high magnification electron microscope

high magnification electron microscope, Total:85 items.

The international standard classification for "high magnification electron microscope" includes: Optical equipment , Chemical analysis .

The Chinese standard classification for "high magnification electron microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Basic standards and general methods .

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Professional Standard - Machinery

JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5383-1991 Specification for Transmission Electron Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 13-1992 Verification Regulations for High Temperature Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Japanese Industrial Standards Committee (JISC)

JIS B 7254:2007 Microscopes -- Magnification
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy

British Standards Institution (BSI)

BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
BS ISO 8039:2014 Microscopes. Values, tolerances and symbols for magnification
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
11/30228188 DC BS ISO 8039. Microscopes. Values, tolerances and symbols for magnification
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction

Korean Agency for Technology and Standards (KATS)

KS B ISO 8039-2021 Microscopes — Values, tolerances and symbols for magnification
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 8039:2015 Microscopes -- Values, tolerances and symbols for magnification
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 8039:2016 Microscopes -- Values, tolerances and symbols for magnification
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy

GCC Standardization Organization

GSO ISO 8039:2015 Microscopes -- Values, tolerances and symbols for magnification
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire

German Institute for Standardization

DIN ISO 8039:2001 Optics and optical instruments - Microscopes - Magnification (ISO 8039:1997)

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)