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Database: 365,228(8 Aug 2026)

Oscillator

Oscillator, Total:290 items.

The international standard classification for "Oscillator" includes: Power stations in general , Environmental testing , Piezoelectric and dielectric devices .

The Chinese standard classification for "Oscillator" includes: Electric power testing technique , Basic laboratory equipment , Quartz crystal and piezoelectric element , Office supplies and office implements , Medical laboratory equipment , Technical management , Technical management , Technical management , Time and Frequency Measurement , Electromagnetic Measurement .


Taiwan Provincial Standard of the People's Republic of China

  • CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)
  • CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)

Professional Standard - Electricity

  • DL/T 849.5-2019 General technical specification of test instruments used for power equipments Part 5: Oscillating wave high voltage generator
  • DL/T 849.5-2004 General technical specification of test instruments used for power equipments Part 5: Oscillating wave high voltage generator

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB 12274-1990 Quartz orystal controlled oscillators-Generic specification
  • GB/T 12274-1990 Quartz crystal controlled oscillators--Generic specification for
  • GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment-Part 13:Shakers,shaking water baths and shaking incubators

Professional Standard - Education

工业和信息化部

Professional Standard - Nuclear Industry

Professional Standard - Medicine

Professional Standard - Electron

Military Standard of the People's Republic of China-General Armament Department

National Metrological Verification Regulations of the People's Republic of China

National Metrological Technical Specifications of the People's Republic of China

  • JJF(机械)1013-2018 Calibration specification for impulse oscillating current interference tester
  • JJF(机械) 1013-2018 Calibration specification for impulse oscillating current interference tester
  • JJF(纺织)105-2023 Calibration Specification for Constant Temperature Water Bath Oscillator
  • JJF 1984-2022 Calibration Specification for Crystal Oscillators inside the Electrical Measurement Instruments
  • JJF 1982-2022 Calibration Specification for Level Oscillators
  • JJF(纺织) 105-2023 Calibration specifications for constant temperature water bath oscillators

工业和信息化部/国家能源局

Group Standards of the People's Republic of China

Professional Standard - Post and Telecommunication

Japanese Industrial Standards Committee (JISC)

  • JIS T 5504:2021 Dental rotary and oscillating instruments -- Shanks
  • JIS C 6701:1995 Quartz crystal units for oscillators
  • JIS C 6710:2021 Generic specification and test methods of oscillators
  • JIS K 6296-2:2023 Rubber -- Measurement of vulcanization characteristics using curemeters -- Part 2: Oscillating disc curemeter
  • JIS C 6710:1995 General rules of quartz crystal controlled oscillators

German Institute for Standardization

  • DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
  • DIN EN ISO 15212-1 Berichtigung 1:2009-07 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999, Corrigendum to DIN EN ISO 15212-1:1999-06; German version EN ISO 15212-1:1999/AC:2009
  • DIN EN ISO 15212-1:1999-06 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999
  • DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
  • DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
  • DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
  • DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN ISO 15212-2:2002-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002
  • DIN EN ISO 15212-2 Berichtigung 1:2009-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002, Corrigendum to DIN EN ISO 15212-2:2002-07; German version EN ISO 15212-2:2002/AC:2009
  • DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN 4235-3:1978 Compacting of Concrete by Vibrating; Compacting by External Vibrators during the Manufacture of Precast Components
  • DIN EN 61338-2:2005-02 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
  • DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017
  • DIN EN 61338-2:2005 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004

KR-KS

  • KS B ISO 3159-2008 Timekeeping instruments-Wrist-chronometers with spring balance oscillator
  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 61338-2-2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C IEC 61338-2-2018(2023) Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications

RO-ASRO

  • STAS SR ISO 3159:1994 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
  • STAS 9294-1982 HUBBEH Measurement of vulcanisation characteristics with oscillating disc curemeter

British Standards Institution (BSI)

  • BS ISO 3159:2009 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
  • BS EN ISO 15212-1:1999(2009) Oscillation - typedensity meters — Part 1 : Laboratory instruments
  • BS ISO 3159:2010 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
  • BS ISO 6502-2:2018 Rubber. Measurement of vulcanization characteristics using curemeters. Oscillating disc curemeter
  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
  • BS EN ISO 15212-2:2002 Oscillation-type density meters — Part 2: Process instruments for homogenous liquids
  • BS EN 61338-2:2004 Waveguide type dielectric resonators - Guidelines for oscillator and filter applications

