Two methods of spectrum analyzer
Two methods of spectrum analyzer, Total:270 items.
The international standard classification for "Two methods of spectrum analyzer" includes: Nickel, chromium and their alloys , Other non-ferrous metals and their alloys , Analytical chemistry in general , Aluminium and aluminium alloys , Chemical analysis , Optics and optical measurements , Non-ferrous metals , Copper and copper alloys , Other iron and steel products .
The Chinese standard classification for "Two methods of spectrum analyzer" includes: Heavy metals and their alloys analysis method , Rare metals and their alloys analysis method , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Organic chemicals in general , Technical Management , Optical Measurement , chromatograph , Ionizating Radiation Measurement , Beneficiation reagent .
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
- GB/T 16599-1996 Methods for emission spectrum analysis of molybdenum
- GB/T 16600-1996 Methods for emission spectrum analysis of tungsten
- GB/T 5123-1985 Nickel-Method of spectral analysis
- GB/T 5871-1986 Method for spectrographic analysis of aluminium and its alloys
- GB/T 11170-1989 Method for photoelectric emission spectroscopic analysis of stainless steel
- GB/T 11462-1989 Test methods of spectrum analyzers
- GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
- GB/T 6040-2019 General rules for infrared analysis
- GB/T 6040-2002 General rules for infrared analysis
Professional Standard - Electron
- SJ/Z 1544-1979 Method for spectral analysis of Nickel- Tungsten-Magnesium alloy
- SJ 2657-1986 Mothod of molybdeuum spectral analysis
- SJ 2656-1986 Method for defermination of Tungsten by spectrometry
National Metrological Verification Regulations of the People's Republic of China
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
- JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
- JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
Professional Standard - Non-ferrous Metal
- YS/T 631-2007 Methods for analysis of zinc-the optical emission spectrometry
- YS/T 559-2009 Methods for emission spectrum analysis of tungsten
- YS/T 559-2025 Methods for emission spectrum analysis of tungsten
- YS/T 558-2006 Methods for emission spectrum analysis of molybdenum
- YS/T 559-2006 Tungsten Emission Spectroscopy Analysis Method
- YS/T 558-2009 Methods for emission spectrum analysis of molybdenum
Professional Standard - Education
- JY/T 002-1996 General rules for laser raman spectrum analysis
- JY/T 0572-2020 General rules for analytical methods for circular dichroism spectroscopy
- JY/T 0571-2020 General rules for fluorescence spectrometry
- JY/T 0573-2020 General rules for laser Ramanspectrum analysis
- JY/T 0566-2020 General rules for atomic fluorescence spectrometry
Shanxi Provincial Standard of the People's Republic of China
- DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
Professional Standard - Ferrous Metallurgy
- YB/T 4177-2008 Determination of chemical composition in slag by X-ray fluorescence spectrometry
International Electrotechnical Commission (IEC)
- IEC 62129:2006 Calibration of optical spectrum analyzers
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
- IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
Korean Agency for Technology and Standards (KATS)
- KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
- KS C 6918-1995(2024) Test methods of fiber-optic spectrum analyzer
- KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2022 Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS D 2558-1995 Method for emission spectrographic analysis of tantalum
- KS D 1653-1991 Method of spectrochemica analysis
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D 2569-2021 Methods for ICP emission spectrometric analysis of tantalum
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS D 2569-2016(2021) Methods for ICP emission spectrometric analysis of tantalum
- KS D 1655-2024 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 2569-2005 Methods for ICP emission spectrometric analysis of tantalum
- KS D 2569-2016 Methods for ICP emission spectrometric analysis of tantalum
- KS C IEC 61290-3-1:2005 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS D 2518-2015 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 1655-2019 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 2086-2019(2024) Methods for atomic emission spectrometric analysis of titanium
- KS D 2086-1993 Methods for emission spectrochemical analysis of titanium
- KS D 1684-2008(2018) Methods for emission spectrographic analysis of magnesium ingot
- KS D 2086-2019 Methods for atomic emission spectrometric analysis of titanium
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS D 2086-2024 Methods for atomic emission spectrometric analysis of titanium
- KS D 1686-2021 Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS C IEC 61290-3-2-2020 Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D 1684-1985 Methods for emission spectrographic analysis of magnesium ingot
- KS D 1655-2008(2024) Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1682-1993 Methods for emission spectrochemical analysis of lead ingot
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS D 1684-1993 Methods for emission spectrographic analysis of magnesium ingot
- KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS C IEC 61290-10-1-2020 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2-2005(2020) Optical amplifiers - Test methods - Part 10 - 2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- KS D 1683-1993 Method for emission spectrochemical analysis of silver ingot
- KS C IEC 61290-10-2-2020 Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS D 1682-2008 Methods for emission spectrochemical analysis of lead ingot
- KS D 2553-2015(2020) Tantalum-Method for atomic absorption spectrometric analysis
- KS D 1682-2020 Method for photoelectric emission spectrochemical analysis of lead metal
Japanese Industrial Standards Committee (JISC)
- JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
- JIS C 6183-2:2018 Optical spectrum analyzers -- Part 2: Calibration method
- JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS H 1691:1968 Method for spectrochemical analysis of tantalum
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
- JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
- JIS C 6122-10-1:2020 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS H 1322:1976 Method for emission spectrochemical analysis of magnesium ingot
- JSA JIS H 1183 AMD 1-2012 Emission Spectrochemical Analysis Method for Silver Ingots
- JIS H 1113:2022 Method for photoelectric emission spectrochemical analysis of zinc metal
- JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
- JIS H 1163:1991 Method for photoelectric emission spectrochemical analysis of cadmium metal
International Organization for Standardization (ISO)
- ISO 6955:1982 Analytical spectroscopic methods; Flame emission, atomic absorption, and atomic fluorescence; Vocabulary Bilingual edition
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
Bureau of Indian Standards
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
