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Database: 365,228(8 Aug 2026)

Large TEM

Large TEM, Total:85 items.

The international standard classification for "Large TEM" includes: Optical equipment , Chemical analysis .

The Chinese standard classification for "Large TEM" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Basic standards and general methods .


Professional Standard - Machinery

  • JB/T 5383-1991 Specification for Transmission Electron Microscope
  • JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
  • JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
  • JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
  • JB/T 9352-1999 Test method for the transmission electron microscope

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Education

  • JY/T 0581-2020 General analysis rules for transmission electron microscope
  • JY/T 011-1996 General rules for transmission electron microscopy

Group Standards of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
  • GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

National Metrological Technical Specifications of the People's Republic of China

Professional Standard - Non-ferrous Metal

  • YS/T 1623-2023 Inspection of ageing precipitates for aluminium alloys ——Transmission electron microscopy method

Military Standard of the People's Republic of China-General Armament Department

  • GJB 5094-2004 General specifications for Luneberg lens reflectors

工业和信息化部

  • YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Taiwan Provincial Standard of the People's Republic of China

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

RO-ASRO

  • STAS 3881-1981 MAGNIFYING LENSES Classification and principal parameters

Association of German Mechanical Engineers

VDI - Verein Deutscher Ingenieure

SCC

  • VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
  • MIL MIL-L-3661/27B-2019 LAMPHOLDERS, INDICATOR LIGHTS, INDICATOR-LIGHT HOUSINGS, AND INDICATOR-LIGHT LENSES, (ELECTROMAGNETIC INTERFERENCE TYPE) DUSTTIGHT LENS, STYLE LC27
  • AENOR UNE 25044-2:1970 Lenticular gasket rings. Type B.
  • AENOR UNE 25044-1:1970 Lenticular gasket rings. Type A.
  • MIL MIL-PRF-1/338J-2009 Electron Tube, Transmitting Type 2E26
  • MIL MIL-PRF-19500/520C-1999 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, YELLOW TYPES JAN1N6093 JANTX1N6093, JAN1N6610 (CLEAR LENS) JANTX1N6610 (CLEAR LENS), AND PANEL MOUNTED ASSEMBLY TYPES ANM19500/52001, JANTXM19500/52002, NS), AND JANTXM19500/52004 (CLEAR LENS) (SUPERSEDING ...
  • MIL MIL-PRF-19500/520D-2007 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, YELLOW, TYPES JAN1N6093, JANTX1N6093, JAN1N6610 (CLEAR LENS), JANTX1N6610 (CLEAR LENS), AND PANEL MOUNT ASSEMBLY, TYPES JANM19500/52001, JANTXM19500/52002, JANM19500/52003 (CLEAR LENS), AND JANTXM19500/52004...
  • MIL MIL-PRF-19500/521D-2007 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, GREEN TYPES JAN1N6094 JANTX1N6094, JAN1N6611 (CLEAR LENS) JANTX1N6611 (CLEAR LENS), AND PANEL MOUNT ASSEMBLY, TYPES JANM19500/52101, JANTXM19500/52102, JANM19500/52103 (CLEAR LENS), AND JANTXM19500/52104 (CL...
  • MIL MIL-L-3661/33-1967 LENSES, INDICATOR-LIGHT, WATERTIGHT, STYLE LC33
  • MIL MIL-PRF-19500/519C-1999 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, RED TYPES JAN1N6092 JANTX1N6092, JAN1N6609 (CLEAR LENS) JANTX1N6609 (CLEAR LENS), AND PANEL MOUNTED ASSEMBLY TYPES ANM19500/51901, JANTXM19500/51902, AND JANTXM19500/51904 (CLEAR LENS) (SUPERSEDING MIL-S-19...
  • MIL MIL-PRF-19500/519D-2007 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, RED TYPES, JAN1N6092, JANTX1N6092, JAN1N6609 (CLEAR LENS) JANTX1N6609 (CLEAR LENS), AND PANEL MOUNT ASSEMBLY, TYPES JANM19500/51901, JANTXM19500/51902, JANM19500/51903 (CLEAR LENS), AND JANTXM19500/51904 (CL...
  • MIL MIL-L-3661/28B-1989 LAMPHOLDERS, INDICATOR LIGHTS, INDICATOR-LIGHT HOUSINGS, AND INDICATOR-LIGHT LENSES, (ELECTROMAGNETIC INTERFERENCE TYPE) DUSTTIGHT LENSES, STYLE LC28 (SUPERSEDING MIL-L-3661/28A)
  • MIL MIL-L-3661/26A-1969 LAMPHOLDERS, INDICATOR LIGHTS, INDICATOR-LIGHT HOUSINGS, AND INDICATOR-LIGHT LENSES, (ELECTROMAGNETIC INTERFERENCE TYPE) DUSTTIGHT LENS, STYLE LC26 (SUPERSEDING MIL-L-3661/26)

Defense Logistics Agency

Japanese Industrial Standards Committee (JISC)

  • JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
  • JIS E 3303:1977 Lenses, filters, reflectors and semi-sealed units for railway signals
  • JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance

Korean Agency for Technology and Standards (KATS)

British Standards Institution (BSI)

  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

GSO

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

International Organization for Standardization (ISO)

  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

Association Francaise de Normalisation

  • NF S77-113:1994 Specification for welding filters with switchable luminous transmittance and welding filters with dual luminous transmittance.
  • NF S12-131:1999 Ophthalmic instruments. Refractor heads.

KR-KS

  • KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope

RU-GOST R