Association Francaise de Normalisation

  • NF EN ISO 15212-1:1999 Oscillating density meters - Part 1: laboratory instruments
  • NF T43-015:2009 Rubber - Measurement of vulcanization characteristics with the oscillating disc curemeter.
  • NF EN ISO 15212-2:2002 Densimètres à oscillation - Partie 2 : instruments industriels pour liquides homogènes
  • NF EN 60679-6:2011 Quality assured crystal driven oscillators - Part 6: Phase jitter measurement method for crystal oscillators and SAW oscillators - Application guidelines
  • NF B35-212-2*NF EN ISO 15212-2:2002 Oscillation-type density meters - Part 2 : process instruments for homogeneous liquids
  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF ISO 6502-2:2018 Rubber - Measuring vulcanization characteristics using rheometers - Part 2: oscillating disk rheometer
  • NF T46-017-2*NF ISO 6502-2:2018 Rubber - Measurement of vulcanization characteristics using curemeters - Part 2 : oscillating disc curemeter
  • NF T43-015:1996 Rubber - Measurement of vulcanization characteristics with the oscillating curemeter.
  • NF C96-627-2*NF EN 61338-2:2004 Waveguide type dielectric resonators - Part 2 : guidelines for oscillator and filter applications
  • NF EN 61338-2:2004 Résonateurs diélectriques à modes guidés - Partie 2 : guide pour l'application aux filtres et aux oscillateurs
  • NF EN ISO 1797:2017 Médecine bucco-dentaire - Queues pour instruments rotatifs et oscillants

Korean Agency for Technology and Standards (KATS)

  • KS B ISO 3159-2013 Timekeeping instruments-Wrist-chronometers with spring balance oscillator
  • KS B ISO 15212-1:2006 Oscillation-type density meters-Part 1:Laboratory instruments
  • KS B ISO 15212-1-2006(2021) Oscillation-type density meters-Part 1:Laboratory instruments
  • KS B ISO 15212-1-2006(2016) Oscillation-type density meters-Part 1:Laboratory instruments
  • KS B ISO 15212-1-2021 Oscillation-type density meters-Part 1:Laboratory instruments
  • KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
  • KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS B ISO 15212-2:2006 Oscillation-type density meters-Part 2:Process instruments for homogeneous liquids
  • KS C 6503-1984 Quartz crystal units for oscillators
  • KS M ISO 3417-2012(2022) Rubber-Measurement of vulcanization characteristics with the oscillating disc curemeter
  • KS C 6503-1999 Quartz crystal units for oscillators
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
  • KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
  • KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
  • KS C IEC 60122-2-1-2021 Quartz crystal units for frequency control and selection-Part 2:Guide to the use of quartz crystal units for frequency control and selection-Section one:Quartz crystal units for microprocessor clock supply
  • KS B ISO 15212-2-2006(2016) Oscillation-type density meters-Part 2:Process instruments for homogeneous liquids
  • KS C IEC 61338-2-2023 Waveguide Dielectric Resonators Part 2: Oscillator and Filter Application Guide
  • KS C IEC 61338-2:2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C 6504-1987 Ovens for Quartz Crystal Units

GSO

  • OS GSO ISO 3159:2007 TIMEKEEPING INSTRUMENTS WRIST-CHRONOMETERS WITH SPRING BALANCE OSCILLATOR
  • OS GSO ISO 15212-1:2007 OSCILLATION – TYPE DENSITY METERS — PART 1: LABORATORY INSTRUMENTS
  • BH GSO ISO 3417:2016 Rubber -- Measurement of vulcanization characteristics with the oscillating disc curemeter
  • OS GSO ISO 3417:2015 Rubber -- Measurement of vulcanization characteristics with the oscillating disc curemeter
  • GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • BH GSO IEC 60679-2:2016 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • GSO ISO 3417:2015 Rubber -- Measurement of vulcanization characteristics with the oscillating disc curemeter
  • BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 61338-2:2014 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • BH GSO IEC 61338-2:2016 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • GSO IEC 61338-2:2014 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Danish Standards Foundation

  • DS/EN ISO 15212-1/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments
  • DS/EN ISO 15212-1:1999 Oscillation-type density meters - Part 1: Laboratory instruments
  • DS/EN ISO 15212-2/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
  • DS/EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

European Committee for Standardization (CEN)

  • EN ISO 15212-1:1999 Oscillation-Type Density Meters - Part 1: Laboratory Instruments
  • EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids (ISO 15212-2:2002)
  • EN ISO 15212-1:1999/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)

International Organization for Standardization (ISO)

  • ISO 15212-1:1998 Oscillation-type density meters - Part 1: Laboratory instruments
  • ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids
  • ISO 3159:2009 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
  • ISO 3159:1976 Timekeeping instruments; Wrist-chronometers with spring balance oscillator
  • ISO/DIS 6502-2:2024 Rubber-Measurement of vulcanization characteristics using curemeters-Part 2: Oscillating disc curemeter
  • ISO 15212-1:1998/cor 1:2008 Oscillation-type density meters - Part 1: Laboratory instruments; Technical Corrigendum 1

