time of flight mass spectrometer
time of flight mass spectrometer, Total:10 items.
The international standard classification for "time of flight mass spectrometer" includes: Chemical reagents , Chemical analysis , Laboratory medicine .
The Chinese standard classification for "time of flight mass spectrometer" includes: Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Medical laboratory equipment .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37849-2019 Method of performance testing for liquid chromatography tandem time of flight mass spectrometry
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
国家药监局
- YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer
Group Standards of the People's Republic of China
- T/CITS RM0007-2024 Series CRMs of Oligonucleotide Molecular Mass for Time-of-Flight Mass Spectrometer
International Organization for Standardization (ISO)
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GSO
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
British Standards Institution (BSI)
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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