x-ray fluorescence spectroscopy
x-ray fluorescence spectroscopy, Total:2 items.
The international standard classification for "x-ray fluorescence spectroscopy" includes: Semiconducting materials , Testing of metals .
The Chinese standard classification for "x-ray fluorescence spectroscopy" includes: Semimetal and semiconductor material in general , Semimetal and semiconductor material analysis method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
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