micro static

micro static, Total:191 items.

The international standard classification for "micro static" includes: Aircraft and space vehicle engineering (Vocabularies) , Measurement of electrical and magnetic quantities , Pumps , Transistors , Textile fabrics , Geology. Meteorology. Hydrology .

The Chinese standard classification for "micro static" includes: Ambient conditions , Extensive magnitude and exchanger , Electromagnetic compatibility , Pump , Technical management , Field effect device , Knit articles , Meteorological instrument , Light metals and their alloys .

Group Standards of the People's Republic of China

T/JSGD 9-2021 High barrier and low static heat-sealable functional film
T/CASMES 15-2022 Miniature current transformer
T/SDCIA 1002-2020 Antibacterial antistatic soft laundry detergent
T/ZZB 0268-2017 Mini electric hoists
T/ESD 002-2018 Non-humidity Reliant Anti-static Shoes
T/DZJN 17-2020 Green Micro Data Center Technical Specifications
T/CAMA 75-2022 Lithium battery handheld tillers

Professional Standard - Automobile

QC/T 298-1999 Determination Method of Static Load Characteristics of Mini Truck Suspension

Professional Standard - Speciality

ZB/T T22004-1990 Determination Method of Static Load Characteristics of Mini Truck Suspension

Professional Standard - Aerospace

QJ 647A-1995 Terminologies for Nucleus, Microgravity, Static Electricity and Electromagnetic Environment

Professional Standard - Machinery

JB/T 9435-1999 Xerographic printer - Serial type spectrum
JB/T 5415-2013 Miniature Centrifugal Electric Pump
JB/T 14290-2022 Photovoltaic miniatrue motor-pumps
JB/T 12241-2015 Air-flow press molding machine
JB/T 10665-2006 Miniature current transformer
JB/T 14296-2022 Intelligent minitype motor-pump
JB/T 10667-2016 Miniature voltage transformer for electric energy meter
JB/T 10667-2006 Miniature voltage transformer
JB/T 10665-2016 Miniature current transformer for electric energy meters
JB/T 9435-2015 Types and series of electrostatic copying machines

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 26117-2022 Miniature electric pumps—Testing method
GB/T 37977.32-2019 Electrostatics—Part 3-2:Methods for simulation of electrostatic effects—Machine model(MM) electrostatic discharge test waveform

Professional Standard - Electron

SJ 2241.2-1982 Variable concentric trimmer capacitors for Type CWT4Y
SJ 2241.5-1982 Variable concentric trimmer capacitors for Type CWT7L
SJ 2241.3-1982 Variable concentric trimmer capacitors for Type CWT5Y
SJ 2241.7-1982 Variable concentric trimmer capacitors for Type CWT9J
SJ 2241.6-1982 Variable concentric trimmer capacitors for Type CWT8Z
SJ 2241.1-1982 Variable concentric trimmer capacitors for Type CWT2
SJ/T 11114-1996 Type designation system for miniature driving-machines
SJ/Z 736-1973 Preferred series and types for electronstatic control transmitting tubes
SJ 2241.4-1982 Variable concentric trimmer capacitors for Type CWT6

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 26117-2010 Testing method of micro electricpump
GB/T 16468-1996 Series programmes for static induction transistors

Professional Standard - Textile

FZ/T 24013-2020 Durable antistatic cashmere knitting goods
FZ/T 24013-2010 Durable static protective cashmere knitting goods

Fujian Provincial Standard of the People's Republic of China

DB35/T 1013-2010 Vortex micro electric pump

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 18003-1988 261 type picoampere current source trial verification regulations
JJG(电子) 18004-1989 HP4140B Picoampere Ammeter/DC Voltage Source Verification Regulations

Professional Standard - Meteorology

QX/T 14-2002 EY3-2A and EY 3-2B thermocouple anemometer

Professional Standard - Non-ferrous Metal

YS/T 407-1997 Powder static coated aluminium alloy profiles for architecture

RU-GOST R

GOST 18683.1-1983 Digital integrated circuits. Methods for measuring static electrical parameters
GOST R 53734.3.1-2013 Electrostatics. Methods for simulation of electrostatic effects. Human body model. Electrostatic discharge
GOST R 53734.3.2-2013 Electrostatics. Methods for simulation of electrostatic effects. Model of mechanical device electrostatic discharge

Defense Logistics Agency

DLA SMD-5962-95613 REV H-2004 MICROCIRCUIT, MEMORY, DIGITAL, SRAM, 512K X 8-BIT, MONOLITHIC SILICON
DLA SMD-5962-79012 REV A-1986 MICROCIRCUITS, DIGITAL, CMOS, STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-96728 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, STATIC 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-95600 REV H-2004 MICROCIRCUITS, MEMORY, DIGITAL, 512K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-97536-1997 MICROCIRCUIT, DIGITAL, MULTICHIP MICROCIRCUIT, MICROPROCESSOR WITH STATIC RAM, SILICON
DLA SMD-5962-86863-1987 MICROCIRCUITS, DIGITAL, BIPOLAR, 16-BIT MICROPROCESSOR
DLA SMD-5962-86015 REV B-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 1, STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-84132 REV C-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-89892 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K X 4 SRAM WITH OE, MONOLITHIC SILICON
DLA SMD-5962-99541 REV A-2005 MICROCIRCUIT, MEMORY, DIGITAL, RADIATIONHARDENED CMOS, 256K X 8-BIT STATIC RAM, MULTICHIP MODULE
DLA SMD-5962-92344-1993 MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, 8K X 8 RESETTABLE SRAM, MONOLITHIC SILICON
DLA SMD-5962-93187 REV L-2007 MICROCIRCUIT, HYBRID, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 32-BIT
DLA SMD-5962-98537 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS/SOI, 128K X 8 STATIC RAM, MONOLITHIC SILICON
DLA MIL-DTL-10392 E-2008 Cord, Electrical (Audio, Miniature)
DLA SMD-5962-81024 REV F-2005 MICROCIRCUIT, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-93128 REV A-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256K X 1 STATIC RANDOM ACCESS MEMORY (SRAM), SEPARATE I/O, MONOLITHIC SILICON
DLA SMD-5962-92324 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 8 NON-VOLATILE STATIC RAM MONOLITHIC SILICON
DLA SMD-5962-88595 REV B-2010 MICROCIRCUITS, DIGITAL, NMOS, 256 X 4 STATIC RAM (SRAM) MONOLITHIC SILICON
DLA SMD-5962-91662 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 16 DUAL PORT STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-88740 REV D-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-93156 REV B-2000 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 8-BIT
DLA SMD-5962-84132 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-93143 REV C-2005 MICROCIRCUIT, DIGITAL, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-98003-1999 MICROCIRCUIT, HYBRID, DIGITAL, QUAD, (4 X 32-BIT) MICROCONTROLLER, +5 VOLT SUPPLY
DLA SMD-5962-98615 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION- HARDENED, CMOS, LOW VOLTAGE, 128K X 8-BIT STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-97513 REV C-2003 MICROCIRCUIT, LINEAR, MICROPOWER SUPPLY VOLTAGE SUPERVISOR, MONOLITHIC SILICON
DLA MIL-HDBK-780 D-2004 STANDARD MICROCIRCUIT DRAWINGS
DLA MS24286 REV E-2005 CONNECTORS, ELECTRICAL, MINIATURE
DLA SMD-5962-95635 REV D-1999 MICROCIRCUIT, DIGITAL, 16-BIT MICROCONTROLLER, RADIATION HARDENED, MONOLITHIC SILICON
DLA SMD-5962-89690 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-89712 REV B-2007 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 16K X 4 BITS SRAM, (STD POWER), MONOLITHIC SILICON
DLA SMD-5962-89883 REV B-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 9 SRAM (STANDARD POWER), MONOLITHIC SILICON
DLA SMD-5962-89692 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-94611 REV R-2004 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 512K X 32-BIT, STATIC RANDOM ACCESS MEMORY, CMOS
DLA SMD-5962-89694 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 X 4 SRAM, MONOLITHIC SILICON
DLA SMD-5962-89691 REV A-1990 MICROCIRCUIT, MEMORY, DIGITAL CMOS, 8K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON [Superseded By: DLA SMD-5962-38294 REV H, DLA SMD-5962-38294 REV G, DLA SMD-5962-38294 REV F, DLA SMD-5962-38294 REV E, DLA SMD-5962-38294 REV D, DLA
DLA SMD-5962-89891 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K X 4 SRAM WITH OE AND DUAL CE, MONOLITHIC SILICON
DLA SMD-5962-85520 REV A-1987 MICROCIRCUITS, DIGITAL, N-CHANNEL, 16-BIT MICROCONTROLLER, SILICONGATE, MONOLITHIC
DLA SMD-5962-96729 REV A-2000 MICROCIRCUIT, LINEAR, DIFFERENTIAL TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-93225-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 4 SRAM, MONOLITHIC SILICON
DLA SMD-5962-97608 REV B-2005 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT RISC MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-92172-1993 MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, 16K X 4 STATIC RANDOM ACCESS MEMORY (SRAM), SEPARATE I/O, MONOLITHIC SILICON
DLA SMD-5962-86015 REV C-2011 MICROCIRCUIT, DIGITAL, CMOS, MEMORY, 64K X 1, STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-96902 REV F-2004 MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
DLA SMD-5962-93157 REV G-2002 MICROCIRCUIT, MEMORY, HYBRID AND MONOLITHIC, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 256K X 8-BIT
DLA SMD-5962-87594 REV E-2002 MICROCIRCUIT, LINEAR, VOLTAGE REFERENCE, MONOLITHIC SILICON
DLA SMD-5962-84036 REV G-2005 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 16K (2048 X 8) BIT STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-87712 REV B-1991 MICROCIRCUITS, MEMORY, DIGITAL, 512 X 8 BIT NONVOLATILE SRAM, MONOLITHIC SILICON
DLA SMD-5962-92153 REV M-2006 MICROCIRCUIT, DIGITAL, CMOS, 32K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-98552 REV C-2006 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-99503-1999 MICROCIRCUIT, LINEAR, MICROPOWER, INSTRUMENTATION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-99502-1998 MICROCIRCUIT, LINEAR, MICROPOWER, PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-93267 REV B-2002 MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-88594 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256 X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-93153 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 9 DUAL PORT, STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-38294 REV H-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-98514 REV C-2006 MICROCIRCUIT, HYBRID, LINEAR, NEGATIVE VOLTAGE REGULATOR
DLA SMD-5962-95820 REV A-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS STATIC CLOCK CONTROLLER/GENERATOR, MONOLITHIC SILICON
DLA SMD-5962-96728-1995 MICROCIRCUIT, DIGITAL, CMOS, STATIC 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA MIL-M-38510/57 F VALID NOTICE 1-2009 Microcircuits, Digital, CMOS, Static Shift Register, Monolithic Silicon, Positive Logic

