Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

field emission scanning electron microscope

field emission scanning electron microscope, Total:11 items.

The international standard classification for "field emission scanning electron microscope" includes: Other standards related to analytical chemistry , Protection against crime , Optical equipment .

The Chinese standard classification for "field emission scanning electron microscope" includes: Electrochemical, thermochemistry and optical profile type analyzer , Crime judging technology , Electron optics and other physical optics instrument .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
  • GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS

Military Standard of the People's Republic of China-General Armament Department

  • GJB 2666-1996 Specification for scanning reflective beryllium mirrors
  • GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Japanese Industrial Standards Committee (JISC)

American Society for Testing and Materials (ASTM)

  • ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements