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Integrated circuit incoming material inspection standards

Integrated circuit incoming material inspection standards, Total:192 items.

The international standard classification for "Integrated circuit incoming material inspection standards" includes: Aerospace electric equipment and systems , Integrated circuits. Microelectronics , IT applications in transport and trade , Electricity. Magnetism. Electrical and magnetic measurements .

The Chinese standard classification for "Integrated circuit incoming material inspection standards" includes: Microcircuit in general , Semiconductor integrated circuit , Technical Management , Electronic components , Film integrated circuit , Special electronic technology material , Computer application , Radio Measurement .


Professional Standard - Electron

  • SJ/T 11512-2015 Test methods of electronic pastes for integrated circuit performent
  • SJ 20237-1993 Verification regulation of model GH3123 IC automatic tester
  • SJ/Z 11359-2006 Taxonomy of functional verification for integrated circuit IP core development and integration
  • SJ/T 10455-1993 Copper conductor paste for thick film hybrid integrated circuits
  • SJ 20802-2001 Visual inspection criteria for integrated circuits metal packages
  • SJ/Z 11355-2006 Specification for integrated circuit IP/SoC functional verification
  • SJ 20954-2006 Integrated circuits latch-up test

Professional Standard - Aerospace

  • QJ 1995A-1998 Specification for Acceptance of Integrated Circuit

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 9178-1988 Terminology for integrated circuits
  • GB/T 8976-1996 Generic specification for film integrated circuits and hybrid film integrated circuits
  • GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
  • GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
  • GB/T 36479-2018 Integrated circuits—Test methods for column grid array
  • GB/T 17574.20-2006 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
  • GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
  • GB/T 43035-2023 Semiconductor devices—Integrated circuits—Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits—Section 1: Requirements for internal visual examination
  • GB/T 12842-1991 Terminology for film integrated circuits and hybrid film integrated circuits
  • GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
  • GB/T 15138-1994 Case outlines for film integrated circuits and hybrid integrated circuits
  • GB/T 11498-1989 Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure

Group Standards of the People's Republic of China

Military Standard of the People's Republic of China-General Armament Department

  • GJB 9389-2018 Integrated circuit lock test method
  • GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
  • GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
  • GJB/Z 42.1-1993 Military microcircuit series type spectrum semiconductor integrated circuit analog integrated circuit

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Professional Standard - Urban Construction

National Metrological Verification Regulations of the People's Republic of China

工业和信息化部

  • SJ/T 10455-2020 Copper conductor paste for thick film hybrid integrated circuits

British Standards Institution (BSI)

  • BS EN 165000-2:1996 Film and hybrid integrated circuits. Internal visual inspection and special tests
  • BS IEC 63011-1:2018 Integrated circuits. Three dimensional integrated circuits - Terminology
  • BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
  • BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
  • BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
  • BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
  • BS IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
  • BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
  • BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
  • BS IEC 61523-4:2015 Design and Verification of Low-Power Integrated Circuits
  • BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
  • BS IEC 63011-3:2018 Integrated circuits. Three dimensional integrated circuits - Model and measurement conditions of through-silicon via
  • BS EN 165000-5:1998 Film and hybrid integrated circuits - Procedure for qualification approval
  • BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
  • BS EN 60747-16-3:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Frequency converters
  • BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 165000-2:1996 Film and Hybrid Integrated Circuits Part 2: Internal Visual Inspection and Special Tests
  • EN 61943:1999 Integrated Circuits - Manufacturing Line Approval Application Guideline
  • EN 165000-3:1996 Film and Hybrid Integrated Circuits Part 3: Self-Audit Checklist and Report for Film and Hybrid Integrated Circuit Manufacturers

Aeronautical Radio Inc.

German Institute for Standardization

  • DIN 45941-11:1987 Harmonized system of quality assessment for electronic components; sectional specification: film and hybrid integrated circuits (capability approval)
  • DIN EN 61943:2001 Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999
  • DIN EN 165000-2:1996 Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests; German version EN 165000-2:1996

American Society for Testing and Materials (ASTM)

  • ASTM F375-89(2005) Standard Specification for Integrated Circuit Lead Frame Material
  • ASTM F375-89(2010) Standard Specification for Integrated Circuit Lead Frame Material
  • ASTM F375-20 Standard Specification for Integrated Circuit Lead Frame Material

International Electrotechnical Commission (IEC)

  • IEC 60748-20-1:1994 Semiconductor devices; integrated circuits; part 20: generic specification for film integrated circuits and hybrid film integrated circuits; section 1: requirements for internal visual examination
  • IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
  • IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
  • IEC 60748-20:1988 Semiconductor devices - Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
  • IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
  • IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
  • IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
  • IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
  • IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • IEC 61523-3:2004*IEEE 1497 Design and Verification of Low-Power Integrated Circuits
  • IEC 61523-4:2015 Design and Verification of Low-Power Integrated Circuits
  • IEC 61523-4:2015*IEEE Std 1801:2013 Design and Verification of Low-Power Integrated Circuits
  • IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
  • IEC 60748-20:1988/AMD1:1995 Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

SCC

  • BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
  • BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
  • BS 6493-2-2.4:1989 Semiconductor devices. Integrated circuits-Recommendations for interface integrated circuits
  • DANSK DS/IEC 748-20:1989 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • 06/30153491 DC EN 60748-2-20. Semiconductor devices. Integrated circuits. Part 2-20. Digital integrated circuits. Family specification. Low voltage integrated circuits
  • DANSK DS/EN 165000-2:1997 Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
  • DANSK DS/IEC 748-2-6:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section six: Blank detail specification for microprocessor integrated circuits

PT-IPQ

  • E 295-1974 Aggregate, used to build asphalt roads through infiltration

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 60748-20-1-2019 Semiconductor devices — Integrated circuits — Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits — Section 1: Requirements for internal visual examination
  • KS C IEC 63011-1:2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
  • KS C IEC 60748-11-1-2020 Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • KS C IEC 60748-11-1:2004 Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • KS C IEC 60748-11-1-2004(2020) Semiconductor devices-Integrated circuits-Part 11-1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • KS C IEC 60748-2-20:2002 Semiconductor devices-Integrated circuits-Part 2-20:Digital integrated circuits-Family specification-Low voltage integrated circuits
  • KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
  • KS C IEC 60748-20:2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-20-1-2003(2019) Semiconductor devices — Integrated circuits — Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits — Section 1: Requirements for internal visual examination
  • KS C IEC 60748-2-2001(2021) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-4-2004(2020) Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
  • KS C 6063-1978(2001) GLOSSARY OF TERMS USED IN INTEGRATED CIRCUIT
  • KS C IEC 60748-2:2001 Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-3:2002 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-2-2001(2016) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-4-2020 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
  • KS C IEC 60748-20-1:2003 Semiconductor devices-Integrated circuits-Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits-Section 1:Requirements for internal visual examination
  • KS C IEC 60748-2-2021 Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-4:2004 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
  • KS C IEC 60748-3-2022 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-3-2002(2022) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-3-2002(2017) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-20:2003 Semiconductor devices-Integrated circuits-Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-3-1:2002 Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
  • KS C IEC 60748-2-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-2-8:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 8:Blank detail specification for integrated circuits static read/write memories
  • KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-5:2003 Semiconductor devices-Integrated circuits-Part 5:Semicustom integrated circuits
  • KS C IEC 60748-2-3-2002(2022) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 3:Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)

European Standard for Electrical and Electronic Components

  • EN 163100:1991 Sectional specification: film and hybrid integrated circuits
  • EN 163101:1991 Blank detail specification: film and hybrid integrated circuits

KR-KS

  • KS C IEC 63011-1-2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
  • KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
  • KS C IEC 60748-20-2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-2-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

International Organization for Standardization (ISO)

  • ISO/IEC 24727-5:2011 Identification cards - Integrated circuit card programming interfaces - Part 5: Testing procedures

RU-GOST R

  • GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
  • GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
  • GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits

GSO

  • GSO IEC 60748-11-1:2014 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
  • OS GSO IEC 60748-20-1:2014 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
  • GSO IEC 60748-20-1:2014 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
  • BH GSO IEC 60748-20-1:2016 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
  • BH GSO IEC 60748-11-1:2016 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • OS GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
  • OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • OS GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
  • BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • BH GSO IEC 60748-3:2016 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
  • OS GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • OS GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
  • GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • BH GSO IEC 60748-20:2016 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
  • GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits

BR-ABNT

SE-SIS

CZ-CSN

  • CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
  • CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
  • CSN IEC 748-3:1994 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
  • CSN 35 8720 Cast.2-1988 Integrated circuits. Dimensions
  • CSN IEC 748-20:1993 Semiductors devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

Danish Standards Foundation

  • DS/IEC 748-4:1993 Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits
  • DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
  • DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
  • DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • DS/IEC 748-20:1990 Semiconductor devices. Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
  • DS/IEC 748-3:1993 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

PL-PKN

  • PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
  • PN T01610-1972 Integra ted circuits Classification
  • PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

RO-ASRO

  • SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
  • SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits
  • STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

Association Francaise de Normalisation

Lithuanian Standards Office

  • LST EN 165000-3-2001 Film and hybrid integrated circuits. Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers

GB-REG

HU-MSZT

  • MSZ 7452-1961 Detecting soluble components in polystyrene to detect plastics

IECQ - IEC: Quality Assessment System for Electronic Components

  • QC 763000-1994 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Intergrated Circuits and Hybrid Film Intergrated Circuits - Section 1: Requirements for Internal Visual Examination (IEC 748-20-1 ED 1)

IEC - International Electrotechnical Commission

  • IEC 60748-2:1985 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits (Amendment 1-1991) (Amendment 2-1993) (Edition 1.0)