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Database: 365,228(8 Aug 2026)

The reliability of this circuit is difficult to guarantee

The reliability of this circuit is difficult to guarantee, Total:184 items.

The international standard classification for "The reliability of this circuit is difficult to guarantee" includes: .

The Chinese standard classification for "The reliability of this circuit is difficult to guarantee" includes: .


Military Standard of the People's Republic of China-General Armament Department

  • GJB 546-1988 Reliability Guarantee Outline for Electronic Components

Professional Standard - Energy

  • NB/T 20134-2012 Guidelines to Ensure Quality of Collected Data on Reliability of Nuclear Power Plants
  • NB/T 20183-2012 Compilation Guideline for Nuclear Power Plant Reliability Assurance Program

Taiwan Provincial Standard of the People's Republic of China

  • CNS 11898-1987 Reliability Assured Plastic Film Capacitors (Characteristic M)
  • CNS 12290-1988 Reliability Assured Fixed Metal Film Resistors (C,E)

Professional Standard - Electron

  • SJ 20473-1994 Requirement for relibility assurance in electronics transformers and inductors

未注明发布机构

Korean Agency for Technology and Standards (KATS)

  • KS C 5210-2020 General rules for reliability assured digital semiconductor integrated circuits
  • KS C 7202-2021 General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
  • KS C 5214-1981(2001) RELIABILITY ASSURED TTL, POSITIVE NAND GATES, INTEGRATED CIRCUITS
  • KS C 7202-1990(2016) General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
  • KS C 6435-1990 GENERAL RULES OF RELIABILITY ASSURED fixed CAPACITORS
  • KS C 7202-1990 General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
  • KS C 7203-1990 Reliability Assured Monolithic Operational Amplifier
  • KS C 6431-1990 GENERAL RULES OF RELIABILITY ASSURED fixed RESISTORS
  • KS C 6438-1978(2001) GENERAL RULES FOR RELIABILITY ASSURED ELECTROLYTIC CAPACITORS
  • KS C 7202-1990(2021) General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
  • KS C 6430-1985 General rules for reliability assured electronic components
  • KS C 6430-2004(2020) General rules for reliability assured electronic components
  • KS C 6436-2002 GENERAL RULES FOR RELIABILITY ASSURED FIXED CERAMIC CAPACITORS
  • KS C 6436-1980(2000) GENERAL RULES FOR RELIABILITY ASSURED FIXED CERAMIC CAPACITORS
  • KS C 6436-1980 GENERAL RULES FOR RELIABILITY ASSURED FIXED CERAMIC CAPACITORS
  • KS C 6446-1992 GENERAL RULES OF RELIABILITY ASSURED FIXED Mica CAPACITORS
  • KS C 6447-1992 RELIABILITY ASSURED ALUMINIUM FOIL ELECTROLYTIC CAPACITORS
  • KS C 6430-2004 General rules for reliability assured electronic components
  • KS C 5215-2002 RELIABILITY ASSURED SOLID TANTALUM CAPACITORS
  • KS C 5215-1981 RELIABILITY ASSURED SOLID TANTALUM CAPACITORS
  • KS C 5215-1981(2001) RELIABILITY ASSURED SOLID TANTALUM CAPACITORS
  • KS C 5218-2020 Reliability assured complementary MOS digital semiconductor integrated circuits(Gates)
  • KS A 5607-2006 Reliability assurance by performance characteristic degrading over time
  • KS C 5204-1980 RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
  • KS C 5204-1980(2000) RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
  • KS C 6439-1992 GENERAL RULES OF RELIABILITY ASSURED fixed Carbon body RESISTORS (class 1)
  • KS C 5213-1981(1997) RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
  • KS C 5211-1980(2000) RELIABILITY ASSURED LOW CURRENT SWITCHING TRANSISTORS
  • KS C 5213-1981 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
  • KS C 5204-2002 RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
  • KS C 5211-2002 RELIABILITY ASSURED LOW CURRENT SWITCHING TRANSISTORS
  • KS C 5213-2002 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
  • KS C 5203-1980(2000) RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 6449-2002 RELIABILITY ASSURED PLASTIC FILM CAPACITORS (CHARACTERISTIC S)
  • KS C 5203-1980 RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 6448-2002 RELIABILITY ASSURED PLASTIC FILM CAPACITORS (CHARACTERISTIC M)
  • KS C 5217-1983 RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
  • KS C 5208-1980(2000) RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
  • KS C 5216-1981(2001) RELIABILITY ASSURED LOW FREQUENCY POWER TRANSISTORS (MEDIUM AND HIGH POWER)
  • KS C 5208-1980 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
  • KS C 5217-2002 RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
  • KS C 5217-1983(1998) RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
  • KS C 5216-1981 RELIABILITY ASSURED LOW FREQUENCY POWER TRANSISTORS (MEDIUM AND HIGH POWER)
  • KS A 5607-2006(2017) Reliability assurance by performance characteristic degrading over time
  • KS C 7203-1990(2022) Reliability Assured Monolithic Operational Amplifier
  • KS C 5219-2019 General rules for reliability assured lowpower electromagnetic relays for industrial control circuits
  • KS C 5203-2002 RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 5202-2004 RELIABILITY ASSURED FIELD-EFFECT TRANSISTORS
  • KS C 5219-2024 General rules for reliability assured lowpower electromagnetic relays for industrial control circuits
  • KS C 5209-1980 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
  • KS C 5209-1980(2000) RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
  • KS C 5201-1980(2000) RELIABILITY ASSURED HIGH FREQUENCY LOW POWER TRANSISTORS
  • KS C 7203-2022 Reliability Assured Monolithic Operational Amplifier
  • KS C 5201-1980 RELIABILITY ASSURED HIGH FREQUENCY LOW POWER TRANSISTORS
  • KS C 5208-2002 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
  • KS A ISO 7385-2012(2017) Nuclear power plants-Guidelines to ensure quality of collected data on reliability
  • KS C 5207-1980 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
  • KS C 5207-1980(2000) RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
  • KS C 5200-2002 RELIABILITY ASSURED LOW FREQUENCY LOW POWER TRANSISTORS
  • KS C 6440-1992 RELIABILITY ASSURED fixed Carbon body RESISTORS (failure rate set)
  • KS C 5201-2002 RELIABILITY ASSURED HIGH FREQUENCY LOW POWER TRANSISTORS
  • KS C 5206-1980(2000) RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
  • KS C 5206-1980 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
  • KS C 6441-1992 RELIABILITY ASSURED fixed Carbon body RESISTORS (level X of method 1)
  • KS C 5218-1983 Reliability assured complementary MOS digital semiconductor integrated circuits(Gates)
  • KS C 5210-1980 General rules for reliability assured digital semiconductor integrated circuits
  • KS C 5206-2002 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
  • KS C 5205-2002 RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
  • KS C 5209-2002 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
  • KS C IEC 62278-2020 Railway applications — Specification and demonstration of reliability, availability, maintainability and safety(RAMS)
  • KS C IEC 62278:2020 Railway applications — Specification and demonstration of reliability, availability, maintainability and safety(RAMS)
  • KS C 6443-1992 GENERAL RULES OF RELIABILITY ASSURED Power type wire wound fixed RESISTORS
  • KS A 5607-2022 Reliability assurance by performance characteristic degrading over time
  • KS C 6444-1992 RELIABILITY ASSURED Power type wire wound RESISTORS (properities S) (failure rate set)
  • KS C 5207-2002 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)

