Evaluation of Uncertainty in X-ray Fluorescence Spectrometry
Evaluation of Uncertainty in X-ray Fluorescence Spectrometry, Total:15 items.
The international standard classification for "Evaluation of Uncertainty in X-ray Fluorescence Spectrometry" includes: Metrology and measurement in general .
The Chinese standard classification for "Evaluation of Uncertainty in X-ray Fluorescence Spectrometry" includes: Measurement in general .
Professional Standard - China Metal Association
- CSM 01 01 01 08-2006 CSM 01 01 01 08-2006 Uncertainty assessment specification of measurement result of X-ray fluorescent spectrometry
- CSM 01010108-2006 Specification for Uncertainty Evaluation of X-ray Fluorescence Spectrometry Measurement Results
Group Standards of the People's Republic of China
- T/CAIA SH003-2015 Rice －Determination of cadmium－X ray fluorescence spectrometry method?
Professional Standard - Agriculture
- 58药典 四部-2020 0461 X-ray fluorescence spectrometry
未注明发布机构
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
Japanese Industrial Standards Committee (JISC)
- JIS K 0119:2008 General rules for X-ray fluorescence analysis
- JIS K 0119:1997 General rules for X-ray fluorescence spectrometric analysis
- JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
- JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
Korean Agency for Technology and Standards (KATS)
- KS D 1898-2009 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- KS D 1655-2008 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1686-2011 Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS D 1654-2003 General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 2597-1996 Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
Standard Association of Australia （SAA）
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
