Fundamentals of test methods for integrated circuit a/d and d/a converters
Fundamentals of test methods for integrated circuit a/d and d/a converters, Total:1 items.
The international standard classification for "Fundamentals of test methods for integrated circuit a/d and d/a converters" includes: Semiconductor devices in general .
The Chinese standard classification for "Fundamentals of test methods for integrated circuit a/d and d/a converters" includes: Microcircuit in general .
Professional Standard - Electron
- SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits
The basic principle of test method of integrated circuit a/d and d/a converter,Fundamentals of test methods for integrated circuit a/d and d/a converters