Japanese Industrial Standards Committee (JISC)

  • JIS C 5832:1980 Reliability assured aluminium electrolytic capacitors with non-solid electrolyte
  • JIS C 7310:1979 General rules for reliability assured digital semiconductor integrated circuits
  • JIS C 7410:1981 General rules for reliability assured analogue semiconductor integrated circuits
  • JIS C 7312:1982 Reliability assured complementary MOS digital semiconductor integrated circuits (gates)
  • JIS C 5830:1977 General rules for reliability assured electrolytic capacitors
  • JIS C 7311:1980 Reliability assured TTL, positive nand gates, integrated circuits
  • JIS C 5810:1976 General rules for reliabilty assured fixed capacitors
  • JIS C 5831:1979 Reliability assured solid tantalum capacitors
  • JIS C 5710:1976 General rules for reliability assured fixed resistors
  • JIS C 7222:1978 Reliability assured low current rectifier diodes
  • JIS C 7211:1978 Reliability assured low current switching transistors
  • JIS C 5440:1980 General rules for reliability assured lowpower electromagnetic relays for industrial control circuits
  • JIS C 7224:1980 Reliability assured low current switching diodes
  • JIS C 5842:1982 Reliability assured plastic film capacitors (characteristic S)
  • JIS C 7223:1978 Reliability assured voltage regulator diodes and voltage reference diodes
  • JIS C 5841:1982 Reliability assured plastic film capacitors (characteristic M)
  • JIS C 5820:1976 General rules for reliability assured fixed ceramic capacitors
  • JIS C 5850:1979 General rules for reliability assured fixed mica capacitors
  • JIS C 7225:1982 Reliability assured rectifier diodes (medium and high current)
  • JIS C 5821:1976 Reliability assured fixed ceramic capacitors (type i)
  • JIS C 5730:1977 General rules for reliability assured fixed carbon composition resistors
  • JIS C 5700:1974 General rules for reliability assured electronic components
  • JIS C 7214:1978 Reliability assured field-effect transistors
  • JIS C 7221:1978 Reliability assured small signal diodes
  • JIS C 7411:1981 Reliability assured monolithic operational amplifiers
  • JIS C 5731:1977 Reliability assured fixed carbon composition resistors (established failure rate)
  • JIS C 7212:1978 Reliability assured low frequency low power transistors
  • JIS C 7213:1978 Reliability assured high frequency low power transistors
  • JIS C 7233:1978 Reliability assured bi-directional triode thyristors (low current)
  • JIS C 5740:1977 General rules for reliability assured power type fixed wire wound resistors
  • JIS C 7210:1977 General rules for reliability assured discrete semiconductor devices
  • JIS C 5732:1977 Reliability assured fixed carbon composition resistors (form 1, grade X)
  • JIS C 7234:1978 Reliability assured bi-directional triode thyristors (high and medium current)
  • JIS C 5733:1977 Reliability assured fixed carbon composition resistors (form 2, grade X)
  • JIS C 7231:1978 Reliability assured reverse blocking triode thyristors (low current)
  • JIS C 7215:1980 Reliability assured low frequency power transistors (medium and high power)