Korean Agency for Technology and Standards (KATS)

KS C IEC PAS 62162:2002 Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components
KS C IEC PAS 62162-2002(2022) Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components
KS C IEC PAS 62162-2022 Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components
KS C IEC PAS 62162-2002(2017) Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components
KS C IEC 61340-3-2:2007 Electrostatics-Part 3-2:Methods for simulation of electrostatic effects-Machine model(MM)-Component testing
KS C IEC 61340-3-1:2007 Electrostatics-Part 3-1:Methods for simulation of electrostatic effects-Human body model(HBM)-Component testing
KS C IEC PAS 62180:2003 Electrostatic discharge (ESD) sensitivity testing-Machine model (MM)
KS C IEC PAS 62180-2003(2008) Electrostatic discharge (ESD) sensitivity testing－Machine model (MM)
KS C IEC PAS 62179:2003 Electrostatic discharge (ESD) sensitivity testing-Human body model (HBM)
KS C IEC PAS 62179-2003(2008) Electrostatic discharge (ESD) sensitivity testing－Human body model (HBM)
KS C IEC 61340-3-1-2007(2017) Electrostatics－Part 3－1：Methods for simulation of electrostatic effects－Human body model(HBM)－Component testing
KS C IEC 61340-3-2-2022 Electrostatics－Part 3－2：Methods for simulation of electrostatic effects－Machine model(MM)－Component testing
KS C IEC 61340-3-2-2007(2017) Electrostatics－Part 3－2：Methods for simulation of electrostatic effects－Machine model(MM)－Component testing
KS C IEC PAS 62179-2013 Electrostatic discharge (ESD) sensitivity testing－Human body model (HBM)
KS C IEC 61340-3-2-2007(2022) Electrostatics－Part 3－2：Methods for simulation of electrostatic effects－Machine model(MM)－Component testing
KS C IEC PAS 62180-2013 Electrostatic discharge (ESD) sensitivity testing－Machine model (MM)
KS C IEC 61340-3-1-2007(2022) Electrostatics－Part 3－1：Methods for simulation of electrostatic effects－Human body model(HBM)－Component testing
KS C IEC 61340-3-1-2022 Electrostatics－Part 3－1：Methods for simulation of electrostatic effects－Human body model(HBM)－Component testing

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD22-C101D-2008 Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components
JEDEC JESD22-C101F-2013 Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
JEDEC JESD22-C101C-2004 Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components
JEDEC JESD22-A115C-2010 Electrostatic Discharge (ESD) Sensitivity Testing, Machine Model (MM)
JEDEC JESD22-A115B-2010 Electrostatic Discharge (ESD) Sensitivity Testing, Machine Model (MM)
JEDEC JESD22-A114F-2008 Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)

International Electrotechnical Commission (IEC)

IEC PAS 62162:2000 Filed-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
IEC 61340-3-2:2006 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
IEC 61340-3-1:2006 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
IEC PAS 62180:2000 Electrostatic discharge (ESD) sensitive testing machine model (MM)
IEC PAS 62179:2000 Electrostatic discharge (ESD) sensitive testing human body model (HBM)

GSO

OS GSO IEC/PAS 62162:2014 Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
BH GSO IEC 61340-3-1:2016 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
OS GSO IEC 61340-3-1:2014 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
OS GSO IEC 61340-3-2:2014 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
GSO IEC 61340-3-1:2014 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
GSO IEC 61340-3-2:2014 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
BH GSO IEC 61340-3-2:2016 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
GSO ISO 15900:2013 Determination of particle size distribution -- Differential electrical mobility analysis for aerosol particles

British Standards Institution (BSI)

BS EN 61340-3-2:2007 Electrostatics - Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
BS EN 61340-3-1:2007 Electrostatics - Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
BS EN 61340-3-2:2002 Electrostatics - Methods for simulation of electrostatic effects - Machine model (MM) - Component testing
BS EN 61340-4-4:2005 Electrostatics - Standard test methods for specific applications - Electrostatic classification of flexible intermediate bulk containers (FIBC)

IEC - International Electrotechnical Commission

PAS 62162-2000 Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components (Edition 1.0)

American Society for Testing and Materials (ASTM)

ASTM E1218-04 Standard Guide for Conducting Static Toxicity Tests with Microalgae
ASTM E1218-04e1 Standard Guide for Conducting Static Toxicity Tests with Microalgae

SCC

BS 1428-J1:1954 Micro-electrlytic apparatus micro chemical apparatus electrolytic accessories
CEI EN 61340-3-1:2007 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects Human body model (HBM) electrostatic discharge test waveforms
DANSK DS/EN 61340-3-1:2007 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
DANSK DS/EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
CEI EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects Machine model (MM) electrostatic discharge test waveforms
BS EN 61340-3-1:2002 Electrostatics. Methods for simulation of electrostatic effects-Human body model (HBM). Component testing
MIL MIL-DTL-10392E-2008 Cord, Electrical (Audio, Miniature)
MIL MIL-DTL-10392F-2012 Cord, Electrical (Audio, Miniature)
UNE-EN 61340-3-1:2003 Electrostatics -- Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) - Component testing.
MIL MIL-E-1/1341-1960 ELECTRON TUBE, CATHODE-RAY ELECTROSTATIC DEFLECTION AND FOCUS TYPE 3BGP1
UNE-EN 61340-3-2:2003 Electrostatics -- Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) - Component testing.

