X-ray Spectroscopy
X-ray Spectroscopy, Total:11 items.
The international standard classification for "X-ray Spectroscopy" includes: Metrology and measurement in general , Aluminium and aluminium alloys .
The Chinese standard classification for "X-ray Spectroscopy" includes: Measurement in general , Light metals and their alloys analysis method .
Professional Standard - China Metal Association
- CSM 01010108-2006 Specification for Uncertainty Evaluation of X-ray Fluorescence Spectrometry Measurement Results
- CSM 01 01 01 08-2006 CSM 01 01 01 08-2006 Uncertainty assessment specification of measurement result of X-ray fluorescent spectrometry
Professional Standard - Non-ferrous Metal
- YS/T 806-2012 Chemical Analysis Method for Rare Earth in Aluminium and Aluminium Alloys - Determination of La, Ce, Pr, Nd, Sm Contents X-ray Fluorescence Spectrometric Method
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
International Organization for Standardization (ISO)
- ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
- ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Association Francaise de Normalisation
- NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
- NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
American Society for Testing and Materials (ASTM)
- ASTM B568-98(2021) Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry
British Standards Institution (BSI)
- BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
- BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
x-ray feature x-ray,Feature x-ray x-ray,x-ray copper ray,x-ray diffraction and x-rays,X-ray diffraction, X-ray fluorescence,radiofluorescence x-ray,x-ray fluorescence x-ray diffraction,X-ray principle,X-ray Absorption Spectroscopy Measurements,X-ray fluorescence + X-ray diffraction,Electron Dispersive X-ray Spectroscopy Measurements,small angle x-ray x-ray,fluorescent x-ray x-ray,X-ray Spectroscopy,x-ray fluorescence x-ray,x-ray x-ray imaging,x-ray applications x-ray applications,x-ray scatter,X-ray analysis,X-ray diffraction lines