International Electrotechnical Commission (IEC)

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

SCC

  • DANSK DS/EN ISO 15212-1:1999 Oscillation-type density meters - Part 1: Laboratory instruments
  • IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • MIL MIL-O-52374E-2013 Oscillator: High Voltage General Specification for
  • BS 2271-3:1965 Specification for quartz oscillator crystal units-Guide to the use of quartz oscillator crystals
  • MIL MIL-O-14850-1969 OSCILLATOR, HIGH VOLTAGE, 10549785
  • DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • IEC 60122-2:1962/AMD1:1969 Amendment 1 - Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NS-EN ISO 15212-1:1999 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998)
  • MIL MIL-PRF-55310/33-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310F-2018 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
  • MIL MIL-PRF-55310/33D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/34-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • BS DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality-Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • MIL MIL-PRF-55310/33C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/20F-2012 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 40.0 KHz through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/38-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/30E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/13J-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/11G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/15G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/41-2018 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 125 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/21F-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/16K-2017 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/19E-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/8J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 50 Hz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/18F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 15.0 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/34D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/13H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/9J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 400 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/16J-2008 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/12H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/30D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/28D-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/21G-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/29C-2011 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.2 MHz Through 85 MHz, Hermetic Seal, Square Wave, HCMOS
  • MIL MIL-PRF-55310/26D-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 10kHz Through 65 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/34B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • AWWA C713-2019 Cold-Water Meters - Fluidic-Oscillator Type
  • 08/30191168 DC BS EN 60679-6. Quartz crystal controlled oscillators of assessed quality. Part 6. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • MIL MIL-PRF-55310/30C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHZ through 100 MHZ, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/10J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/34C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/36A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/39A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/14H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.1 Hz Through 25 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/28C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/39-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/35A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/40C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/35-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/36B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/21H-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/38C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/36C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/40A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/39B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/35C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/40B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • DANSK DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • AWWA C713-2005 Cold-Water Meters: Fluidic-Oscillator Type
  • MIL MIL-O-52374D-2006 OSCILLATOR: HIGH VOLTAGE GENERAL SPECIFICATION FOR(SUPERSEDING MIL-O-52374C)
  • MIL MIL-PRF-55310/27E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/40-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • DIN EN 60679-6 E:2009 Draft Document - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide (IEC 49/811/CDV:2008); German version FprEN 60679-6:2008
  • CEI EN 61338-2:2006 Waveguide type dielectric resonators Part 2: Guidelines for oscillator and filter applications
  • MIL MIL-PRF-55310/31A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.75 MHz Through 200 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/32C-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/39C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/36-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • MIL MIL-PRF-55310/35B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/27C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ through 85 MHZ, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/17F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), Gated, 250 kHz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/27D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/32-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
  • MIL MIL-PRF-55310/32B-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/31-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS

U.S. Military Regulations and Norms

SE-SIS

VN-TCVN

  • TCVN 6094-2010 Rubber.Measurement of vulcanization characteristics with the oscillating disc curemeter

United States Navy

Military Standards (MIL-STD)

TR-TSE

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 15212-2:2002/AC:2010 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
  • UNE 53629:1989 RUBBER. MEASUREMENT OF VULCANIZATION CHARACTERISTICS WITH THE OSCILLATING DISC CUREMETER
  • UNE-EN ISO 15212-1:1999 OSCILLATION-TYPE DENSITY METERS. PART 1: LABORATORY INSTRUMENTS (ISO 15212-1:1999)
  • UNE-EN 61338-2:2004 Waveguide type dielectric resonators -- Part 2: Guidelines for oscillator and filter applications (Endorsed by AENOR in November of 2004.)
  • UNE-EN ISO 15212-1:1999/AC:2010 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
  • UNE-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
  • UNE-EN ISO 15212-2:2003 Osscilation-type density meters. Part 2: Process instruments for homogenous liquids. (ISO 15212-2:2002)

IEC - International Electrotechnical Commission

  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

CENELEC - European Committee for Electrotechnical Standardization

  • EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Lithuanian Standards Office

  • LST EN ISO 15212-1:2000 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998)
  • LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
  • LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators
  • LST EN ISO 15212-1:2000/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)

American National Standards Institute (ANSI)

Institute of Electrical and Electronics Engineers (IEEE)

  • IEEE P1871.1/D4, April 2014 IEEE Draft Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments Such as Waveform Generators, Digitizers, External Oscillators, and Up & Down Converters
  • IEEE Std 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

Defense Logistics Agency

RU-GOST R

American Water Works Association (AWWA)

PL-PKN