TEM electron microscope
TEM electron microscope, Total:48 items.
The international standard classification for "TEM electron microscope" includes: Chemical analysis , Optical equipment , Ophthalmic equipment , Physicochemical methods of analysis .
The Chinese standard classification for "TEM electron microscope" includes: Basic standards and general methods , Magnifier and microscope , Other daily necessaries , Electron optics and other physical optics instrument .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 10810.3-2006 Spectacle lenses and related eye wear-Transmittance specifications and test methods
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
- GB/T 10810.3-2025 Uncut finished spectacle lenses—Part 3:Transmittance test methods
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
Group Standards of the People's Republic of China
- T/COOA 7-2023 Microstructure lenses—microlens array lenses
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
Professional Standard - Non-ferrous Metal
- YS/T 1623-2023 Inspection of ageing precipitates for aluminium alloys ——Transmission electron microscopy method
Professional Standard - Ferrous Metallurgy
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
Association of German Mechanical Engineers
- VDI VDE 5575 Blatt 7-2019 X-ray optical systems; Refractive X-ray lenses
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
International Organization for Standardization (ISO)
- ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Japanese Industrial Standards Committee (JISC)
- JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
- JIS E 3303:1977 Lenses, filters, reflectors and semi-sealed units for railway signals
- JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
GCC Standardization Organization
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
Bureau of Indian Standards
- IS 5428-3-2023 Gauge Glasses -Specification - Part 3 Through-Vision and Reflex Glasses
German Institute for Standardization
- DIN IEC 62132-2 E:2006-08 Draft Document - Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
- DIN 58889:1986-09 Lenses and oculars for microscops - Marking
- DIN 58206-2:1983 Card Prism Calibration Lens Prism
Korean Agency for Technology and Standards (KATS)
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS D 8544-2016 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS B 5605-1987 Biological Microscopes for Immersion Objectives
Association Francaise de Normalisation
- NF S77-113:1994 Specification for welding filters with switchable luminous transmittance and welding filters with dual luminous transmittance.
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