Transmission Electron Microscope
Transmission Electron Microscope, Total:13 items.
The international standard classification for "Transmission Electron Microscope" includes: .
The Chinese standard classification for "Transmission Electron Microscope" includes: Electron optics and other physical optics instrument .
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
International Organization for Standardization (ISO)
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Transmission Electron Microscope,Transmission Electron Microscopy,transmission electron microscope transmission electron microscope,Transmission Electron Microscopy Field Transmission Electron Microscopy,analytical transmission,transmission laser,transmission electron microscope,Transmission infrared,electron microscope transmission,Transmission + Electron Microscopy,Transmission Fiber,Analytical TEM,transmission electron microscope transmission electron microscope,replica transmission sample,transmission x-ray,Type transmission densitometer,Type TEM,type transmission