- IS 7658-1975 Spectral analysis method of aluminum
- IS 2271-1967 Recommended methods for platinum spectroscopic analysis
- IS 11035-1984 Spectral analysis method for processing aluminum alloys
British Standards Institution (BSI)
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BS EN 61290-1-3:1998 Optical fibre amplifiers. Basic spectrum analyzers-Optical power meter
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
Comitato Elettrotecnico Italiano
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
- CEI EN 61290-10-1:2010 Optical amplifiers- Test methods Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- CEI EN 61290-3-2:2010 Optical amplifier test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- CEI EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
Swedish Institute for Standards
- SS-EN 62129:2006 Calibration of optical spectrum analyzers
- SS-EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SS-EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- SS-EN IEC 61290-1-1:2021 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- SS-EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- SS-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- SS-EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- DANSK DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- DANSK DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DANSK DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
Association of German Mechanical Engineers
- VDI VDE DGQ DKD 2622 Blatt-11 E:2019-11 Calibration of spectrum analyzers
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
Association Francaise de Normalisation
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF V18-802:2016 Animal feeding stuffs - Determination of carotenoids following two methods (HPLC-visible and spectrometry)
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: reflectance parameters - Electrical spectrum analyzer method
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: multiple channel parameters - Pulse method using optical switch and optical spectrum analyzer
- NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2: noise figure parameters - Electrical spectral analyzer method
- NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: multiple channel parameters - Pulse method using a stroboscopic optical spectrum analyzer
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: multiple channel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
South African Bureau of Standard
- SANS 62129:2008 Calibration of optical spectrum analyzers
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
Gosstandart of Russia
- GOST 12228.1-1978 Ruthenium. Method of spectral analysis
- GOST 15483.10-2004 Tin. Methods of atomic-emission spectral analysis
- GOST 17261-1977 Zinc. Spectral method of analysis
- GOST 15483.10-1978 Tin. Spectral methods for determination of bismuth, iron, copper, arsenic, lead, antimony, zinc and aluminium
- GOST 12552.2-1977 Platinum-nickel alloys. Method of spectral of analysis
German Institute for Standardization
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
- DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
- DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
- DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
- DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
- DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-10-2:2014 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- OS GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- OS GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-2:2016 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- BH GSO IEC 61290-10-1:2016 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BH GSO IEC 61290-5-2:2016 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Spanish Association for Standardization (UNE)
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
- UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
- UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
- UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
- UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
- UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
GCC Standardization Organization
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- GSO IEC 61290-3-2:2014 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- GSO ASTM E1490:2021 Standard Guide for Two Sensory Descriptive Analysis Approaches for Skin Creams and Lotions
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
- EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
- EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
Lithuanian Standards Office
- LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
- LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
- LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
Indonesia Standards
- SNI 07-1174-1989 Aluminium dan paduan aluminium, Cara uji komposisi kimia dengan spektrofotometer emisi fotometer
American Society for Testing and Materials (ASTM)
- ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
- ASTM E718-80 Method for Spectrographic Analysis of Cartridge Brass
- ASTM RR-D03-2000 2023 D7941/D7941M-Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
- ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
- ASTM E51-67(1978) Spectral analysis method of tin alloy
- ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
- ASTM E1490-92(1997) Standard Practice for Descriptive Skinfeel Analysis of Creams and Lotions
- ASTM E1490-19 Standard Guide for Two Sensory Descriptive Analysis Approaches for Skin Creams and Lotions
- ASTM E2040-25 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
- ASTM E2040-19 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
- ASTM C1221-92(1998) Standard Test Method for Nondestructive Analysis of Special Nuclear Materials in Homogeneous Solutions by Gamma-Ray Spectrometry
American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE)
- ASHRAE AB-10-012-2010 A Comparative Analysis and Validation of Two DX Cooling Coil Modeling Methods
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
European Telecommunications Standards Institute (ETSI)
- ETSI TR 103 977 V1.1.1 (2024-04)-2024 RFID Measurement methods for transmit spectrum using modern spectrum analysers
Czech Standards Institute (UNMZ)
- CSN 42 0600 Cast.2-1975 Antimony of high purity. Methods of chemical and spectral analysis. Preparation of the sample
- CSN 42 0600 Cast.3-1975 Antimony of high parity. Methods of chemical and spectral analysis. Delermmation of arsenic by photomotric metod
Two Methods of Thermal Analyzers,Two methods of thermogravimetric analyzer,Two methods of infrared spectrometer,Two Methods of Atomic Fluorescence Spectroscopy,Two methods of Raman spectroscopy,Spectrum Analyzer Test Method,Two methods of spectrometer,Two Methods of Infrared Spectroscopy,Two Methods of Fluorescence Spectroscopy,Two Methods of Atomic Fluorescence Spectroscopy,Two Methods of Fourier Transform Infrared Spectroscopy,Two Methods of Fourier Transform Infrared Spectroscopy,Two Methods of Purity Analyzers,Two methods of spectrum analyzer