Integrated circuit measurement

Integrated circuit measurement, Total:20 items.

The international standard classification for "Integrated circuit measurement" includes: .

The Chinese standard classification for "Integrated circuit measurement" includes: .

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PL-PKN

• PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
• PN T01303-03-A1-1991 Semiconductor devices Integrated circuits Analogue integrated circuits Measuring methods Amendment 1

RO-ASRO

• STAS 12161-1984 DIGITAL' INTEGRATED CIRCUITS Measuring methods of main electrical parameters
• STAS 11048-1978 LINEAR INTEGRATED CIRCUITS Prescriptions for measuring for parametersof continuous voltage regulators

IN-BIS

• IS 12970 Pt.3/Sec.3-1993 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 3: Dynamic measurements
• IS 12970 Pt.3/Sec.1-1992 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 1: General
• IS 12970 Pt.6/Sec.1-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 1: General
• IS 12970 Pt.6/Sec.3-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 3: Voltage Regulators
• IS 12970 Pt.3/Sec.2-1992 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Measuring methods. Section 2: Static characteristics
• IS 12970 Pt.6/Sec.2-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 2: Linear Amplifiers

Korean Agency for Technology and Standards (KATS)

• KS C 5113-2002 MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS

Society of Automotive Engineers (SAE)

• SAE J1752/1-2006 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions
• SAE J1752/1-1997 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition
• SAE J1752-1-1997 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
• SAE J1752/1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
• SAE J1752-1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• SAE J1752-3-2017 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• SAE J1752/1-2016 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE - SAE International

• SAE J1752-1-2016 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• SAE J1752-3-2003 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

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