fluorescence spectroscopy silicon
fluorescence spectroscopy silicon, Total:26 items.
The international standard classification for "fluorescence spectroscopy silicon" includes: Glass in general , Ferroalloys , Non-metalliferous minerals , Analytical chemistry in general , Testing of metals , Semiconducting materials , Other standards related to optics and optical measurements .
The Chinese standard classification for "fluorescence spectroscopy silicon" includes: Daily use glass products , Steel and iron alloy analysis method , Chrome ore , Metallurgical auxiliary material ore , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material analysis method , Semimetal and semiconductor material in general , Electron optics and other physical optics instrument .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40915-2021 Determination of SiO2,Al2O3,Fe2O3,K2O,Na2O,CaO,MgO content of soda-lime-silica glass by X-ray fluorescence spectrometric method
- GB/T 5687.13-2021 Ferrochromium—Determination of chromium, silicon, manganese, titanium, vanadium, iron contents—Wavelength dispersive X-ray fluorescence spectrometry (fused cast bead method)
- GB/T 41497-2022 Ferrovanadium—Determination of vanadium,silicon,phosphorus,manganese,aluminum,iron content—Wavelength dispersive X-ray fluorescence spectrometry
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5091-2019 Determination of ferromanganese, manganese silicon, ferromanganese nitride and metal manganese silicon, manganese and phosphorus content Wavelength dispersive X-ray fluorescence spectrometry (cast glass method)
Professional Standard - Commodity Inspection
- SN/T 1118-2002 Determination of chromium|| silicon|| iron|| aluminium|| magnesium and calcium in chromium ores-wavelength dispersive X-ray fluorescence spectrometric method
Anhui Provincial Standard of the People's Republic of China
- DB34/T 3082-2018 Determination of Calcium, Magnesium, Silicon, Iron, Aluminum, Manganese and Potassium in Calcite X-ray Fluorescence Spectrometry
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 5195.15-2017 Fluorspar--Determination of calcium, aluminum, silicon, phosphorus, sulfur, potassium, iron, barium and lead content--Wavelength dispersive X-ray fluorescence spectrometric method
Group Standards of the People's Republic of China
- T/CQCAA 0005-2020 Determination of mercury in silicon dioxide -Atomic Fluorescence Spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
- GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
- GB/T 21191-2007 Atomic fluorescence spectrometer
Professional Standard - Machinery
- JB/T 11145-2011 X-ray fluorescence spectrometer
European Committee for Standardization (CEN)
- CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
SCC
- SN-CEN/TR 10354:2011 Chemical analysis of ferrous materials — Analysis of ferro-silicon — Determination of Si and Al by X-ray fluorescence spectrometry
- DANSK DS/CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
American Society for Testing and Materials (ASTM)
- ASTM RR-F01-1012 1996 F1526-Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy
Association Francaise de Normalisation
- FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
Korean Agency for Technology and Standards (KATS)
- KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
- KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
- KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS A 3861-2015(2020) Method for Determining Fluorographic of Sensitivity Photographic Sensitive Materials Used with Green Fluorescent Screen
British Standards Institution (BSI)
- BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
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