short-term memory-specific

short-term memory-specific, Total:53 items.

The international standard classification for "short-term memory-specific" includes: Identification cards and related devices , food products in general , Powder metallurgy .

The Chinese standard classification for "short-term memory-specific" includes: Data medium , Food sanitation .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17550.3-1998 Identification cards--Optical memory cards --Linear recording method--Part 3:Optical properties and characteristics
GB/T 17550.1-1998 Identification cards--Optical memory cards--Linear recording method--Part 1:Physical characteristics
GB/T 17551-1998 Identification cards - Optical memory cards - General characteristics
GB/T 5009.198-2003 Shellfishes—Test method of domoic acid in amnesicshellfish poisoning

Taiwan Provincial Standard of the People's Republic of China

CNS 13940.1-1997 Identification cards-Optical memory cards-Linear recording method-Part 1:Physical characteristics
CNS 13940-3-1997 Identification cards-Optical memory cards-Linear recording method-Part 3:Optical properties and characteristics
CNS 13939-1997 Identification cards-Optical memory cards-General characteristics
CNS 13940-1-1997 Identification cards-Optical memory cards-Linear recording method-Part 1:Physical characteristics
CNS 13940.3-1997 Identification cards-Optical memory cards-Linear recording method-Part 3:Optical properties and characteristics

Professional Standard - Non-ferrous Metal

YS/T 970-2014 Phase change temperature measuring method for nickel-titanium shape memory alloys

International Organization for Standardization (ISO)

ISO/IEC 11693:2000 Identification cards - Optical memory cards - General characteristics
ISO/IEC 11694-1:2000 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO/IEC 11694-1:2005 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO/IEC 11694-1:2012 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO/IEC 11694-3:2001 Identification cards - Optical memory cards; Linear recording method - Part 3: Optical properties and characteristics

British Standards Institution (BSI)

BS ISO/IEC 11694-6:2014 Identification cards. Optical memory cards. Linear recording method. Use of biometrics on an optical memory card
BS ISO/IEC 11694-6:2006 Identification cards - Optical memory cards - Linear recording method - Use of biometrics on an optical memory card
BS ISO/IEC 11694-3:2015 Identification cards. Optical memory cards. Linear recording method. Optical properties and characteristics
BS ISO/IEC 11694-3:2008 Identification cards - Optical memory cards - Linear recording method - Optical properties and characteristics

SCC

MIL MIL-M-28787/433-1991 MODULES, STANDARD ELECTRONIC MEMORY TIMING MODULE, KEY CODE JEQ

Canadian Standards Association (CSA)

CSA ISO/IEC 11693-06:2006 Identification cards Optical memory cards General characteristics ISO/IEC 11693:2005
CSA ISO/IEC 11694-6-06:2006 Identification cards Optical memory cards Linear recording method Part 6: Use of biometrics on an optical memory card ISO/IEC 11694-6:2006
CSA ISO/IEC 11694-1-06:2006 Identification cards Optical memory cards Linear recording method Part 1: Physical characteristics ISO/IEC 11694-1:2005
CSA ISO/IEC-11694-3-02:2002 Identification cards Optical memory cards Linear recording method Part 3: Optical properties and characteristics iso/iec 11694-3:2001

RO-ASRO

STAS 12326/2-1985 STORAGE OSCILLOSCOPES General requirements and particular test methods

Japanese Industrial Standards Committee (JISC)

JIS H 7101:1989 Method for determining the transformation temperatures of shape memory alloys
JIS H 7101:2002 Method for determining the transformation temperature of shape memory alloys
JIS H 7105:1993 Method of fixed strain test for coil springs of shape memory alloys
JIS H 7105:2002 Method of fixed strain test for coil springs of shape memory alloys
JIS H 7105:2012 Method of constant strain tests for coil springs of Ti-Ni shape memory alloys

Korean Agency for Technology and Standards (KATS)

KS D 0058-2019 Method for determining the transformation temperature of shape memory alloys
KS D 0058-2001 Method for determining the transformation temperature of shape memory alloys
KS D 0058-2004(2019) Method for determining the transformation temperature of shape memory alloys
KS D 0302-2019 Method of fixed temperature load test for coil spring of shape memory alloys
KS D 0058-2004 Method for determining the transformation temperature of shape memory alloys
KS D 0304-2004 Method for fixed strain test for coil springs of shape memory alloys
KS D 0072-2002 Method of fixed temperature tensile test for wires of Ti－Ni shape memory alloys
KS D 0072-2002(2017) Method of fixed temperature tensile test for wires of Ti－Ni shape memory alloys
KS D 0302-2004 Method of fixed temperature load test for coil spring of shape memory alloys
KS D 0072-2022 Method of fixed temperature tensile test for wires of Ti－Ni shape memory alloys
KS D 0304-2004(2019) Method for fixed strain test for coil springs of shape memory alloys
KS D 0304-2019 Method for fixed strain test for coil springs of shape memory alloys
KS D 0304-1995 Method of fixed strain test for coil springs of shape memory alloys
KS D 0302-2004(2019) Method of fixed temperature load test for coil spring of shape memory alloys
KS D 0303-2004(2019) Method of fixed strain thermal cycling test for coil spring of shape memory alloys
KS D 0302-1993 Method of fixed temperature load test for coil spring of shape memory alloys
KS D 0303-2004 Method of fixed strain thermal cycling test for coil spring of shape memory alloys

RU-GOST R

GOST 25492-1982 Memories of digital computers. Terms and definitions
GOST R 52081-2003 Non-destructive testing. Method of metal magnetic memory. Terms and definitions

Defense Logistics Agency

DLA SMD-5962-94567-1996 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO'S, MONOLITHIC SILICON
DLA SMD-5962-89855 REV A-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE TIME PROGRAMMABLE, ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-78015 REV H-2005 MICROCIRCUIT, MEMORY DIGITIAL, 64-BIT BIPOLAR RAM, MONOLITHIC SILICON
DLA SMD-5962-81015 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, DYNAMIC 16K RANDOM ACCESS MEMORY (RAM), MONOLITHIC SILICON