Semiconductor Test Equipment Models
Semiconductor Test Equipment Models, Total:38 items.
The international standard classification for "Semiconductor Test Equipment Models" includes: Semiconductor devices , Plug-and-socket devices. Connectors .
The Chinese standard classification for "Semiconductor Test Equipment Models" includes: Power semiconductor device and parts , Semiconductor discrete devices in general , Connector .
Professional Standard - Machinery
- JB/T 4219-1999 Type Designation of Measuring Equipments for Power Semiconductor Devices
- JB/T 8175-1999 Outline dimensions of extruded heat sink for power semiconductor devices
- JB/T 2423-1999 Type designation for power semiconductor device
Group Standards of the People's Republic of China
- T/ZACA 041-2022 Mixed signal semiconductor device test equipment
- T/ZZB Q041-2022 Mixed signal semiconductor device test equipment
- T/IAWBS 019-2023 Equipment front end module
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 15872-2013 Power supply interface for semiconductor equipment
- GB/T 249-1989 The rule of type designation for discrete semiconductor
- GB/T 15872-1995 Power supply interface for semiconductor equipment
YU-JUS
- JUS N.A3.500-1980 Semiconductor devices. Graphical symbols
RO-ASRO
- STAS 7128/2-1986 LETTER SYMBOLS FOR SEMI- ONDUCTOR DEVICES AND INTE- RATED MICROCIRCUITS ymbols for bipolar transistors
- STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
- STAS 7128/6-1986 LETTER SYMBOLS FOR SEMI- CONDUCTOR DEVICES AND INTEGRATED CIRCUITS Symbols for thyristors
- STAS 7128/8-1986 LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS Symbols for field effect transitors
- STAS 7128/9-1980 SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS Letter symbols for unijonction transistors
- STAS 7128/5-1985 LETTER SYMBOLS FOR SEMICON- DUCTOR DEVICES AND INTEGRA- TED NICROCIRCUITS Symbols for rectifier diodes
- STAS 7128/1-1985 LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS General rules
Defense Logistics Agency
- DLA MIL-S-19500/173 A VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N389 and 2N424 (Navy)
- DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
SE-SIS
- SIS SS-IEC 749:1991 Semiconductor devices - Mechanical and climatic test methods
- SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
- SIS SEN 01 03 51-1976 Semiconductor devices Terminology
- SIS SEN 01 03 51-1966 Semiconductor devices Terminology
CZ-CSN
- CSN IEC 749:1994 Semiconductor devices.Mechanical and climatic test methods
- CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
- CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
- CSN 35 8756-1973 Semiconductor devices. Transistors Measurement of y-parameters
- CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JEP104C.01-2003 Reference Guide to Letter Symbols for Semiconductor Devices
PL-PKN
- PN T01208-01-1992 Semiconductor devices Bipolar transistors Terminology and letter symbols
- PN T01501 ArkusZ4-1973 Semiconductor deyictj Letter symbols of field-effect transistors porameters
Electronic Components, Assemblies and Materials Association
- ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
BE-NBN
- NBN C 95-001-1977 Semiconductor equipment. the term
British Standards Institution (BSI)
- BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
- BS EN IEC 60749-28:2022 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
GSO
- GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Lithuanian Standards Office
- LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
HU-MSZT
- MNOSZ 700-3.lap-1955 Semiconductor Model Analysis Test Laboratory Sample Preparation
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