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MS pair ion mode

MS pair ion mode, Total:118 items.

The international standard classification for "MS pair ion mode" includes: Chemical analysis , Other standards related to optics and optical measurements , Measuring instruments , Chemical laboratories. Laboratory equipment .

The Chinese standard classification for "MS pair ion mode" includes: Basic standards and general methods , Analysis methods for toxic substances in water , chromatograph , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Electrochemical, thermochemistry and optical profile type analyzer , Hydrogeological survey , Hygiene, safety and labor protection .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
  • GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method

Professional Standard - Environmental Protection

  • HJ 84-2016 Water Quality-Determination of Inorganic Anions(F-、Cl-、NO2-、Br-、NO3-、PO43-、SO32-、SO42-)-Ion Chromatography
  • HJ 812-2016 Water Quality - Determination of Water Soluble Cations(Li+ 、Na+、NH4+、K+、Ca2+、Mg2+) - Ion Chromatography
  • HJ 778-2015 Water quality - Determination of iodide - Ion chromatiography
  • HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method
  • HJ 669-2013 Water quality-Determination of phosphate-Ion chromatography

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 36240-2018 Ion chromatographs

Group Standards of the People's Republic of China

  • T/GXAS 720-2024 Ion-absorbing type rare earths ore—Determination of total rare earth ion phase—Inductively coupled plasma mass spectrometery
  • T/CIS 17004-2020 Ambient ionization device
  • T/SXQCA 001-2023 Water quality-Determination of water soluble cations(Sr2+、Ba2+) -Ion chromatography
  • T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry
  • T/DLAS 004-2021 Determination of five kinds of selenium in selenium-enriched agricultural products by ion chromatography-inductively coupled plasma mass spectrometry
  • T/NAIA 0169-2022 Water Quality Determination of Ammonia Nitrogen by Ion Chromatography
  • T/NAIA 0168-2022 Water Quality Determination of Perchlorate by Ion Chromatography
  • T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1715-2018 Program of Pattern Evaluation of Ion Chromatographs

未注明发布机构

  • AS ISO 18114:2006(R2016) Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

Professional Standard - Agriculture

Professional Standard - Geology

  • DZ/T 0064.51-1993 Groundwater quality test methods - the determination of chloridion, fluorinion, bromide ion, nitrate radical and sulfate radical with ion chromatography method

Professional Standard - Commodity Inspection

  • SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method

Professional Standard - Medicine

  • YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

Shandong Provincial Standard of the People's Republic of China

工业和信息化部

  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
  • SJ/T 11637-2016 General principles of inductively coupled plasma mass spectrometry for electronic chemicals

Hunan Provincial Standard of the People's Republic of China

  • DB43/T 2957-2024 Water quality-Determination of perchlorate-Ion chromatography

International Organization for Standardization (ISO)

  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
  • ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 14911:1998 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water
  • ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

GSO

  • GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 18114-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D ISO 18114-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D ISO 18114:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS I ISO 14911:2009 Water quality-Determination of dissolved Li+, Na+,NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ using ion chromatography-Method for water and waste water
  • KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS I ISO 17294:2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
  • KS I ISO 17294-2014(2021) Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
  • KS I ISO 17294-2021 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
  • KS I ISO 12010:2022 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)

Association Francaise de Normalisation

  • NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
  • NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
  • NF T90-048*NF EN ISO 14911:1999 Water quality - Determination of dissolved Li+, Na+, NH 4+, K+, Mn 2+, Ca 2+, Mg 2+, Sr 2+ and Ba 2+ using ion chromatography - Method for water and waste water.
  • XP CEN ISO/TS 19590:2019 Nanotechnologies - Particle size distribution and concentration of inorganic nanoparticles in an aqueous medium by induced plasma mass spectrometry in single particle mode

Japanese Industrial Standards Committee (JISC)

  • JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • JIS K 0133:2000 General rules for high frequency plasma mass spectrometry
  • JIS K 0133:2007 General rules for high frequency plasma mass spectrometry
  • JIS K 0400-52-30:2001 Water quality -- Determination of 33 elements by inductively coupled plasma atomic emission spectroscopy

RU-GOST R

  • GOST R 55339-2012 Juice products. Determination of anions by ion exchange chromatography method

British Standards Institution (BSI)

  • BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
  • BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
  • BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • 20/30409889 DC BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
  • BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry

American Society for Testing and Materials (ASTM)

  • ASTM UOP1031-19 Chromium (III) and Chromium (VI) Speciation in Water by IC-ICP-MS (Ion Chromatography- Inductively Coupled Plasma Mass Spectrometry)
  • ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM D4327-97 Standard Test Method for Anions in Water by Chemically Suppressed Ion Chromatography
  • ASTM D4327-03 Standard Test Method for Anions in Water by Chemically Suppressed Ion Chromatography
  • ASTM E1504-92(1996) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1504-92(2001) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

SCC

  • 07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer

German Institute for Standardization

  • DIN EN ISO 14911:1999 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water (ISO 14911:1998); G
  • DIN EN ISO 17294-1:2022-07 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 1: General guidelines (ISO/DIS 17294-1:2022); German and English version prEN ISO 17294-1:2022 / Note: Date of issue 2022-06-17*Intended as replacement for DIN ...

European Committee for Standardization (CEN)

  • EN ISO 14911:1999 Water Quality - Determination of Dissolved Li+, Na+, NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ Using Ion Chromatography - Method for Water and Waste Water ISO 14911:1998

Standard Association of Australia (SAA)

  • AS ISO 18114:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry

CZ-CSN

ZA-SANS

  • SANS 11885:2008 Water quality - Determination of selected elements by inductively coupled plasma optical emission spectrometry (ICP-OES)

US-ACEI

IPC - Association Connecting Electronics Industries

KR-KS

  • KS I ISO 12010-2022 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)