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Database: 365,228(8 Aug 2026)

fg

fg, Total:27 items.

The international standard classification for "fg" includes: Environmental testing .

The Chinese standard classification for "fg" includes: Basic standards and general methods .


Professional Standard - Aerospace

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 2423.47-1997 Environmental testing for electric and electronic products Part 2: Test methods Test Fg: Vibration, acoustically induced

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 2423.47-2018 Environmental testing—Part 2:Test methods—Test Fg:Acoustic vibration

German Institute for Standardization

  • DIN EN 60068-2-65:1995 Environmental testing - Part 2: Methods of test; test Fg: Vibration, acoustically induced (IEC 60068-2-65:1993); German version EN 60068-2-65:1994
  • DIN EN 60068-2-65:2015 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method (IEC 60068-2-65:2013); German version EN 60068-2-65:2013

Spanish Association for Standardization (UNE)

  • UNE-EN 60068-2-65:2013 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method (Endorsed by AENOR in August of 2013.)

British Standards Institution (BSI)

International Electrotechnical Commission (IEC)

  • IEC 60068-2-65:1993 Environmental testing; part 2: methods of test; test Fg; vibration, acoustically induced
  • IEC 60068-2-65:2013 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method

SCC

  • MIL MIL-R-55015A-1960 REPEATER, TELEGRAPH TH-18( )/FG (NO S/S DOCUMENT) (SUPERSEDING MIL-R-55015)
  • MIL MIL-M-55029-1958 MONITOR, TELEGRAPH, MULTICHANNEL TH-19( )/FG (NO S/S DOCUMENT)
  • MIL MIL-PRF-19500/702-2001 SEMICONDUCTOR DEVICE FIELD EFFECT RADIATION HARDENED TOTAL DOSE & SINGLE EVENT EFFECTS TRANSISTOR N-CHANNEL SILICON TYPES 2N7482T3 - 2N7484T3 JANTXVR F G & H JANSR F G & H (S/S BY MIL-PRF-19500/702A)
  • MIL MIL-PRF-19500/700-2001 SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON TYPES 2N7494U5 - 2N7496U5 JANTXVR F G & H & JANSR F G & H (S/S BY MIL-PRF-19500/700A)
  • MIL MIL-PRF-19500/703-2001 SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE & SINGLE EVENT EFFECTS) TRANSISTOR N-CHANNEL SILICON TYPES 2N7479U3 - 2N7481U3 JANTXVR F G & H & JANSR F G & H

VDE - VDE Verlag GmbH@ Berlin@ Germany

  • VDE 0468-2-65-2015 Umgebungseinfluesse - Teil 2-65: Pruefverfahren - Pruefung Fg: Schwingen - Akustisch angeregt (IEC 60068-2-65:2013); Deutsche Fassung EN 60068-2-65:2013

ANSI - American National Standards Institute

  • X3.289-1996 Information Technology - Fibre Channel - Fabric Generic Requirements (FC-FG)

Korean Agency for Technology and Standards (KATS)

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 60068-2-65:2013 Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method

NEMA - National Electrical Manufacturers Association

  • NEMA FG 1-1993 Fiberglass Cable Tray Systems (Revision No.1 - November 1994)

Canadian Standards Association (CSA)

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