of electrical and magnetic quantities , Analytical chemistry in general .
The Chinese standard classification for "Spectral analysis instrument formerly" includes: Optical Measurement , Technical management , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Ionizating Radiation Measurement .
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
- JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
Group Standards of the People's Republic of China
- T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
Professional Standard - Electron
- SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
- SJ/T 10234-1991 Spectrum analyzer for QF4031
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/T 30097-2013 Thermal analyzer for molten cast iron
Professional Standard - Petroleum
- SY 7504-2008 Gas Chromatography for Analysis of n-Octane and Previous Hydrocarbon Components in Crude Oil
- SY/T 7504-1994 Gas Chromatography for Analysis of n-Octane and Previous Hydrocarbon Components in Crude Oil
- SY/T 7504-2008 Determination of octane and hydrocarbon components before octane in crude petroleum.Gas chromatography
工业和信息化部/国家能源局
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
Professional Standard - Machinery
- JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
- JB/T 9331-1999 Slits for optical spectrum instruments
Professional Standard - Agriculture
- GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
Shanxi Provincial Standard of the People's Republic of China
- DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy
未注明发布机构
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
SCC
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- BS EN 61290-1-3:1998 Optical fibre amplifiers. Basic spectrum analyzers-Optical power meter
- DIN EN 62129-1 E:2014 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/468/CD:2014)
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- 11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
British Standards Institution (BSI)
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61207-6:2015 Expression of performance of gas analyzers. Photometric analyzers
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
International Electrotechnical Commission (IEC)
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 62129:2006 Calibration of optical spectrum analyzers
- IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
Japanese Industrial Standards Committee (JISC)
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
- JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
Spanish Association for Standardization (UNE)
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN ISO 11380:1996 OPTICS AND OPTICAL INSTRUMENTS. OPHTHALMIC OPTICS. FORMERS. (ISO 11380:1994).
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
Association Francaise de Normalisation
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF C93-805-2-1:1998 Optical fibre amplifiers. Basic specification. Part 2-1 : test methods for optical power parameters. Optical spectrum analyzer.
South African Bureau of Standard
- SANS 62129:2008 Calibration of optical spectrum analyzers
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SANS 5567:1968 Spectrographic analysis of copper
German Institute for Standardization
- DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
Korean Agency for Technology and Standards (KATS)
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
- KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-5-1-2022 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-3-1:2005 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Lithuanian Standards Office
- LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
IEC - International Electrotechnical Commission
- PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)
- IEC TR 61276:1994 Nuclear Instrumentation - Guidelines for Selection of Metrologically Supported Nuclear Radiation Spectrometry Systems (Edition 1.0)
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
IN-BIS
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
EEMUA - Engineering Equipment and Materials Users Association
- PUB NO 175-1995 EEMUA Code of Practice for Calibration and Checking Process Analysers (Formerly IP Code 340)
GSO
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
RU-GOST R
- GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
International Organization for Standardization (ISO)
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
CENELEC - European Committee for Electrotechnical Standardization
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
- EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
Indonesia Standards
- SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers
Standard Association of Australia (SAA)
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
SE-SIS
- SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 748-1979 STANDARD FOR SPECTRUM ANALYZERS
RO-ASRO
- STAS 11464-1980 IRON AND STEEL Spectrochemical analysis
American Society for Testing and Materials (ASTM)
- ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
- ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
- ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
KR-KS
- KS D ISO 14707-2003(2023) Surface chemical analysis - Glow discharge emission spectroscopy (GD-OES) - Introduction
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis