Spectrometer

Spectrometer, Total:98 items.

The international standard classification for "Spectrometer" includes: Analytical chemistry in general , IT applications in science , Chemical analysis , Chemical laboratories. Laboratory equipment , Other standards related to optics and optical measurements , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Spectrometer" includes: Electrochemical, thermochemistry and optical profile type analyzer , Computer application , Basic standards and general methods , Optical Measurement , Electron optics and other physical optics instrument , Lathe , Meteorology , Oceanographic instrumentation .

Military Standard of the People's Republic of China-General Armament Department

GJB 8472-2015 Verification regulation for field spectrometer
GJB 9726-2020 Specifications for spaceborne hyperspectral imagers

Jilin Provincial Standard of the People's Republic of China

DB22/T 2414-2015 Micro fiber optic spectrometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
GB/T 42027-2022 Gas-phase molecular absorption spectrometer
GB/T 40219-2021 General specification for Raman spectrometers

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

National Metrological Verification Regulations of the People's Republic of China

JJG 768-1994 Verification Regulation of Emission Spectrometer
JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
JJG(教委) 02-1992 Laser Raman Spectrometer Verification Regulations
JJG 768-2005 Verification Regulation of Emission Spectrometer
JJG 867-1994 Spectrocolorimeter
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers

Group Standards of the People's Republic of China

T/CITS 368-2025 Handheld X-ray Fluorescence Spectrometer
T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
T/ZZB 0673-2018 Emission spectrometer

Professional Standard - Machinery

JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
JB/T 9322-1999 Spectrum projector
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 9320-1999 Plane-gratings spectrographs
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 5598-1991 Meter Lathe Model Spectrum of Series
JB/T 9331-1999 Slits for optical spectrum instruments

Professional Standard - Meteorology

QX/T 532-2019 Specifications for Brewer spectrophotometer calibration

National Metrological Technical Specifications of the People's Republic of China

JJF 1544-2015 Calibration Specification for Raman Spectrometers
JJF 1329-2011 Calibration Specification for Instantaneous Spectral Instruments
JJF 1544-2024 Calibration Specification for Raman Spectrometers

Professional Standard - Ocean

HY/T 175-2014 Optical suspended sediment particle size analyzer

GCC Standardization Organization

GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO IEC 61976:2016 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 8577:2016 Optics and optical instruments -- Microscopes -- Spectral filters
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

German Institute for Standardization

DIN IEC 61976:2001 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry (IEC 61976:2000)
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN IEC 714:1986 Expressing the characteristics of a spectrum analyzer
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

American Society for Testing and Materials (ASTM)

ASTM STP 517-1972 Optical Emission Spectrometer
ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

Korean Agency for Technology and Standards (KATS)

KS D ISO 14707-2003(2023) Surface chemical analysis - Glow discharge emission spectroscopy (GD-OES) - Introduction
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters

Association Francaise de Normalisation

NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-845:2006 Calibration of optical spectrum analyzers.

International Organization for Standardization (ISO)

ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

British Standards Institution (BSI)

BS EN 61290-1-1:1998 Optical spectrum analyzer
BS IEC 61428:1998(1999) Nuclear instrumentation — Sample containers for gamma - ray spectrometry with Ge - detectors
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 6329:1982 Method of expression of the properties of spectrum analyzers
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

European Committee for Electrotechnical Standardization（CENELEC）

EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

International Electrotechnical Commission (IEC)

IEC TR 61276:1994 Nuclear Instrumentation - Guidelines for Selection of Metrologically Supported Nuclear Radiation Spectrometry Systems (Edition 1.0)
IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 60714:1981 Expression of the properties of spectrum analyzers

Swedish Institute for Standards

SS-EN 62129:2006 Calibration of optical spectrum analyzers

Comitato Elettrotecnico Italiano

CEI EN 62129:2006 Calibration of optical spectrum analyzers

Danish Standards Foundation

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers

Gosstandart of Russia

GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions

Japanese Industrial Standards Committee (JISC)

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Bureau of Indian Standards

IS 6471-1971 Spectrometer specifications (student type)

Association of German Mechanical Engineers

VDI VDE DGQ DKD 2622 Blatt-11 E:2019-11 Calibration of spectrum analyzers

National Standardisation Body (ASRO)

STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry

Standard Association of Australia （SAA）

AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters