Diodes - Time of Flight
Diodes - Time of Flight, Total:102 items.
The international standard classification for "Diodes - Time of Flight" includes: Environmental protection , Chemical analysis , Chemical reagents , Optoelectronics. Laser equipment .
The Chinese standard classification for "Diodes - Time of Flight" includes: Environmental monitoring instrument and its complete equipment , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Technical Management , Technical management .
Anhui Provincial Standard of the People's Republic of China
- DB34/T 2820-2017 Determination of 330 pesticide residues in Chinese herbal medicines by liquid chromatography quadrupole time-of-flight tandem mass spectrometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers
Group Standards of the People's Republic of China
- T/GAIA 008-2021 Determination of Short Chain Chlorinated Paraffins in Plastic, Rubber Products and Chlorinated Paraffins Raw Material — HPLC-Q-TOF/MS Method
- T/CAEPI 28-2020 Technical requirement of laser ionization-time-of-flight mass spectrometry online monitoring system for dioxins in the municipal solid waste incineration flue gas
- T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 37849-2019 Method of performance testing for liquid chromatography tandem time of flight mass spectrometry
Taiwan Provincial Standard of the People's Republic of China
- CNS 6561-1980 Characterization of a Reverse Recovery Test Fixture
- CNS 8383-1982 Forward Transient Measurement on Semiconductor Diodes
- CNS 6560-1980 Measurement of Reverse Recovery Time for Semiconductor Diodes
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 3196.41A-2005 Test methods of cartridge.Part 41:Flight time measurement
Professional Standard - Agriculture
- SN/T 5493-2023 Determination of 29 fentanyl analogs in solid and liquid samplesLiquid chromatography-quadrupole time of flight mass spectrometry
Professional Standard - Electron
- SJ 2354.8-1983 Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes
- SJ 422-1973 Methods of measuremenet for cathode prehcating time of low noise travelling wave tubes
Professional Standard - Education
- JY/T 0369-2004 Two-dimension Space-time Tracer
未注明发布机构
- DIN EN 15617 E:2007-01 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
NATO - North Atlantic Treaty Organization
- STANAG 3527-1969 Aircrew Flying Time and Rest Periods (ED 1 AMD 7)
- STANAG 3527-1996 Aircrew Flying Time and Rest Periods (ED 2 AMD 0)
RU-GOST R
- GOST 21011.5-1978 High-voltage kenotrons. Methods of measurement of cathode heatting time and readiness time controlling
- GOST R 57024-2016 Fish. Method for determination of the residual content of derivatives benzoylureas using ultra highly liquid chromatography-quadrupole-time-of-flight mass spectrometry
- GOST 18986.5-1973 Semiconductor diodes. Method for measuring transition time
- GOST R 56962-2016 Fish, non-fish objects and products from them. Method for determination of residual content of triphenylmethane dyes using ultra performance liquid chromatography-quadrupole-time-of-flight mass spectrometry
- GOST 25645.215-1985 Space crew radiation safety during space flight. Safety norms with flight duration till three years
- GOST 18986.8-1973 Semiconductor diodes. Method for measuring reverse recovery time
- GOST 19656.9-1974 Ultra-high frequency multiplication and parametric semiconductor diodes fixed time and limit frequency measurement methods
- GOST 19656.9-1979 Semiconductor microwave varactors and multiplier diodes. Methods of measuring time constant and limiting frequency
International Organization for Standardization (ISO)
- ISO 6416:2017 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO 2578:1974 Plastics — Determination of time-temperature limits after exposure to prolonged action of heat
Society of Automotive Engineers (SAE)
- SAE AIR5020-2004 Time-Dependent In-Flight Thrust Determination
- SAE AIR5020-1996 Time-Dependent In-Flight Thrust Determination
- SAE ARP1915C-2005 Aircraft Tow Bar
- SAE AS3123-3-1951 AS3123 Brake Lever for Pilot's Control Wheel
- SAE AS3125-2-1951 AS3125 Brake Lever for Pilot's Control Wheel
- SAE AS3124-3-1951 AS3124 Brake Lever for Pilot's Control Wheel
- SAE ARINC681-2021 TIMELY RECOVERY OF FLIGHT DATA (TRFD)
SAE - SAE International
- SAE AIR5020A-2012 Time-Dependent In-Flight Thrust Determination
Association Francaise de Normalisation
- NF EN ISO 6416:2017 Hydrometry - Flow measurement using the ultrasonic transit time (time of flight) method
- NF X10-334*NF EN ISO 6416:2017 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method
- NF A89-516*NF EN ISO 15626:2018 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
- NF T76-117:1984 Water based adhesives. Resorcinol formaldehyde, resorcinol-phenol formaldehyde. Conventional determination of gel setting time at 23 degrees C.
German Institute for Standardization
- DIN EN ISO 6416:2019-03 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO 6416:2017); German version EN ISO 6416:2017
- DIN EN ISO 6416:2019 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO 6416:2017)
- DIN EN ISO 15626:2018-11 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels (ISO 15626:2018); German version EN ISO 15626:2018
Korean Agency for Technology and Standards (KATS)
- KS B ISO 6416:2021 Hydrometry — Measurement of discharge by the ultrasonic transit time (time of flight) method
- KS B ISO 15626:2019 Non-destructive testing of welds — Time-of-flight diffraction technique(TOFD) — Acceptance levels
- KS M ISO 2578:2022 Plastics — Determination of time-temperature limits after prolonged exposure to heat
ES-UNE
- UNE-EN ISO 6416:2018 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO 6416:2017)
- UNE-EN ISO 15626:2019 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels (ISO 15626:2018)
British Standards Institution (BSI)
- BS EN ISO 6416:2017 Hydrometry. Measurement of discharge by the ultrasonic transit time (time of flight) method
- BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- BS EN ISO 15626:2013 Non-destructive testing of welds. Time-of-flight diffraction technique (TOFD). Acceptance levels
- BS DD CEN/TS 14751:2004 Welding - Use of time-of-flight diffraction technique (TOFD) for examination of welds
- BS EN ISO 15626:2018 Non-destructive testing of welds. Time-of-flight diffraction technique (TOFD). Acceptance levels
- DD 204-1991 Guide to determination of exposure limits, recovery times and relaxation times in work measurement
United States Navy
- NAVY MIL-P-82534-1968 PROGRAMMER, RANGE AND AIRFRAME SEPARATION MARK 3 MOD 1
- NAVY MIL-P-82534 NOTICE 1-1986 PROGRAMMER, RANGE AND AIRFRAME SEPARATION MARK 3 MOD 1
- NAVY MIL-P-82534 (2)-1969 PROGRAMMER, RANGE AND AIRFRAME SEPARATION MARK 3 MOD 1
SCC
- CSA C865.1-2023 Pilotes de diodes électroluminescentes — méthodes de mesure
- DANSK DS/EN ISO 6416:2017 Hydrometry – Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO 6416:2017)
- NS-EN ISO 6416:2017 Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO 6416:2017)
- DIN CEN/TS 14751:2005 Welding - Use of time-of-flight diffraction technique (TOFD) for examination of welds; German version CEN/TS 14751:2004
- DANSK DS/CEN/TS 14751:2004 Welding - Use of time-of-flight diffraction technique (TOFD) for examination of welds
- SN-CEN/TS 14751:2004 Welding — Use of time-of-flight diffraction technique (TOFD) for examination of welds
- DIN EN ISO 6416 E:2016 Draft Document - Hydrometry - Measurement of discharge by the ultrasonic transit time (time of flight) method (ISO/DIS 6416:2015); German and English version prEN ISO 6416:2015
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
- NS-EN 15617:2009 Non-destructive testing of welds — Time-of-flight diffraction technique (TOFD) — Acceptance levels
- UNE-EN 15617:2010 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
- 09/30187580 DC BS EN ISO 10863. Welding. Use of time-of-flight diffraction technique (TOFD) for testing of welds
KR-KS
- KS B ISO 6416-2021 Hydrometry — Measurement of discharge by the ultrasonic transit time (time of flight) method
- KS B ISO 15626-2019 Non-destructive testing of welds — Time-of-flight diffraction technique(TOFD) — Acceptance levels
- KS M ISO 2578-2022 Plastics — Determination of time-temperature limits after prolonged exposure to heat
American Society for Testing and Materials (ASTM)
- ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
- ASTM E2373/E2373M-19 Standard Practice for Use of the Ultrasonic Time of Flight Diffraction (TOFD) Technique
- ASTM E2373/E2373M-14 Standard Practice for Use of the Ultrasonic Time of Flight Diffraction (TOFD) Technique
- ASTM E2373-04 Standard Practice for Use of the Ultrasonic Time of Flight Diffraction (TOFD) Technique
GSO
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- GSO ISO 2315:2016 Aircraft -- Two- and four-pole sealed electromagnetic relays, 2 A and 3 A -- Clearance and fixing dimensions
- OS GSO ISO 2315:2016 Aircraft -- Two- and four-pole sealed electromagnetic relays, 2 A and 3 A -- Clearance and fixing dimensions
- BH GSO ISO 2315:2017 Aircraft -- Two- and four-pole sealed electromagnetic relays, 2 A and 3 A -- Clearance and fixing dimensions
- BH GSO ISO 15626:2017 Non-destructive testing of welds -- Time-of-flight diffraction technique (TOFD) -- Acceptance levels
- GSO ISO 15626:2015 Non-destructive testing of welds -- Time-of-flight diffraction technique (TOFD) -- Acceptance levels
PL-PKN
- PN T01504-60-1987 Diodes Measuring methods Instant and peak forward recovery voltages Ufr, Ufrm and forward recovery time tfr
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC EIA-318-B-1996 Measurement of Reverse Recovery Time for Semiconductor Signal Diodes [Replaced: JEDEC 318-1]
CEN - European Committee for Standardization
- PD CEN/TS 14751:2004 Welding - Use of time-of-flight diffraction technique (TOFD) for examination of welds
- EN 15617:2009 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
CZ-CSN
- CSN 35 8764-1976 Semicoaductor devices. Switching diodes. Measurement o? reverse recovery time.
- CSN 64 0768-1982 Determination of time - emperature limits
GB-REG
- REG NASA-LLIS-1166--2001 Lessons Learned ?International Space Station (ISS)/X-38/Space Flight Qualification Test Schedule
Defense Logistics Agency
- DLA MS26517 NOTICE 2-1999 HANDLES, CONTROL, AIRCRAFT THROTTLE, LARGE
- DLA MS26517-1957 HANDLES, CONTROL, AIRCRAFT THROTTLE, LARGE
- DLA MS26517 VALID NOTICE 1-1988 HANDLES, CONTROL, AIRCRAFT THROTTLE, LARGE
Danish Standards Foundation
- DS/EN ISO 15626:2013 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
- DS/EN ISO 2578:1999 Plastics - Determination of time-temperature limits after prolonged exposure to heat
Lithuanian Standards Office
- LST EN 15617-2009 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
Aeronautical Radio Inc.
- ARINC 613 ITEM 16.0-1988 Runtime Issues
The American Road & Transportation Builders Association
- AASHTO CA11-4-2013 Brief 11. Commuting Departure Time and Trip Time
AASHTO - American Association of State Highway and Transportation Officials
- CA11-4-2013 Brief 11. Commuting Departure Time and Trip Time
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