secondary electron time

secondary electron time, Total:19 items.

The international standard classification for "secondary electron time" includes: Chemical analysis .

The Chinese standard classification for "secondary electron time" includes: Basic standards and general methods , Control relay .

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Group Standards of the People's Republic of China

• T/YIIEE 10-2023 electronical time relay
• T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Professional Standard - Machinery

• JB/T 10047-1999 Electronic time delay relay

工业和信息化部

• JB/T 10047-2021 Specifications for combined dies-General technical

Shandong Provincial Standard of the People's Republic of China

• DB37/T 2393-2013 Secondary lithium ion battery electrolyte

Professional Standard - Education

• JY/T 0369-2004 Two-dimension Space-time Tracer

GSO

• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

British Standards Institution (BSI)

• BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Japanese Industrial Standards Committee (JISC)

• JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

International Organization for Standardization (ISO)

• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

SCC

• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
• MIL MIL-DTL-32264A-2008 Fuze, Artillery, Electronic Time, M762A1 and Fuze, Electronic Time, M767A1 Less Booster

American Society for Testing and Materials (ASTM)

• ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

U.S. Military Regulations and Norms

• ARMY MIL-DTL-32264 A VALID NOTICE 1-2013 Fuze, Artillery, Electronic Time, M762A1 and Fuze, Electronic Time, M767A1 Less Booster

Others: time mass spectrometry,atomic time,film time,Oscillation time,voltage time,tds time,iso time,Irradiation time,vacuum time,retention time peak time,vacuum time,retention time time peak,dead time time,secondary electron time,contact time time,retention time,time window time zone,submission time,liquid phase time window,Penetration time