Several interferometers

Several interferometers, Total:62 items.

The international standard classification for "Several interferometers" includes: Linear and angular measurements , Measuring instruments , Optical measuring instruments , Optics and optical measurements .

The Chinese standard classification for "Several interferometers" includes: Length Measurement , Optical Measurement , Measuring tool and instrument , Optical metrological instrument , Office supplies and office implements , Optical instrument in general .

National Metrological Verification Regulations of the People's Republic of China

JJG 331-1994 Verification Regulation of Laser Interference Comparator
JJG 739-2005 Verification Regulation of Laser Interferometers
JJG 371-1992 Verification Regulation of Laser Gauge Block Interferometer
JJG 101-1981 Verification Regulation of Contact-type Interferometers
JJG 770-1992 Verification Regulation of Koster Interference Comparator
JJG 661-2004 Verification Regulation of Flatness Interferometer with Isoclinic Circle Fringe
JJG 101-2004 Verification Regulation of Contact-type Interferometers
JJG 371-2005 Verification Regulation of Gauge Block Interferometers
JJG 661-1990 Verification Regulation of Flatness Interferometer with Isoclinic Circle Fringe

Professional Standard - Machinery

JB/T 5610-2006 Laser interferometer
JB/T 8233-1999 Vertical contact interferometers
JB/T 5610-1991 Dual-frequency Laser Interferometer

机械电子工业部

JB 5610-1991 Dual frequency laser interferometer

工业和信息化部

JB/T 13872-2020 Phase shift interferometer for flat

Group Standards of the People's Republic of China

T/SZBX 080-2022 Phase-shifting Laser Interferometer

Professional Standard - Education

JY 64-1980 Double slit interferometer (trial)
JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light

National Metrological Technical Specifications of the People's Republic of China

JJF 2007-2022 Calibration Specification for Optical Fiber End-Face Interferometers
JJF 1100-2016 Calibration Specification for Flat Equal Thickness Interferometers
JJF 1100-2003 Calibration Specification for Flat Equal Thickness Interferometers
JJF 1739-2019 Calibration Specification for Digital Laser Spherical Interferometers
JJF 1913-2021 Calibration Specification for Laser Interferometric Comparators

Military Standard of the People's Republic of China-General Armament Department

GJB 1713-1993 Specifications for Nanolaser Polarization Interferometers
GJB 337-1987 Determination method of nitrogen content of nitrocellulose (interferometer method)

Jilin Provincial Standard of the People's Republic of China

DB22/T 2651-2017 Calibration specification for digital laser spherical interferometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 33523.604-2022 Geometrical product specifications (GPS)—Surface texture: Areal—Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments
GB/T 26328-2010 Optical interference filters for biochemical analyzer

未注明发布机构

GJB 8704-2015 Calibration Specification for Digital Laser Plane Interferometer

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB/J 6221-2008 Calibration specification for digital laster plane interferometer

Heilongjiang Provincial Standard of the People's Republic of China

DB23/T 1528-2013 Technical regulations for fast dynamic dual-frequency laser interferometer

国家能源局

SY/T 7340-2016 Riser interference

Korean Agency for Technology and Standards (KATS)

KS E 4111-2013 INTERFEROMETER TYPE INSTRUMENTAL GAS DETECTOR FOR INFLAMMABLE GAS
KS E 4115-2013 Interferometer type gas alarms
KS B 0506-2016 Instruments for the Measurement of Surface Roughness by the Interferometric Method
KS B 0506-1975 Instruments for the Measurement of Surface Roughness by the Interferometric Method
KS E 4115-2006(2011) Interferometer type gas alarms
KS E 4115-1980 Interferometer type gas alarms
KS B 0506-2021 Instruments for the Measurement of Surface Roughness by the Interferometric Method
KS B 0506-2016(2021) Instruments for the Measurement of Surface Roughness by the Interferometric Method
KS B 8400-2-2010 Lasers and laser-related equipments-Test methods for laser interferometers for displacement measurement-Part 2:Test methods for laser interferometers
KS B 8400-2-2015 Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers
KS B 8400-2-2020 Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers
KS B 8400-2-2015(2020) Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers

GB-REG

REG NASA-LLIS-1595--2005 Lessons Learned - Interferometer Design

Japanese Industrial Standards Committee (JISC)

JIS M 7625:1993 Interferometer type gas alarms
JIS M 7602:1993 Interferometer type instrumental gas detector for inflammable gas

Association Francaise de Normalisation

NF E11-016:1987 Length measuring instruments - Fringe counting,laser source interferometers
E11-016:1987 Length measuring instruments. Fringe counting, laser source interferometers.

American Society of Mechanical Engineers (ASME)

ASME B89.1.8-2011 Performance Evaluation of Displacement-Measuring Laser Interferometers
ASME B89.1.8-2011(R2021) Performance Evaluation of Displacement-Measuring Laser Interferometers

International Organization for Standardization (ISO)

ISO/CD 25178-604 Geometrical product specifications (GPS) — Surface texture: Areal — Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments
ISO/DIS 25178-604:2023 Geometrical product specifications (GPS) — Surface texture: Areal — Part 604: Design and characteristics of non-contact (coherence scanning interferometry) instruments

Danish Standards Foundation

DS/EN ISO 25178-604:2013 Geometrical product specifications (GPS) - Surface texture: Areal - Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments

GSO

OS GSO ISO 25178-604:2015 Geometrical product specifications (GPS) -- Surface texture: Areal -- Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments
BH GSO ISO 25178-604:2017 Geometrical product specifications (GPS) -- Surface texture: Areal -- Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments

SCC

DANSK DS/EN ISO 25178-604:2013 Geometrical product specifications (GPS) - Surface texture: Areal - Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments
VDI/VDE 2655 BLATT 1.3-2020 Optical measurement technology on microtopographies - calibration of area-measuring interferometers and interference microscopes for shape measurement

American National Standards Institute （ANSI)

ANSI/ASME B89.1.8-2011 Performance Evaluation of Displacement-Measuring Laser Interferometers

German Institute for Standardization

DIN EN ISO 25178-604:2013-12 Geometrical product specification (GPS) - Surface texture: Areal - Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments (ISO 25178-604:2013); German version EN ISO 25178-604:2013

ES-UNE

UNE-EN ISO 25178-604:2013 Geometrical product specifications (GPS) - Surface texture: Areal - Part 604: Nominal characteristics of non-contact (coherence scanning interferometry) instruments (ISO 25178-604:2013) (Endorsed by AENOR in January of 2015.)

British Standards Institution (BSI)

BS EN ISO 25178-604:2013 Geometrical product specifications (GPS). Surface texture: Areal. Nominal characteristics of non-contact (coherence scanning interferometry) instruments
BS EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments. Michelson interferometer single wavelength meters

Others: laser interferometer,Interferometer,laser interferometer,Several interferometers,interferometer baseline,Several electron microscopes,laser interferometer,Interferometer,optical interferometer,several errors,several qpcr,several burnt,several titrations,Maglev Interferometer,Maglev Interferometer,Gauge block interferometer,bet several,Several density,Taste