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Database: 365,228(8 Aug 2026)

resurrection

resurrection, Total:5 items.

The international standard classification for "resurrection" includes: Semiconducting materials , Testing of metals .

The Chinese standard classification for "resurrection" includes: Semimetal and semiconductor material in general , Metal physical property test method .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
  • GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
  • GB/T 42907-2023 Test method for excess-charge-carrier recombination lifetime in silicon ingots,silicon bricks and silicon wafers―Noncontact eddy-current sensor

SCC

  • ASTM STP 1340-98 Recombination Lifetime Measurement in Silicon
  • SPC GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)