Aeronautical Radio Inc.

ARINC 606-1 ITEM 3.0 Effects of Electrostatic Fields and Discharge on Contemporary Micro-Electronic Parts

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE 4382-2000 New Quasi-Static Cogeneration Model
ASHRAE DA-00-7-4-2000 Microturbine Cogeneration
ASHRAE DA-00-14-2-2000 Investigation of Static Microisolators in Wind Tunnel Tests and Validation of CFD Cage Model

European Committee for Electrotechnical Standardization（CENELEC）

EN 61340-3-1:2007 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

Japanese Industrial Standards Committee (JISC)

JIS C 61340-3-2:2011 Electrostatics -- Part 3-2: Methods for simulation of electrostatic effects -- Machine model (MM) electrostatic discharge test waveforms
JIS C 61340-3-1:2010 Electrostatics -- Part 3-1: Methods for simulation of electrostatic effects -- Human body model (HBM) electrostatic discharge test waveforms
JIS C 61340-3-1:2006 Electrostatics -- Part 3-1: Methods for simulation of electrostatic effects -- Human body model (HBM) -- Component testing

German Institute for Standardization

DIN EN 61340-3-1:2008 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms (IEC 61340-3-1:2006); German version EN 61340-3-1:2007
DIN EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006); German version EN 61340-3-2:2007

CENELEC - European Committee for Electrotechnical Standardization

EN 61340-3-2:2002 Electrostatics Part 3-2: Methods for Simulation of Electrostatic Effects - Machine Model (MM) - Component Testing
EN 61340-3-1:2002 Electrostatics - Part 3-1: Methods for Simulation of Electrostatic Effects - Human Body Model (HBM) - Component Testing

Association Francaise de Normalisation

NF EN 61340-3-2:2007 Electrostatics - Part 3-2: methods for simulating electrostatic effects - Electrostatic discharge test waveforms for machine models (MM)
NF EN 61340-3-1:2007 Electrostatics - Part 3-1: Methods for the simulation of electrostatic effects - Electrostatic discharge test waveforms for the human body model (HBM)
NF C20-790-3-1*NF EN 61340-3-1:2007 Electrostatics - Part 3-1 : methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
NF C20-790-3-2*NF EN 61340-3-2:2007 Electrostatics - Part 3-2 : methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
NF C20-790-5-3:2010 Electrostatics - Part 5-3 : protection of electronic devices from electrostatic phenomena - Properties and requirements classifications for packaging intended for electrostatic discharge sensitive devices.
NF C20-790-3-1:2004 Electrostatics - Part 3-1 : methods for simulation of electrostatic effects - Human body model (HBM) - Component testing.

Danish Standards Foundation

DS/EN 61340-3-1:2007 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
DS/EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms

AENOR

UNE-EN 61340-3-1:2008 Electrostatics -- Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms
UNE-EN 61340-3-2:2007 Electrostatics -- Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006)

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE 0300-3-2-2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006); German version EN 61340-3-2:2007
VDE 0300-3-1-2008 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms (IEC 61340-3-1:2006); German version EN 61340-3-1:2007

Lithuanian Standards Office

LST EN 61340-3-2-2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006)
LST EN 61340-3-1-2007 Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms (IEC 61340-3-1:2006)

ESD - ESD ASSOCIATION

ESD DS5.3:1993 Charged Device Model (CDM) Electrostatic Discharge Sensitivity Testing

U.S. Air Force

AIR FORCE QPL-26611-26-1999 GENERATOR, TACHOMETER GEU-7/A, MINIATURE
AIR FORCE MIL-PRF-26611 E-1997 GENERATOR, TACHOMETER GEU-7/A, MINIATURE
AIR FORCE MIL-PRF-26611 E (2)-1999 GENERATOR, TACHOMETER GEU-7/A, MINIATURE

GOSTR

GOST IEC 61340-4-4-2020 Electrostatics. Standard test methods for specific applications. Electrostatic classification of flexible intermediate bulk containers

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