Integrated circuit incoming material inspection standards
Integrated circuit incoming material inspection standards, Total:192 items.
The international standard classification for "Integrated circuit incoming material inspection standards" includes: Aerospace electric equipment and systems , Integrated circuits. Microelectronics , IT applications in transport and trade , Electricity. Magnetism. Electrical and magnetic measurements .
The Chinese standard classification for "Integrated circuit incoming material inspection standards" includes: Microcircuit in general , Semiconductor integrated circuit , Technical Management , Electronic components , Film integrated circuit , Special electronic technology material , Computer application , Radio Measurement .
Professional Standard - Electron
- SJ/T 11512-2015 Test methods of electronic pastes for integrated circuit performent
- SJ 20237-1993 Verification regulation of model GH3123 IC automatic tester
- SJ/Z 11359-2006 Taxonomy of functional verification for integrated circuit IP core development and integration
- SJ/T 10455-1993 Copper conductor paste for thick film hybrid integrated circuits
- SJ 20802-2001 Visual inspection criteria for integrated circuits metal packages
- SJ/Z 11355-2006 Specification for integrated circuit IP/SoC functional verification
- SJ 20954-2006 Integrated circuits latch-up test
Professional Standard - Aerospace
- QJ 1995A-1998 Specification for Acceptance of Integrated Circuit
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 9178-1988 Terminology for integrated circuits
- GB/T 8976-1996 Generic specification for film integrated circuits and hybrid film integrated circuits
- GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
- GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
- GB/T 36479-2018 Integrated circuits—Test methods for column grid array
- GB/T 17574.20-2006 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- GB/T 43035-2023 Semiconductor devices—Integrated circuits—Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits—Section 1: Requirements for internal visual examination
- GB/T 12842-1991 Terminology for film integrated circuits and hybrid film integrated circuits
- GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
- GB/T 15138-1994 Case outlines for film integrated circuits and hybrid integrated circuits
- GB/T 11498-1989 Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
Group Standards of the People's Republic of China
- T/ICMTIA BS0029-2022 Classification and definition of IC material product maturity level
- T/CIET 478-2024 Integrated circuit material product quality grading requirements
- T/CEMIA 021-2019 Specification for resistance paste for thick film integrated circuits
- T/ICMTIA 5.3-2020 Lithography ArF Photo Resist of measurement for Intergraded circuits
- T/ICMTIA BS0030-2022 IC material product classification
- T/CIE 120-2021 Semiconductor Integrated Circuit Hardware Trojan Horse Detection Method
- T/QGCML 256-2022 Integrated circuit design engineering experiment box
- T/ICMTIA pc008-2021 Nitric acid for integrated circuits
- T/ICMTIA PM0010-2022 Epoxy Molding Compounds for Integrated Circuits
Military Standard of the People's Republic of China-General Armament Department
- GJB 9389-2018 Integrated circuit lock test method
- GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
- GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
- GJB/Z 42.1-1993 Military microcircuit series type spectrum semiconductor integrated circuit analog integrated circuit
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35005-2018 Test methods for flip chip integrated circuits
Professional Standard - Urban Construction
- CJ/T 243-2016 Testing of IC card for construction cause
- CJ/T 243-2007 Test methods for construction cause IC card
National Metrological Verification Regulations of the People's Republic of China
- JJG(电子) 31008-2006 Standard verification practice of parameters of hybrid integrated circuit
- JJG(电子) 04029-1989 J273B type linear integrated circuit test system verification regulations
- JJG(电子) 04042-1991 Verification regulations for GH3111/3111G integrated circuit tester
- JJG(电子) 04031-1989 9200 Large-Scale Integrated Circuit Test System Verification Regulations
- JJG(电子) 04039-1991 GH3112 Integrated Circuit Dynamic Logic Function Detector Verification Regulations
- JJG(电子) 04035-1989 GR1732M digital integrated circuit test system verification regulations
- JJG(电子) 04032-1989 BJ3122 (QL11) logic integrated circuit tester verification regulations
- JJG(电子) 310005-2006 Specification for verification of high temperature dynamic aging system of integrated circuit
- JJG 1015-2006 Verification Regulation of General Digital Integrated Circuit Testing System
- JJG(电子) 04034-1989 GR1731M type analog integrated circuit test system verification regulations
- JJG(电子) 04021-1989 Specification for verification of BJ3110 model MOS integrated circuit testers
- JJG(电子) 31001-2006 Specification for verification of testing system for integrated circuits' electrostatic discharge susceptibility
工业和信息化部
- SJ/T 10455-2020 Copper conductor paste for thick film hybrid integrated circuits
British Standards Institution (BSI)
- BS EN 165000-2:1996 Film and hybrid integrated circuits. Internal visual inspection and special tests
- BS IEC 63011-1:2018 Integrated circuits. Three dimensional integrated circuits - Terminology
- BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
- BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
- BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
- BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
- BS IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
- BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
- BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
- BS IEC 61523-4:2015 Design and Verification of Low-Power Integrated Circuits
- BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
- BS IEC 63011-3:2018 Integrated circuits. Three dimensional integrated circuits - Model and measurement conditions of through-silicon via
- BS EN 165000-5:1998 Film and hybrid integrated circuits - Procedure for qualification approval
- BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
- BS EN 60747-16-3:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Frequency converters
- BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
- BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
European Committee for Electrotechnical Standardization(CENELEC)
- EN 165000-2:1996 Film and Hybrid Integrated Circuits Part 2: Internal Visual Inspection and Special Tests
- EN 61943:1999 Integrated Circuits - Manufacturing Line Approval Application Guideline
- EN 165000-3:1996 Film and Hybrid Integrated Circuits Part 3: Self-Audit Checklist and Report for Film and Hybrid Integrated Circuit Manufacturers
Aeronautical Radio Inc.
- ARINC 610-1 ITEM 4.0 Integration of Future Avionics Equipment
German Institute for Standardization
- DIN 45941-11:1987 Harmonized system of quality assessment for electronic components; sectional specification: film and hybrid integrated circuits (capability approval)
- DIN EN 61943:2001 Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999
- DIN EN 165000-2:1996 Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests; German version EN 165000-2:1996
American Society for Testing and Materials (ASTM)
- ASTM F375-89(2005) Standard Specification for Integrated Circuit Lead Frame Material
- ASTM F375-89(2010) Standard Specification for Integrated Circuit Lead Frame Material
- ASTM F375-20 Standard Specification for Integrated Circuit Lead Frame Material
International Electrotechnical Commission (IEC)
- IEC 60748-20-1:1994 Semiconductor devices; integrated circuits; part 20: generic specification for film integrated circuits and hybrid film integrated circuits; section 1: requirements for internal visual examination
- IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
- IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
- IEC 60748-20:1988 Semiconductor devices - Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
- IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
- IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
- IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
- IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- IEC 61523-3:2004*IEEE 1497 Design and Verification of Low-Power Integrated Circuits
- IEC 61523-4:2015 Design and Verification of Low-Power Integrated Circuits
- IEC 61523-4:2015*IEEE Std 1801:2013 Design and Verification of Low-Power Integrated Circuits
- IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- IEC 60748-20:1988/AMD1:1995 Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
SCC
- BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
- BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
- BS 6493-2-2.4:1989 Semiconductor devices. Integrated circuits-Recommendations for interface integrated circuits
- DANSK DS/IEC 748-20:1989 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- 06/30153491 DC EN 60748-2-20. Semiconductor devices. Integrated circuits. Part 2-20. Digital integrated circuits. Family specification. Low voltage integrated circuits
- DANSK DS/EN 165000-2:1997 Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
- DANSK DS/IEC 748-2-6:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section six: Blank detail specification for microprocessor integrated circuits
PT-IPQ
- E 295-1974 Aggregate, used to build asphalt roads through infiltration
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60748-20-1-2019 Semiconductor devices — Integrated circuits — Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits — Section 1: Requirements for internal visual examination
- KS C IEC 63011-1:2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
- KS C IEC 60748-11-1-2020 Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- KS C IEC 60748-11-1:2004 Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- KS C IEC 60748-11-1-2004(2020) Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- KS C IEC 60748-2-20:2002 Semiconductor devices-Integrated circuits-Part 2-20:Digital integrated circuits-Family specification-Low voltage integrated circuits
- KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
- KS C IEC 60748-20:2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-20-1-2003(2019) Semiconductor devices — Integrated circuits — Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits — Section 1: Requirements for internal visual examination
- KS C IEC 60748-2-2001(2021) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-4-2004(2020) Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
- KS C 6063-1978(2001) GLOSSARY OF TERMS USED IN INTEGRATED CIRCUIT
