Aging test socket

Aging test socket, Total:41 items.

The international standard classification for "Aging test socket" includes: .

The Chinese standard classification for "Aging test socket" includes: .

ECIA - Electronic Components Industry Association

540G000-1993 Sectional Specification for Burn-In Sockets for Use in Electronic Equipment
EIA-540G000-1993 Sectional Specification for Burn-In Sockets for Use in Electronic Equipment
540H000-1998 Sectional Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment

SS-EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor test and burn-in sockets for BGA, LGA, FBGA and FLGA

DS/EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
DANSK DS/EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

DIN EN 60191-6-16:2007-11 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007); German version EN 60191-6-16:2007 / Note: To be replaced by DIN EN 60191-6-16 (2013-...
DIN EN 60191-6-16 E:2013-08 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

CEI EN 60191-6-16:2008 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

GSO IEC 60191-6-16:2021 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

BH GSO IEC 60191-6-16:2022 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

AS/NZS 3112:2000 Approval and test specification - Plugs and socket-outlets
AS/NZS 3112:2017(R2021) Approval and test specification — Plugs and socket-outlets
AS/NZS 3112:2017 Approval and test specification — Plugs and socket-outlets
AS/NZS 3112:2017/AMD 1:2021 Approval and test specification — Plugs and socket-outlets
AS/NZS 3112:2011 Approval and testing specifications for plugs and sockets
AS/NZS 3112:1993 Approval and test specification - Plugs and socket-outlets

AS 3112:1990 Approval and test specification - Plugs and socket-outlets
AS 3112:1987 Approval and test specification - Plugs and socket-outlets
AS 3112:1981 Approval and test specification for plugs and plug sockets
AS C112:1964 Approval and test specification for plugs and plug sockets
AS C112:1958 Approval and test specification for plugs and plug sockets
AS C122:1950 Approval and test specification for plug socket adaptors
AS C122:1939 Approval and test specification for plug socket adaptors
AS C112:1955 Approval and test specification for plugs and plug-sockets (Type A. Plugs with male contacts, sockets with female contacts)
AS C112:1940 Approval and test specification for plugs and plug-sockets (Type A. Plugs with male contacts, sockets with female contacts)
AS C112:1947 Approval and test specification for plugs and plug-sockets (Type A. Plugs with male contacts, sockets with female contacts)
AS C112:1946 Approval and test specification for plugs and plug-sockets (Type A. Plugs with male contacts, sockets with female contacts)
AS C122:1964 Approval and test specification for plug socket adaptors

05/30132036 DC IEC 60191-6-16. Mechanical standardization of semiconductor devices. Part 6-16. Glossary of semiconductor test and burn-in socket for BGA, LGA, FBGA and FLGA
13/30284029 DC BS EN 60191-6-16. Mechanical standardization of semiconductor devices. Part 6-16. Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

UNE-EN 60191-6-16:2007 Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)

LST EN 60191-6-16-2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007)

IEC 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA