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Applications of Auger Electronics

Applications of Auger Electronics, Total:57 items.

The international standard classification for "Applications of Auger Electronics" includes: Chemical analysis , Optical equipment , Measurement of electrical and magnetic quantities .

The Chinese standard classification for "Applications of Auger Electronics" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Integrated test system .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
  • GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
  • GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
  • GB/T 29558-2013 Surface chemical analysis—Auger electron spectroscopy—Repeatability and constancy of intensity scale
  • GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Professional Standard - Machinery

  • JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method

Professional Standard - Electron

  • SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy
  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
  • GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy

American Society for Testing and Materials (ASTM)

  • ASTM E984-12 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
  • ASTM E984-06 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
  • ASTM E984-12(2020) Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
  • ASTM E983-10(2018) Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • ASTM E983-05 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • ASTM E984-95 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
  • ASTM E983-94(1999) Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • ASTM E983-19 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • ASTM E984-95(2001) Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
  • ASTM E983-10 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E1127-24 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
  • ASTM E1127-08(2015) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
  • ASTM E1127-08 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
  • ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
  • ASTM E1127-91(1997) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
  • ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

SCC

  • ASTM E983-04 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
  • BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information

GSO

  • GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
  • GSO ISO 16242:2015 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
  • BH GSO ISO 29081:2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
  • OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
  • OS GSO ISO 29081:2013 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction

British Standards Institution (BSI)

  • PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
  • BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • BS ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
  • BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
  • BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters

International Organization for Standardization (ISO)

  • ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
  • ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
  • ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
  • ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction

Association Francaise de Normalisation

  • NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
  • NF X21-068*NF ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
  • NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
  • NF ISO 29081:2010 Chemical analysis of surfaces - Auger electron spectroscopy - Indication of the methods used for the control and correction of the charge
  • NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)

German Institute for Standardization

  • DIN ISO 16242 E:2019-10 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)