single event radiation effect

single event radiation effect, Total:41 items.

The international standard classification for "single event radiation effect" includes: Aircraft and space vehicles in general , Geology. Meteorology. Hydrology , Aerospace electric equipment and systems .

The Chinese standard classification for "single event radiation effect" includes: Electronic components , Meteorology , Basic standards and general methods .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41270.9-2022 Process management for avionics—Atmospheric radiation effects—Part 9：Single event effect fault rate calculation methods and procedures for avionic equipment

Military Standard of the People's Republic of China-General Armament Department

GJB 9730-2020 Specification for particle radiation effect detectors
GJB 7242-2011 Test methods and procedures for single-event effects

中国气象局

QX/T 546-2020 Terminology for space energetic particle radiation effects

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34955-2017 Atmospheric radiation effects-Guidelines for single event effects testing for avionics systems
GB/T 34956-2017 Atmospheric radiation effects―Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

British Standards Institution (BSI)

BS EN 62396-1:2016 Process management for avionics. Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
DD IEC/TS 62396-1:2006 Process management for avionics. Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
DD IEC/PAS 62396-3:2007 Process management for avionics. Atmospheric radiation effects - Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
DD IEC/TS 62396-3:2008 Process management for avionics. Atmospheric radiation effects - Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
BS IEC 62396-1:2012 Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
BS DD IEC/TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
BS IEC 62396-1:2016 Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
DD IEC/TS 62396-2:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for single event effects testing for avionics systems
DD IEC/PAS 62396-2:2007 Process management for avionics. Atmospheric radiation effects - Guidelines for single event effects testing for avionics systems
DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects
DD IEC/PAS 62396-4:2007 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects
PD IEC TR 62396-8:2020 Process management for avionics. Atmospheric radiation effects. Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines

GSO

BH GSO IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
OS GSO IEC 62396-1:2014 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
OS GSO IEC 62396-4:2015 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

Standard Association of Australia （SAA）

IEC 62396-1:2016 RLV Process management for avionics — Atmospheric radiation effects — Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

SCC

BS DD IEC/PAS 62396-3:2007 Process management for avionics. Atmospheric radiation effects-Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
BS DD IEC/TS 62396-3:2008 Process management for avionics. Atmospheric radiation effects-Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
11/30246255 DC BS EN 62396-1. Process management for avionics. Atmospheric radiation effects. Part 1. Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
BS DD IEC/PAS 62396-2:2007 Process management for avionics. Atmospheric radiation effects-Guidelines for single event effects testing for avionics systems
12/30276658 DC BS IEC 62396-3. Process management for avionics. Atmospheric radiation effects. Part 3. Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
DIN EN 62396-1 E:2010 Draft Document - Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment (IEC 107/129/DTS:2010)
BS DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects-Guidelines for designing with high voltage aircraft electronics and potential single event effects
BS PD IEC/TR 62396-7:2017 Process management for avionics. Atmospheric radiation effects-Management of single event effects (SEE) analysis process in avionics design
BS DD IEC/PAS 62396-4:2007 Process management for avionics. Atmospheric radiation effects-Guidelines for designing with high voltage aircraft electronics and potential single event effects
MIL MIL-PRF-19500/707C-2015 Transistor, Field Effect Radiation Hardened (Total Dose and Single Event Effects) N-Channel, Silicon, Types 2N7500U5, 2N7501U5, and 2N7502U5, JANTXVR and JANSR
MIL MIL-PRF-19500/707B-2011 Transistor, Field Effect Radiation Hardened (Total Dose and Single Event Effects) N-Channel, Silicon, Types 2N7500U5, 2N7501U5, and 2N7502U5, JANTXVR and JANSR
MIL MIL-PRF-19500/707-2002 SEMICONDUCTOR DEVICE FIELD EFFECT RADIATION HARDENED(TOTAL DOSE & SINGLE EVENT EFFECTS)TRANSISTOR N-CHANNEL SILICON TYPE 2N7500U5 2N7501U5 2N7502U5 JANTXVR JANSR
11/30256756 DC BS EN 62396-2. Process management for avionics. atmospheric radiation effects. Part 2. Guidelines for single event effects testing for avionics systems
MIL MIL-PRF-19500/633C-2008 Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistors, P-Channel Silicon, Types 2N7403 and 2N7404, JANSD and JANSR
BS PD IEC TR 62396-8:2020 Process management for avionics. Atmospheric radiation effects-Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines
MIL MIL-PRF-19500/659-1998 SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, P-CHANNEL SILICON TYPE 2N7440, AND 2N7441 JANSD AND JANSR

IEC - International Electrotechnical Commission

PAS 62396-3-2007 Process management for avionics – Atmospheric radiation effects – Part 3: Optimising system design to accommodate the Single Event Effects (SEE) of atmospheric radiation (Edition 1.0)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD57-1996 Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation

Defense Logistics Agency

DLA MIL-PRF-19500/634 C-2008 SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, N-CHANNEL SILICON, TYPES 2N7405, 2N7406, 2N7407, AND 2N7408, JANSD AND JANSR

Others: single event radiation effect,Guidelines for Heavy Ion Single Event Effect Test of Semiconductor Devices Used in Aerospace,single event effect