reflectance spectrum peak

reflectance spectrum peak, Total:98 items.

The international standard classification for "reflectance spectrum peak" includes: Optics and optical measurements in general , Astronomy. Geodesy. Geography , Chemical analysis , Testing of metals , Semiconducting materials , Glass products , Other standards related to optics and optical measurements .

The Chinese standard classification for "reflectance spectrum peak" includes: Optical instrument in general , Mapping in general , Basic standards and general methods , Semimetal and semiconductor material analysis method , Semimetal and semiconductor material in general , Metal physical property test method , Optical Measurement , Industrial technical glass , Semiconductor emitting device , Electron optics and other physical optics instrument .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
GB/T 36540-2018(英文版) VIS SWIR spectral reflectivity measurement of water
GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
GB/T 33988-2017(英文版) VIS SWIR spectral reflectivity measurement of urban surface features
GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
GB/T 36540-2018 VIS-SWIR spectral reflectivity measurement of water
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 26828-2011 Specification for multispectral antireflection coatings

National Metrological Technical Specifications of the People's Republic of China

JJF(建材) 160-2019 Calibration specification for photothermal mirror reflectance measuring instrument
JJF 1601-2016 Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction
JJF 1335-1990 ~

Shandong Provincial Standard of the People's Republic of China

DB37/T 2189-2012 Technical regulations for detection of canopy reflectance spectroscopy in apple flowering period
DB37/T 2188-2012 Technical Regulations for Determination of Apple Blossom Reflection Spectroscopy

Military Standard of the People's Republic of China-General Armament Department

GJB 10134-2021 Test method for spectral reflectance of camouflage fabrics

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33234-2016 Reflectance test method of reflective glass mirror for concentrated solar power system
GB/T 33988-2017 VIS-SWIR spectral reflectivity measurement of urban surface features

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Professional Standard - Electron

SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width

Taiwan Provincial Standard of the People's Republic of China

CNS 14340-1999 Optical time domain reflectometer

National Metrological Verification Regulations of the People's Republic of China

JJG 768-2005 Verification Regulation of Emission Spectrometer
JJG 959-2024 Optical time domain reflectometry

Tianjin Provincial Standard of the People's Republic of China

DB12/T 955-2020 Determination of Nitrogen and Phosphorus in Dairy Farm Dung Water by Near Infrared Diffuse Reflectance Spectrometry

未注明发布机构

ASTM RR-F01-1012 1996 F1526-Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy
ANSI/IES LM-20-20 PHOTOMETRY OF REFLECTOR TYPE LAMPS

Group Standards of the People's Republic of China

T/ZZB 0305-2018 Anti-reflective coating photovoltaic glass

Professional Standard - Machinery

JB/T 11145-2011 X-ray fluorescence spectrometer

American Society for Testing and Materials (ASTM)

ASTM E573-01(2021) Standard Practices for Internal Reflection Spectroscopy
ASTM E573-96 Standard Practices for Internal Reflection Spectroscopy
ASTM E573-01(2007) Standard Practices for Internal Reflection Spectroscopy
ASTM E573-01 Standard Practices for Internal Reflection Spectroscopy
ASTM E573-01(2013) Standard Practices for Internal Reflection Spectroscopy

ZA-SANS

SANS 513:2005 Retro-reflectors (reflex reflectors)
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

Japanese Industrial Standards Committee (JISC)

JIS C 7525:1992 Reflector lamps
JIS R 1698:2015 Measurement of spectral reflectance of fine ceramics thin films under humid condition

British Standards Institution (BSI)

BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
BS EN 61746-1:2011 Calibration of optical time-domain reflectometers (OTDR). OTDR for single-mode fibres
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
24/30388083 DC BS EN ISO 23698 Cosmetics - Measurement of the sunscreen efficacy by diffuse reflectance spectroscopy

SCC

ASTM D986-50 Method of Preparation of a Magnesium Oxide Standard for Spectral Reflectivity
VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
CAN 2-12.10-M76-1976 Glass, Light and Heat Reflecting
DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
CIE 250:2022 Spectroradiometric measurement of optical radiation sources
CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy
VDI/VDE 5575 BLATT 6:2018 X-ray optical systems — reflection zone plates

GSO

BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO IEC/TR 62316:2014 Guidance for the interpretation of OTDR backscattering traces
GSO IEC 61290-5-1:2014 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
GSO IEC 61746-1:2015 Calibration of optical time-domain reflectometers (OTDR) - Part 1: OTDR for single mode fibres

Korean Agency for Technology and Standards (KATS)

KS L 2014-2010 Solar reflective glass
KS C 7515-2003 Reflector lamps
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
KS C IEC 61746:2013 Calibration of optical time-domain reflectometers(OTDR)
KS C IEC 61746:2009 Calibration of optical time-domain reflectometers(OTDR)
KS A 3505-2010 Retroreflective safety signs
KS A 3505-1987 Retroreflective safety signs
KS C IEC 61290-5-1-2022 Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method

International Organization for Standardization (ISO)

ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO/CD 23698 Cosmetics Sun protection test methods- Measurement of the Sunscreen Efficacy by Diffuse Reflectance Spectroscopy
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results

Association Francaise de Normalisation

NF P98-527:1991 Road traffic signs. Retroreflective coatings. Method of measuring coefficient of retroreflection using A portable retroreflectometer.
NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
NF C93-804-1*NF EN 61746-1:2014 Calibration of optical time-domain reflectometers (OTDR) - Part 1 : OTDR for single-mode fibres
NF S10-114*NF EN ISO 13697:2006 Optics and phonotics - Lasers and laser-related equipment - Test methods for specular reflectance and transmittance of optical laser components.
NF C93-805-5-1*NF EN 61290-5-1:2006 Optical amplifier test methods - Part 5-1 : reflectance parameters - Optical spectrum analyser method
NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
VDI/VDE 5575 Blatt 6-2009 Roentgenoptische Systeme - Reflexionszonenplatten
VDI/VDE 5575 BLATT 6-2017 Roentgenoptische Systeme - Reflexionszonenplatten
VDI/VDE 5575 BLATT 6-2018 X-ray optical systems - Reflexion zone plates

German Institute for Standardization

DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN ISO 23698:2024-03 Cosmetics - Measurement of the sunscreen efficacy by diffuse reflectance spectroscopy (ISO/DIS 23698:2024); German and English version prEN ISO 23698:2024 / Note: Date of issue 2024-01-26
DIN EN ISO 23698:2024 Cosmetics - Measurement of the sunscreen efficacy by diffuse reflectance spectroscopy (ISO/DIS 23698:2024); German and English version prEN ISO 23698:2024
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 6-2011 X-ray optical systems - Reflection zone plates

International Electrotechnical Commission (IEC)

IEC 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyser method
IEC 61746-1:2009 Calibration of optical time-domain reflectometers (OTDR) - Part 1: OTDR for single-mode fibres
IEC 61746-2:2010 Calibration of optical time-domain reflectometers (OTDR) - Part 2: OTDR for multimode fibres

European Committee for Standardization (CEN)

prEN ISO 23698 Cosmetics - Measurement of the sunscreen efficacy by diffuse reflectance spectroscopy (ISO/DIS 23698:2024)

Danish Standards Foundation

DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method

HU-MSZT

MNOSZ 21405-1955 Impurity-free, reflective glass

CZ-CSN

CSN EN 61746 ZZ1-2005 Calibration of optical time domain reflectometer