Sheet measurement
Sheet measurement, Total:17 items.
The international standard classification for "Sheet measurement" includes: Films and sheets .
The Chinese standard classification for "Sheet measurement" includes: Basic standards and general methods for synthetic resin and plastic .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6673-2001 Determination of Length and Width of Plastics Film and Sheeting
- GB/T 20220-2006 Plastics - Film and sheeting - Determination of average thickness of a sample, and average thickness and yield of a roll, by gravimetric techniques (gravimetric thickness)
- GB/T 6672-2001 Plastics film and sheeting--Determination of thickness by mechanical scanning
未注明发布机构
- DIN EN 62276 E:2015-04 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Taiwan Provincial Standard of the People's Republic of China
- CNS 6499-1980 Mica Blocks, Thins, Films and Splittings - Measurement of Thickness
International Electrotechnical Commission (IEC)
- IEC 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods
- IEC 62276:2012 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
GSO
- GSO ISO 15989:2013 Plastics - Film and sheeting - Measurement of water-contact angle of corona-treated films
Korean Agency for Technology and Standards (KATS)
- KS C IEC 62276:2007 Single crystal wafers for surface acoustic wave(SAW) device applications－Specifications and measuring methods
British Standards Institution (BSI)
- BS EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
- BS EN 62276:2006 Single crystal wafers applied for surface acoustic wave (SAW) device applications - Specification and measuring methods
- BS EN 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
- BS 5806:1979 Method of measurement of thickness for mica blocks, thins, films and splittings
IN-BIS
- IS 9044-1979 Methods for measuring the thickness of mica blocks, flakes, films and mica flakes
ZA-SANS
- SANS 4593:2003 Plastics - Film and sheeting - Determination of thickness by mechanical scanning
CZ-CSN
- CSN 77 0520-1984 Determination of the volumes of thin sheet metal packages
Flake density,rubber sheet,ceramic sheet,Flake density,sheet extrusion,flakes,Sample flakes,foil,Specimen sheet,Thin slice detection,Thin slice measurement,nanoflakes,nanoflakes,Sheet Instruments,Flake equipment,Thin slice sample,Sheet measurement,Single Crystal Flakes,copper foil
