sub millisecond

sub millisecond, Total:16 items.

The international standard classification for "sub millisecond" includes: .

The Chinese standard classification for "sub millisecond" includes: .

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National Metrological Technical Specifications of the People's Republic of China

• JJF(机械) 063-2009 DTM digital millisecond meter calibration specification

National Metrological Verification Regulations of the People's Republic of China

• JJG(机械) 78-1992 Verification Regulations for DTM Digital Millisecond Meter

Military Standard of the People's Republic of China-General Armament Department

• GJB 8152-2013 Measuring method for temporal-profile of sub-nanosecond laser pulse by the streak camera

SCC

• MIL MIL-R-83726/24M-2016 Relays, Solid State, Time Delay (on Operate), Track Mounted, Type I, Class C, SPST, 150 Milliamperes, Fixed Time, 50 Milliseconds to 500 Seconds
• MIL MIL-R-83726/24J-1991 RELAYS, SOLID STATE, TIME DELAY (ON OPERATE), TRACK MOUNTED, TYPE I, CLASS C, SPST, 150 MILLIAMPERES, FIXED TIME, 50 MILLISECONDS TO 500 SECONDS (S/S BY MIL-R-83726/24K)
• MIL MIL-R-83726/24K-1995 RELAYS, SOLID STATE, TIME DELAY (ON OPERATE), TRACK MOUNTED, TYPE I, CLASS C, SPST, 150 MILLIAMPERES, FIXED TIME, 50 MILLISECONDS TO 500 SECONDS (SUPERSEDING MIL-R-83726/24J) (S/S BY MIL-R-83726/24L)
• MIL MIL-R-83726/24L-2002 RELAYS, SOLID STATE, TIME DELAY (ON OPERATE), TRACK MOUNTED, TYPE I, CLASS C, SPST, 150 MILLIAMPERES, FIXED TIME, 50 MILLISECONDS TO 500 SECONDS (SEE BASE FOR INACTIVATION NOTICE) (SUPERSEDING MIL-R-83726/24K)

VN-TCVN

• TCVN 6630-2000 Non-electric milisecond delay detonator.Technical requirements
• TCVN 6631-2000 Non-electric milisecond delay detonator.Test methods

Defense Logistics Agency

• DLA MIL-PRF-83726/21 F-2008 RELAY, SOLID-STATE, TIME DELAY (ON OPERATE), TYPE I, CLASS C, SPST, 250 MILLIAMPERES, VARIABLE TIME, 0.05 TO 500 SECONDS

American National Standards Institute （ANSI)

• ANSI/EIA 364-87:1996 Nanosecond Event Detection for Electrical Connectors, Contacts and Sockets

GSO

• GSO ISO/TS 17958:2015 Paper and board -- Determination of fracture toughness -- Constant rate of elongation method (1,7 mm/s)
• OS GSO ISO/TS 17958:2015 Paper and board -- Determination of fracture toughness -- Constant rate of elongation method (1,7 mm/s)

Electronic Components, Assemblies and Materials Association

• ECA EIA-364-87A-2009 TP-87A NANOSECOND EVENT DETECTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS

American Society for Testing and Materials (ASTM)

• ASTM B878-97(2009) Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

KR-KS

• KS M ISO TS 17958-2020 Paper and board — Determination of fracture toughness —Constant rate of elongation method(1.7 mm/s)

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