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Database: 365,228(8 Aug 2026)

Optical Profiler

Optical Profiler, Total:34 items.

The international standard classification for "Optical Profiler" includes: .

The Chinese standard classification for "Optical Profiler" includes: .


National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Military and Civilian Products

AGMA - American Gear Manufacturers Association

International Organization for Standardization (ISO)

  • ISO 1880:1979 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of progressive profile transformation; Profile recording instruments
  • ISO 1880:1974 Title missing - Legacy paper document
  • ISO 3274:1975 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of consecutive profile transformation; Contact profile meters, system M
  • ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles - Part 6: Verification of the performance of laser profilometers used for pavement texture measurements

TR-TSE

  • TS 930-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE BY THE POFILE METHOD CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROF?LE TRANSFORMATION PROF?LE RECORDING INSTRUMENTS
  • TS 2495-1977 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD - CONTACT (STYLUS) INSTRUMENTS OF CONSECUTIVE PROF?LE TRANSFORMATION - CONTACT PROF?LE METERS. SYSTEM M
  • TS 929-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD-VOCABULARY

Danish Standards Foundation

  • DS/ISO 1880:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments
  • DS/ISO 3274:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M

YU-JUS

  • JUS M.A1.034-1980 Instruments for the measurement of surface roughness by tne profil method-contact (stylus) instrument* of profile transformation - Profile reoording instruments
  • JUS M.A1.031-1982 Instruments for the measurement of surface roughness by the profile method — Contactprofile meters, system M

Korean Agency for Technology and Standards (KATS)

Japanese Industrial Standards Committee (JISC)

CZ-CSN

  • CSN ISO 1880:1993 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments
  • CSN ISO 3274:1994 Instruments for the measurement of surface roughness by the profile method.Contact(stylus)instruments of consecutive profile transformation.Contact profile meters,system M

SCC

  • AASHTO M 328-2014(2022) Standard Specification for Inertial Profiler
  • BS PD ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles-Verification of the performance of laser profilometers used for pavement texture measurements
  • DANSK DS/ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles – Part 6: Verification of the performance of laser profilometers used for pavement texture measurements

The American Road & Transportation Builders Association

AASHTO - American Association of State Highway and Transportation Officials

  • M 328-2014 Standard Specification for Inertial Profiler

British Standards Institution (BSI)

  • PD ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles. Verification of the performance of laser profilometers used for pavement texture measurements

South African Bureau of Standard

  • SANS 4518:1980 Metallic coatings - Measurement of coating thickness - Profilometric method

European Committee for Standardization (CEN)

  • EN ISO 4518:2021 Metallic coatings - Measurement of coating thickness - Profilometric method (ISO 4518:2021)

American Society for Testing and Materials (ASTM)

  • ASTM E2955-13(2019) Standard Practice for Simulating Profilograph Response to Longitudinal Profiles of Traveled Surfaces