Quadrupole Ion Mass Spectrometer

Quadrupole Ion Mass Spectrometer, Total:45 items.

The international standard classification for "Quadrupole Ion Mass Spectrometer" includes: Chemical reagents , Chemical laboratories. Laboratory equipment , Chemical analysis , Other standards related to analytical chemistry .

The Chinese standard classification for "Quadrupole Ion Mass Spectrometer" includes: Chemical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Material composition analysis instrument and environment detection instrument in general .

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National Metrological Technical Specifications of the People's Republic of China

• JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer

Group Standards of the People's Republic of China

• T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer
• T/NAIA 0160-2022 Determination of total sulfur dioxide in wine by triple quadrupole inductively coupled plasma mass spectrometry

国家能源局

• SY/T 7361-2017 Quadrupole mass spectrometry for rare gas separation and component content analysis

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• GB/T 37837-2019 General rules for quadrupole inductively coupled plasma mass spectrometry

Professional Standard - Medicine

• YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

Professional Standard - Agriculture

• GB/T 43966-2024 General rules for high performance liquid chromatography-quadrupole inductively coupled plasma-mass spectrometry

未注明发布机构

• AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

British Standards Institution (BSI)

• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
• BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
• BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
• BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Japanese Industrial Standards Committee (JISC)

• JIS K 0127:1992 General rules for ion chromatographic analysis
• JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers

International Organization for Standardization (ISO)

• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
• ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

GSO

• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 14291:2017 Vacuum gauges -- Definitions and specifications for quadrupole mass spectrometers
• OS GSO ISO 14291:2015 Vacuum gauges -- Definitions and specifications for quadrupole mass spectrometers
• GSO ISO 14291:2015 Vacuum gauges -- Definitions and specifications for quadrupole mass spectrometers

American Society for Testing and Materials (ASTM)

• ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM C1474-00(2011) Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
• ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
• ASTM C1474-00 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
• ASTM C1474-00(2006)e1 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
• ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS

SCC

• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer

Association Francaise de Normalisation

• NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.

Standard Association of Australia （SAA）

• AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry

Korean Agency for Technology and Standards (KATS)

• KS D ISO 18114:2005 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

Others: Quadrupole Ion Mass Spectrometer