- KS C IEC 60748-2:2001 Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-3:2002 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
- KS C IEC 60748-2-2001(2016) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-4-2020 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
- KS C IEC 60748-20-1:2003 Semiconductor devices-Integrated circuits-Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits-Section 1:Requirements for internal visual examination
- KS C IEC 60748-2-2021 Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-4:2004 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
- KS C IEC 60748-3-2022 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
- KS C IEC 60748-3-2002(2022) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
- KS C IEC 60748-3-2002(2017) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
- KS C IEC 60748-20:2003 Semiconductor devices-Integrated circuits-Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-3-1:2002 Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
- KS C IEC 60748-2-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-2-8:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 8:Blank detail specification for integrated circuits static read/write memories
- KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-5:2003 Semiconductor devices-Integrated circuits-Part 5:Semicustom integrated circuits
- KS C IEC 60748-2-3-2002(2022) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 3:Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
European Standard for Electrical and Electronic Components
- EN 163100:1991 Sectional specification: film and hybrid integrated circuits
- EN 163101:1991 Blank detail specification: film and hybrid integrated circuits
KR-KS
- KS C IEC 63011-1-2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
- KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
- KS C IEC 60748-20-2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-2-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
International Organization for Standardization (ISO)
- ISO/IEC 24727-5:2011 Identification cards - Integrated circuit card programming interfaces - Part 5: Testing procedures
RU-GOST R
- GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
- GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
- GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits
GSO
- GSO IEC 60748-11-1:2014 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- OS GSO IEC 60748-20-1:2014 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
- GSO IEC 60748-20-1:2014 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
- BH GSO IEC 60748-20-1:2016 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
- BH GSO IEC 60748-11-1:2016 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
- OS GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- OS GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- BH GSO IEC 60748-3:2016 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- OS GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- OS GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- BH GSO IEC 60748-20:2016 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
BR-ABNT
- ABNT MB-7-1939 Aggregate screening component detection
SE-SIS
- SIS SEN 01 03 62-1974 Integrated circuits. Analog circuits. Terminology
CZ-CSN
- CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
- CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
- CSN IEC 748-3:1994 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
- CSN 35 8720 Cast.2-1988 Integrated circuits. Dimensions
- CSN IEC 748-20:1993 Semiductors devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
Danish Standards Foundation
- DS/IEC 748-4:1993 Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits
- DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
- DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
- DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- DS/IEC 748-20:1990 Semiconductor devices. Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
- DS/IEC 748-3:1993 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
PL-PKN
- PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
- PN T01610-1972 Integra ted circuits Classification
- PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
RO-ASRO
- SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
- SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits
- STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TA-721 EPIC Epic
Association Francaise de Normalisation
- NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
- NF C96-037*NF EN 61943:2000 Integrated circuits - Manufacturing line approval application guideline.
Lithuanian Standards Office
- LST EN 165000-3-2001 Film and hybrid integrated circuits. Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
GB-REG
- REG NASA-LLIS-0434-1996 Lessons Learned ?Rusty Integrated Circuits (~1973)
HU-MSZT
- MSZ 7452-1961 Detecting soluble components in polystyrene to detect plastics
IECQ - IEC: Quality Assessment System for Electronic Components
- QC 763000-1994 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Intergrated Circuits and Hybrid Film Intergrated Circuits - Section 1: Requirements for Internal Visual Examination (IEC 748-20-1 ED 1)
IEC - International Electrotechnical Commission
- IEC 60748-2:1985 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits (Amendment 1-1991) (Amendment 2-1993) (Edition 1.0)