Association of German Mechanical Engineers

European Committee for Standardization (CEN)

  • EN 16602-70-26:2014 Space product assurance - Crimping of high-reliability electrical connections
  • EN 16602-70-30:2014 Space product assurance - Wire wrapping of high-reliability electrical connections

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 50389:2005 Space product assurance Wire-wrapping of high-reliability electrical connections
  • EN 50390:2004 Space product assurance The manual soldering of high-reliability electrical connections

British Standards Institution (BSI)

Standards Norway

CEN - European Committee for Standardization

Danish Standards Foundation

Ente Nazionale Italiano di Unificazione

German Institute for Standardization

  • DIN EN 16602-70-30:2015-07 Space product assurance - Wire wrapping of high-reliability electrical connections; English version EN 16602-70-30:2014
  • DIN EN 50389:2006 Space product assurance - Wire-wrapping of high-reliability electrical connections; German version EN 50389:2005
  • DIN EN 16602-70-26:2019-07 Space product assurance - Crimping of high-reliability electrical connections; English version EN 16602-70-26:2019
  • DIN EN 16602-70-26 E:2018 Draft Document - Space product assurance - Crimping of high-reliability electrical connections; English version prEN 16602-70-26:2017
  • DIN EN 16602-70-26 E:2014-01 Space product assurance - Crimping of high-reliability electrical connections
  • DIN EN 16602-70-30 E:2014 Draft Document - Space product assurance - Wire wrapping of high-reliability electrical connections; English version FprEN 16602-70-30:2013
  • DIN EN 16602-70-30 E:2014-01 Space product assurance - Wire wrapping of high-reliability electrical connections
  • DIN EN 16602-70-26 E:2018-01 Space product assurance - Crimping of high-reliability electrical connections
  • DIN EN 50390:2005-02 Space product assurance - The manual soldering of high-reliability electrical connections; German version EN 50390:2004
  • DIN EN 50390:2005 Space product assurance - The manual soldering of high-reliability electrical connections; German version EN 50390:2004
  • DIN EN 16602-70-08 E:2014 Draft Document - Space product assurance - Manual soldering of high-reliability electrical connections; English version FprEN 16602-70-08:2014
  • DIN EN 16602-70-08 E:2014-09 Space product assurance - Manual soldering of high-reliability electrical connections
  • DIN EN 50389:2006-05 Space product assurance - Wire-wrapping of high-reliability electrical connections; German version EN 50389:2005

Lithuanian Standards Office

  • LST EN 16602-70-30-2014 Space product assurance - Wire wrapping of high-reliability electrical connections
  • LST EN 50389-2005 Space product assurance - Wire-wrapping of high-reliability electrical connections
  • LST EN 50390-2004 Space product assurance. The manual soldering of high-reliability electrical connections

Comitato Elettrotecnico Italiano

  • CEI EN 50389:2006 Space product assurance - Wire-wrapping of high-reliability electrical connections
  • CEI UNI EN 16602-70-26:2019 Space product assurance - Crimping of high-reliability electrical connections
  • CEI EN 50390:2005 Space product assurance - The manual soldering of high-reliability electrical connections

Spanish Association for Standardization (UNE)

  • UNE-EN 16602-70-30:2014 Space product assurance - Wire wrapping of high-reliability electrical connections (Endorsed by AENOR in December of 2014.)
  • UNE-EN 50390:2004 Space product assurance - The manual soldering of high-reliability electrical connections (Endorsed by AENOR in October of 2004.)
  • UNE-EN 16602-70-08:2015 Space product assurance - Manual soldering of high-reliability electrical connections (Endorsed by AENOR in March of 2015.)

Association Francaise de Normalisation

Swedish Institute for Standards

  • SS-EN 16602-70-26:2019 Space product assurance - Crimping of high-reliability electrical connections
  • SS-EN 16602-70-26:2014 Space product assurance - Crimping of high-reliability electrical connections
  • SS-EN 16602-70-08:2015 Space product assurance - Manual soldering of high-reliability electrical connections
  • SS-EN 50390:2005 Space product assurance - The manual soldering of high-reliability electrical connections

International Organization for Standardization (ISO)

  • ISO 7385:1983 Nuclear power plants; Guidelines to ensure quality of collected data on reliability

National Association of Corrosion Engineers (NACE)

Gosstandart of Russia

  • GOST R 59191-2020 Integrated logistic support of military products. Reliability-centered maintenance planning. General provisions

CEPT - Conference Europeenne des Administrations des Postes et des Telecommunications

U.S. Military Regulations and Norms

  • ARMY MIL-PRF-55365 H NOTICE 2-2012 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR